Abstract: A detection head movable relative to a scale detects diffracted light and outputs a detection result. The diffracted light is diffracted by an incremental pattern. A signal processing unit calculates a relative displacement between the scale and the detection head. The detection head includes: a light source emitting the light to the scale; and a detection unit including a light-receiving unit receiving the diffracted light through an optical element, in which the light-receiving elements outputting detection signals are periodically arranged with a predetermined period. The number of the plurality of light-receiving elements is an even number. The predetermined period is a value obtained by multiplying a fundamental period by an odd-number. The fundamental period is a period of interference fringes formed on the light-receiving unit by +1st and ?1st order diffracted lights. A width of the light-receiving element is not equal to an integral multiple of the fundamental period.

Abstract: A scale has a first pattern area and a second pattern areas disposed with an offset from the first pattern area in a measurement direction by 1/(2×s) of pitch. A detection head detects interference fringes caused by positive s-th-order diffracted beams and negative s-th-order diffracted beams diffracted by the scale, and output a detection result. A signal processing unit detects a reference position based on a position where light intensity is lower than a predetermined value which appears in a light intensity distribution of the interference fringes, and detects incremental positions based on the interference fringes which appear at other positions. The detection head includes a light source, a detecting unit configured to output the detection result of the beams radiated onto light receiving devices to the signal processing unit, and an optical system configured to image positive s-th-order diffracted beams and negative s-th-order diffracted beams on the detecting unit.

Abstract: A scale is provided with a reference mark and an incremental pattern. A detection head is relatively movable in a measurement direction with respect to the scale, and detects a light intensity distribution of diffracted beams if beams radiated onto the scale are diffracted by the reference mark, and outputs the detection result. A signal processing unit detects a reference position based on a position in the light intensity distribution where light intensity is lower than a predetermined value. The reference position has a plurality of pattern areas having a plurality of patterns arranged with a predetermined pitch in the measurement direction. At least one pattern area of the plurality of pattern areas is disposed with an offset from a neighboring pattern area in the measurement direction.

Abstract: An optical encoder configuration comprises a scale, an illumination source, and a photodetector configuration. The illumination source is configured to output structured illumination to the scale. The scale extends along a measuring axis direction and is configured to output scale light that forms a detector fringe pattern comprising periodic high and low intensity bands that extend over a relatively longer dimension along the measuring axis direction and are relatively narrow and periodic along a detected fringe motion direction transverse to the measuring axis direction. The high and low intensity bands move along the detected fringe motion direction transverse to the measuring axis direction as the scale grating displaces along the measuring axis direction.

Abstract: An optical encoder configuration comprises a scale, an illumination source, and a photodetector configuration. The illumination source is configured to output structured illumination to the scale. The scale extends along a measuring axis direction and is configured to output scale light that forms a detector fringe pattern comprising periodic high and low intensity bands that extend over a relatively longer dimension along the measuring axis direction and are relatively narrow and periodic along a detected fringe motion direction transverse to the measuring axis direction. The high and low intensity bands move along the detected fringe motion direction transverse to the measuring axis direction as the scale grating displaces along the measuring axis direction.

Abstract: An optical encoder configuration comprises an illumination portion, a scale, and a photodetector configuration. The illumination portion transmits source light to a scale which outputs a periodic scale light pattern to the photodetector configuration. The photodetector configuration comprises a set of N spatial phase detectors arranged in a spatial phase sequence along a direction transverse to the measuring axis comprising two outer spatial phase detectors at a start and end of the sequence along the direction transverse to the measuring axis. At least a majority of the respective spatial phase detectors are relatively elongated along the measuring axis direction and relatively narrow along the direction perpendicular to the measuring axis direction, and comprise periodic scale light receptor areas positioned corresponding to a respective spatial phase of that spatial phase detector relative to the periodic scale light pattern, and are configured to provide a respective spatial phase detector signal.

Abstract: An optical encoder configuration comprises a scale, an illumination source, and a photodetector configuration. The illumination source is configured to output structured illumination to the scale. The scale extends along a measuring axis direction and is configured to output scale light that forms a detector fringe pattern comprising periodic high and low intensity bands that extend over a relatively longer dimension along the measuring axis direction and are relatively narrow and periodic along a detected fringe motion direction transverse to the measuring axis direction. The high and low intensity bands move along the detected fringe motion direction transverse to the measuring axis direction as the scale grating displaces along the measuring axis direction.

Abstract: An optical encoder configuration comprises an illumination portion, a scale, and a photodetector configuration. The illumination portion transmits source light to a scale which outputs a periodic scale light pattern to the photodetector configuration. The photodetector configuration comprises a set of N spatial phase detectors arranged in a spatial phase sequence along a direction transverse to the measuring axis comprising two outer spatial phase detectors at a start and end of the sequence along the direction transverse to the measuring axis. At least a majority of the respective spatial phase detectors are relatively elongated along the measuring axis direction and relatively narrow along the direction perpendicular to the measuring axis direction, and comprise periodic scale light receptor areas positioned corresponding to a respective spatial phase of that spatial phase detector relative to the periodic scale light pattern, and are configured to provide a respective spatial phase detector signal.

Abstract: An optical encoder includes a scale including a diffraction grating, a light-receiving unit configured to receive light from a light source, and an optical element located between the scale and the light-receiving unit. The optical element includes a plurality of groove portions, which are a periodic structure portion formed periodically in one face of the optical element. The plurality of groove portions is configured to divide signal diffracted light and noise diffracted light into first splitted beams traveling at a predetermined travel angle and second splitted beams traveling at a travel angle greater than the travel angle of the first splitted beams, and make a diffraction efficiency of the first splitted beams of the noise diffracted light lower than a diffraction efficiency of the first splitted beams of the signal diffracted light.

Abstract: A detection head movable relative to a scale detects diffracted light and outputs a detection result. The diffracted light is diffracted by an incremental pattern. A signal processing unit calculates a relative displacement between the scale and the detection head. The detection head includes: a light source emitting the light to the scale; and a detection unit including a light-receiving unit receiving the diffracted light through an optical element, in which the light-receiving elements outputting detection signals are periodically arranged with a predetermined period. The number of the plurality of light-receiving elements is an even number. The predetermined period is a value obtained by multiplying a fundamental period by an odd-number. The fundamental period is a period of interference fringes formed on the light-receiving unit by +1st and ?1st order diffracted lights. A width of the light-receiving element is not equal to an integral multiple of the fundamental period.

Abstract: A detection head movable relative to a scale detects diffracted light and outputs a detection result. The diffracted light is diffracted by an incremental pattern. A signal processing unit calculates a relative displacement between the scale and the detection head. The detection head includes: a light source emitting the light to the scale; and a detection unit including a light-receiving unit in which a plurality of light-receiving elements that output a detection signal are arranged. The number of the plurality of light-receiving elements is an even number. A period of the arrangement of the plurality of light-receiving elements is an odd-number multiple of a fundamental period. The fundamental period is a period of interference fringes formed on the light-receiving unit by +1st and ?1st order diffracted lights. A width of the light-receiving element is not equal to an integral multiple of the fundamental period.

Abstract: A displacement detecting device includes a scale diffraction grating and a detecting head unit. The detecting head unit includes a light source, a first retroreflecting unit that retroreflectes positive first-order diffracted light of light diffracted by the scale diffraction grating, such that the retroreflected light enters the scale diffraction grating again, a second retroreflecting unit that retroreflectes negative first-order diffracted light of the light diffracted by the scale diffraction grating, such that the retroreflected light enters the scale diffraction grating again, and a light receiving unit that receives an interference signal. Each of the first retroreflecting unit and the second retroreflecting unit has a deflecting function of deflecting light incident on the corresponding retroreflecting unit by a predetermined angle and then emitting the light.

Abstract: A detection head movable relative to a scale detects diffracted light and outputs a detection result. The diffracted light is diffracted by an incremental pattern. A signal processing unit calculates a relative displacement between the scale and the detection head. The detection head includes: a light source emitting the light to the scale; and a detection unit including a light-receiving unit in which a plurality of light-receiving elements that output a detection signal are arranged. The number of the plurality of light-receiving elements is an even number. A period of the arrangement of the plurality of light-receiving elements is an odd-number multiple of a fundamental period. The fundamental period is a period of interference fringes formed on the light-receiving unit by +1st and ?1st order diffracted lights. A width of the light-receiving element is not equal to an integral multiple of the fundamental period.

Abstract: A displacement detecting device includes a main scale and a detecting head unit. The detecting head unit includes a light source, a light receiving unit, and an index scale group that is disposed in the middle of a light path from the main scale to the light receiving unit. The index scale group includes two or more index scales including diffraction gratings, respectively. A positive s-th order diffracted light and a negative s-th order diffracted light of diffracted lights from the main scale are used as the signal lights. The displacement detecting device satisfies a first condition and a second condition, the first condition being expressed as follows: ?×(u1?u2)×(mN÷g)=2×sin ?, the second condition being expressed as follows: ?×u1×(mN÷g)?sin ???÷g×?i=1N (ti×mi).

Abstract: A scale has a first pattern area and a second pattern areas disposed with an offset from the first pattern area in a measurement direction by 1/(2×s) of pitch. A detection head detects interference fringes caused by positive s-th-order diffracted beams and negative s-th-order diffracted beams diffracted by the scale, and output a detection result. A signal processing unit detects a reference position based on a position where light intensity is lower than a predetermined value which appears in a light intensity distribution of the interference fringes, and detects incremental positions based on the interference fringes which appear at other positions. The detection head includes a light source, a detecting unit configured to output the detection result of the beams radiated onto light receiving devices to the signal processing unit, and an optical system configured to image positive s-th-order diffracted beams and negative s-th-order diffracted beams on the detecting unit.

Abstract: A scale is provided with a reference mark and an incremental pattern. A detection head is relatively movable in a measurement direction with respect to the scale, and detects a light intensity distribution of diffracted beams if beams radiated onto the scale are diffracted by the reference mark, and outputs the detection result. A signal processing unit detects a reference position based on a position in the light intensity distribution where light intensity is lower than a predetermined value. The reference position has a plurality of pattern areas having a plurality of patterns arranged with a predetermined pitch in the measurement direction. At least one pattern area of the plurality of pattern areas is disposed with an offset from a neighboring pattern area in the measurement direction.

Abstract: First and second output signals are generated based on amounts of light received by first and second light-receiving elements, respectively, when a detection head is moved along a scale; a first amplitude adjustment is performed to adjust an amplitude of the first or second output signal such that levels of first and second output signals become equal at a first reference phase; a second amplitude adjustment is performed to adjust an amplitude of the first or second output signal such that levels of the first and second output signals become equal at a second reference phase; and a reference signal that starts at a timing when levels of the second output signal and the first output signal subjected to the first amplitude adjustment become equal and ends at a timing when levels of the second output signal and the first output signal subjected to the second amplitude adjustment become equal.

Abstract: A displacement detecting device includes a main scale and a detecting head unit. The detecting head unit includes a light source, a light receiving unit, and an index scale group that is disposed in the middle of a light path from the main scale to the light receiving unit. The index scale group includes two or more index scales including diffraction gratings, respectively. A positive s-th order diffracted light and a negative s-th order diffracted light of diffracted lights from the main scale are used as the signal lights.

Abstract: A displacement detecting device includes a scale diffraction grating and a detecting head unit. The detecting head unit includes a light source, a first retroreflecting unit that retroreflectes positive first-order diffracted light of light diffracted by the scale diffraction grating, such that the retroreflected light enters the scale diffraction grating again, a second retroreflecting unit that retroreflectes negative first-order diffracted light of the light diffracted by the scale diffraction grating, such that the retroreflected light enters the scale diffraction grating again, and a light receiving unit that receives an interference signal Each of the first retroreflecting unit and the second retroreflecting unit has a deflecting function of deflecting light incident on the corresponding retroreflecting unit by a predetermined angle and then emitting the light.

Abstract: A reference signal generation circuit generates a reference signal from a reading result of the reference point detection pattern. The first light-receiving element array includes a first light-receiving element that outputs a first signal, and a second light-receiving element that is disposed in a first direction of the first light-receiving element and outputs a second signal. A second light-receiving element array includes a third light-receiving element that outputs a third signal, and a fourth light-receiving element that is disposed in the first direction of the third light-receiving element and outputs a fourth signal. The second light-receiving element array is disposed in a second direction of the first light-receiving element array. The reference signal generation circuit outputs a reference signal that starts at a period when levels of the first and second signal become equal and ends at a period when levels of the third and fourth signal become equal.