Patents by Inventor Akeo Kimura

Akeo Kimura has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus for testing IC devices at low temperature and cooling bag for use in testing IC devices at low temperature
    Patent number: 4918928
    Abstract: An apparatus for testing IC devices for performance at a low temperature comprises a cooling disk disposed within a test chamber and adapted to be cooled with liquid nitrogen of like refrigerant for cooling the IC device in contact or proximity therewith. A cooling bag for use as cooling means in testing IC devices at a low temperature comprises a bag adapted to intimately contact the IC device and having a refrigerant enclosed therein. Another apparatus for testing IC devices at a low temperature comprises a cooling bag reeved around a drive roller and an idler roller in the form of a belt conveyor and adapted to come into intimate contact from above with IC devices being transported on a conveyor to cool the devices.
    Type: Grant
    Filed: December 15, 1988
    Date of Patent: April 24, 1990
    Assignees: Kabushiki Kaisha Kobe Seikosho, Japan LSI Co., Ltd.
    Inventors: Osamu Morioka, Keizo Tokushige, Akeo Kimura, Takahiro Nihei