Abstract: Some embodiments provide a method of training a neural network to identify a type of golf swing based on a sound produced by an impact between a clubhead of a golf club and a golf ball. The method provides the neural network with multiple sets of inputs associated with multiple swings and multiple corresponding sets of known outputs. Each set of inputs includes at least (1) a spectrogram associated with sounds produced by the swing, and (2) impact position derived from impact tape on the clubhead used during the swing. The method uses the neural network to process each set of inputs to produce multiple sets of generated outputs. The method compares the known outputs with the generated outputs to compute error values that express differences between the known and generated outputs. The method propagates inputs associated with the computed error values back through the neural network and adjusts one or more adjustable parameters based on the computed error values.

Abstract: The present invention relates to techniques for measuring integrated circuit interconnect process parameters. The techniques are applicable to any non-ideally shaped interconnects made from any type of conductive materials. Test structures are fabricated within an integrated circuit. Non-destructive electrical measurements are taken from the test structures to determine coupling capacitances associated with the test structures. A field solver uses the initial process parameters to determine design coupling capacitances. An optimizer then uses the measured coupling capacitances and the design coupling capacitances to determine the interconnect process parameters.

Abstract: To increase the writing speed of masks, context information can be used to distinguish the attributes of portions of the mask that are critical from attributes, and portions, that are less critical. By using this information, which may be derived from the design context of the features, the mask can be written at a higher speed without sacrificing the accuracy of the important attributes or features.

Abstract: The present invention relates to techniques for measuring integrated circuit interconnect process parameters. The techniques are applicable to any non-ideally shaped interconnects made from any type of conductive materials. Test structures are fabricated within an integrated circuit. Non-destructive electrical measurements are taken from the test structures to determine coupling capacitances associated with the test structures. A field solver uses the initial process parameters to determine design coupling capacitances. An optimizer then uses the measured coupling capacitances and the design coupling capacitances to determine the interconnect process parameters.

Abstract: To increase the writing speed of masks, context information can be used to distinguish the attributes of portions of the mask that are critical from attributes, and portions, that are less critical. By using this information, which may be derived from the design context of the features, the mask can be written at a higher speed without sacrificing the accuracy of the important attributes or features.