Patents by Inventor Akihiko Osaki

Akihiko Osaki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230215784
    Abstract: A preferred aim of the invention is to provide technique for improving reliability of semiconductor devices when using a low-dielectric-constant film having a lower dielectric constant than a silicon oxide film to a part of an interlayer insulating film. More specifically, to achieve the preferred aim, an interlayer insulating film IL1 forming a first fine layer is formed of a middle-Young's-modulus film, and thus it is possible to separate an integrated high-Young's-modulus layer (a semiconductor substrate 1S and a contact interlayer insulating film CIL) and an interlayer insulating film (a low-Young's-modulus film; a low-dielectric-constant film) IL2 forming a second fine layer not to let them directly contact with each other, and stress can be diverged. As a result, film exfoliation of the interlayer insulating film IL2 formed of a low-Young's-modulus film can be prevented and thus reliability of semiconductor devices can be improved.
    Type: Application
    Filed: March 13, 2023
    Publication date: July 6, 2023
    Inventors: Masahiro MATSUMOTO, Masahiko FUJISAWA, Akihiko OSAKI, Atsushi ISHII
  • Publication number: 20200211931
    Abstract: A preferred aim of the invention is to provide technique for improving reliability of semiconductor devices when using a low-dielectric-constant film having a lower dielectric constant than a silicon oxide film to apart of an interlayer insulating film. More specifically, to achieve the preferred aim, an interlayer insulating film IL1 forming a first fine layer is formed of a middle-Young's-modulus film, and thus it is possible to separate an integrated high-Young's-modulus layer (a semiconductor substrate 1S and a contact interlayer insulating film CIL) and an interlayer insulating film (a low-Young's-modulus film; a low-dielectric-constant film) IL2 forming a second fine layer not to let them directly contact with each other, and stress can be diverged. As a result, film exfoliation of the interlayer insulating film IL2 formed of a low-Young's-modulus film can be prevented and thus reliability of semiconductor devices can be improved.
    Type: Application
    Filed: March 6, 2020
    Publication date: July 2, 2020
    Inventors: Masahiro MATSUMOTO, Masahiko FUJISAWA, Akihiko OSAKI, Atsushi ISHII
  • Publication number: 20200141668
    Abstract: A resin sheet has a single composition, and changes in thermal conductivity according to an area. The resin sheet includes a region having a thermal conductivity that is greater than an average value of a thermal conductivity of an entirety of the resin sheet by 1 W/mK or more. A method for manufacturing a resin sheet includes: forming a resin composition into a molded body having a sheet shape, the resin composition containing a filler having magnetic anisotropy; performing magnetic field orientation on the filler by using a bulk superconductor magnet in one or a plurality of predetermined portions of the molded body; and forming a region having a thermal conductivity that is greater than an average value of a thermal conductivity of an entirety of the resin sheet by 1 W/mK or more, in the one or the plurality of predetermined portions.
    Type: Application
    Filed: September 20, 2019
    Publication date: May 7, 2020
    Applicant: Shin-Etsu Chemical Co., Ltd.
    Inventors: Yoshinori Takamatsu, Akihiko Osaki, Takeshi Fukuda
  • Publication number: 20190225762
    Abstract: The present invention is a quartz glass fiber-containing prepreg including: (A) a quartz glass fiber; and (B) a curable resin composition, wherein at least one condition of conditions: (1) a dose of ?-ray contained in the quartz glass fiber is 0.005 c/cm2·hour or smaller, and, each of metal ion contents of Na+, Li+ and K+ is 1 ppm or lower; (2) the quartz glass fiber contains the number of foams of 10 foams/m2 or smaller a unit area; and (3) the quartz glass fiber-containing prepreg has the common bending stiffness in the range of a thickness of 100 to 200 ?m measured by a method described in JIS R 3420:2013 of 500 N·m2 or larger is satisfied. This provides a quartz glass fiber-containing prepreg that has particularly excellent dielectric characteristics, has excellent dielectric characteristics and the heat resistance, and/or has high handling property because of high bending stiffness characteristics.
    Type: Application
    Filed: January 2, 2019
    Publication date: July 25, 2019
    Applicant: SHIN-ETSU CHEMICAL CO., LTD.
    Inventors: Yoshihiro TSUTSUMI, Yoshihira HAMAMOTO, Toshio SHIOBARA, Akihiko OSAKI
  • Publication number: 20180247834
    Abstract: This is to provide a method for manufacturing a semiconductor apparatus which can shorten the manufacturing process of a semiconductor device, particularly a fan-out package without causing sealing defects such as voids or warpage, and can accomplish reduction in the manufacturing cost or improve in yield. There is provided a method for manufacturing a semiconductor apparatus which comprises preparing a semiconductor device-mounted substrate onto which a plurality of flip chip type semiconductor devices have been mounted onto a wiring layer formed on the substrate, collectively sealing a device-mounted surface of the semiconductor device-mounted substrate with a sealing material attached with a base material for sealing a semiconductor having a base material and a sealing resin layer containing an uncured or semi-cured thermosetting resin component formed on one surface of the base material, and removing the substrate from the collectively sealed semiconductor device-mounted substrate.
    Type: Application
    Filed: February 13, 2018
    Publication date: August 30, 2018
    Applicant: SHIN-ETSU CHEMICAL CO., LTD.
    Inventors: Koichi TSUDA, Shuichi FUJII, Kazuaki SUMITA, Akihiko OSAKI, Toshio SHIOBARA
  • Patent number: 6410454
    Abstract: In a semiconductor wafer-processing, hydrogen gas is introduced into the same chamber as used for film formation and heated to generate hydrogen radicals. Alternatively, a plasma is applied to generate hydrogen radicals, or the semiconductor wafer is heated immediately before film formation. Thereby, contaminants on the surface of the wafer are removed. Thereafter, a conductive film or an insulating film is formed on the wafer in the same chamber.
    Type: Grant
    Filed: December 2, 1997
    Date of Patent: June 25, 2002
    Assignee: Mitsubishi Denki Kabushiki
    Inventors: Seiji Muranaka, Cozy Ban, Akihiko Osaki