Patents by Inventor Akifumi Goto

Akifumi Goto has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for pushing a contact probe against object to be measured
    Patent number: 7463045
    Abstract: A contact probe includes a probe tip and a damper. The probe tip includes a first barrel, a probe pin, and a first spring. The first barrel has a cavity with a bottom, an opening being disposed in a first end of the first barrel and the bottom being disposed at a second end of the first barrel. The probe pin is mounted in the first barrel so as to be movable forward and backward. The first spring is mounted in the cavity for elastically biasing the probe pin towards the opening. The damper is mounted to the second end of the first barrel, and elastically supports the first barrel.
    Type: Grant
    Filed: June 26, 2006
    Date of Patent: December 9, 2008
    Assignee: Alps Electric Co., Ltd.
    Inventor: Akifumi Goto
  • Contact probe, probe socket, electrical characteristic measuring device, and method for pushing the contact probe against object to be measured
    Patent number: 7288952
    Abstract: A contact probe includes a probe tip and a damper. The probe tip includes a first barrel, a probe pin, and a first spring. The first barrel has a cavity with a bottom, an opening being disposed in a first end of the first barrel and the bottom being disposed at a second end of the first barrel. The probe pin is mounted in the first barrel so as to be movable forward and backward. The first spring is mounted in the cavity for elastically biasing the probe pin towards the opening. The damper is mounted to the second end of the first barrel, and elastically supports the first barrel.
    Type: Grant
    Filed: August 14, 2006
    Date of Patent: October 30, 2007
    Assignee: Apls Electric Co., Ltd.
    Inventor: Akifumi Goto
  • Contact probe, probe socket, electrical characteristic measuring device, and method for pushing the contact probe against object to be measured
    Publication number: 20060273812
    Abstract: A contact probe includes a probe tip and a damper. The probe tip includes a first barrel, a probe pin, and a first spring. The first barrel has a cavity with a bottom, an opening being disposed in a first end of the first barrel and the bottom being disposed at a second end of the first barrel. The probe pin is mounted in the first barrel so as to be movable forward and backward. The first spring is mounted in the cavity for elastically biasing the probe pin towards the opening. The damper is mounted to the second end of the first barrel, and elastically supports the first barrel.
    Type: Application
    Filed: August 14, 2006
    Publication date: December 7, 2006
    Inventor: Akifumi Goto
  • Contact probe, probe socket, electrical characteristic measuring device, and method for pushing the contact probe against object to be measured
    Publication number: 20060238213
    Abstract: A contact probe includes a probe tip and a damper. The probe tip includes a first barrel, a probe pin, and a first spring. The first barrel has a cavity with a bottom, an opening being disposed in a first end of the first barrel and the bottom being disposed at a second end of the first barrel. The probe pin is mounted in the first barrel so as to be movable forward and backward. The first spring is mounted in the cavity for elastically biasing the probe pin towards the opening. The damper is mounted to the second end of the first barrel, and elastically supports the first barrel.
    Type: Application
    Filed: June 26, 2006
    Publication date: October 26, 2006
    Inventor: Akifumi Goto
  • Contact probe, probe socket, electrical characteristic measuring device, and method for pushing the contact probe against object to be measured
    Patent number: 7116123
    Abstract: A contact probe includes a probe tip and a damper. The probe tip includes a first barrel, a probe pin, and a first spring. The first barrel has a cavity with a bottom, an opening being disposed in a first end of the first barrel and the bottom being disposed at a second end of the first barrel. The probe pin is mounted in the first barrel so as to be movable forward and backward. The first spring is mounted in the cavity for elastically biasing the probe pin towards the opening. The damper is mounted to the second end of the first barrel, and elastically supports the first barrel.
    Type: Grant
    Filed: June 2, 2004
    Date of Patent: October 3, 2006
    Assignee: Alps Electric Co., Ltd.
    Inventor: Akifumi Goto
  • Contact probe, probe socket, electrical characteristic measuring device, and method for pushing the contact probe against object to be measured
    Publication number: 20040246014
    Abstract: A contact probe includes a probe tip and a damper. The probe tip includes a first barrel, a probe pin, and a first spring. The first barrel has a cavity with a bottom, an opening being disposed in a first end of the first barrel and the bottom being disposed at a second end of the first barrel. The probe pin is mounted in the first barrel so as to be movable forward and backward. The first spring is mounted in the cavity for elastically biasing the probe pin towards the opening. The damper is mounted to the second end of the first barrel, and elastically supports the first barrel.
    Type: Application
    Filed: June 2, 2004
    Publication date: December 9, 2004
    Applicant: ALPS ELECTRIC CO., LTD.
    Inventor: Akifumi Goto