Abstract: An abnormality inspection system S1 according to an embodiment includes: an image acquisition unit configured to acquire a plurality of pieces of continuous pickup data of a component such that an identical spot of the component is contained in mutually different regions of the plurality of pieces of continuous pickup data; and a determination unit configured to detect presence or absence of abnormality in the plurality of pieces of continuous pickup data, and to determine that the component is abnormal, in a case where the abnormality is detected in all of the plurality of pieces of pickup data.