Patents by Inventor Akihiro SHUTO

Akihiro SHUTO has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11828773
    Abstract: An electrical connecting device includes an insulating probe including a bottom-side plunger, a top-side plunger, and a barrel, and a probe head including a combined guide plate having a conductive region made of a conductive material and an insulating region made of an insulating material arranged adjacent to each other in a planar view. The bottom-side plunger and the top-side plunger are electrically connected to each other inside the barrel, and the bottom-side plunger and the top-side plunger are electrically insulated from the barrel. The probe head holds the insulating probe in a state in which the barrel penetrates through the conductive region. The barrel of the insulating probe is connected to a ground potential via the conductive region when an inspection object is measured.
    Type: Grant
    Filed: December 20, 2019
    Date of Patent: November 28, 2023
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventor: Akihiro Shuto
  • Publication number: 20220074971
    Abstract: An electrical connecting device includes an insulating probe (10) including a bottom-side plunger (11), a top-side plunger (12), and a barrel (13), and a probe head (30) including a combined guide plate (30A) having a conductive region (301) made of a conductive material and an insulating region (302) made of an insulating material arranged adjacent to each other in a planar view. The bottom-side plunger (11) and the top-side plunger (12) are electrically connected to each other inside the barrel (13), and the bottom-side plunger (11) and the top-side plunger (12) are electrically insulated from the barrel (13). The probe head (30) holds the insulating probe (10) in a state in which the barrel (13) penetrates through the conductive region (301). The barrel (13) of the insulating probe (10) is connected to a ground potential via the conductive region (301) when an inspection object (4) is measured.
    Type: Application
    Filed: December 20, 2019
    Publication date: March 10, 2022
    Applicant: Kabushiki Kaisha Nihon Micronics
    Inventor: Akihiro SHUTO
  • Publication number: 20210156885
    Abstract: A probe includes: a tubular barrel; a first plunger that has a proximal end portion inserted from one opening end of the barrel and slides along an axial direction of the barrel in a state in which a distal end is exposed; and a coil spring that is disposed inside the barrel and urges the first plunger in the axial direction of the barrel. The proximal end portion of the first plunger includes: an insertion portion that extends inside the coil spring from one end of the coil spring; and a head portion that is coupled to the insertion portion, has an outer diameter larger than an outer diameter of the coil spring, and abuts against the one end of the coil spring.
    Type: Application
    Filed: November 17, 2020
    Publication date: May 27, 2021
    Inventors: Akihiro SHUTO, Ryuichi UMEDA
  • Jig
    Patent number: 10962568
    Abstract: Provided is a jig enabling detachment and attachment of a probe head from and to an electric connecting apparatus without using a special holding device. A jig (50) is applied to an electric connecting apparatus (10) electrically connecting a device under test to a testing apparatus for the device under test. The electric connecting apparatus includes a wiring substrate (22) and a probe head (28) secured to the wiring substrate with a plurality of set screws (26) and including a plurality of probes (34) made of a magnetic body. The jig (50) includes a plate (52) and a magnet (54) attached to the plate. The plate can detachably be attached to the probe head, and the magnet is opposed to a lower end portion (34 b) of each of the probes.
    Type: Grant
    Filed: February 6, 2018
    Date of Patent: March 30, 2021
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventor: Akihiro Shuto
  • JIG
    Publication number: 20200025800
    Abstract: Provided is a jig enabling detachment and attachment of a probe head from and to an electric connecting apparatus without using a special holding device. A jig (50) is applied to an electric connecting apparatus (10) electrically connecting a device under test to a testing apparatus for the device under test. The electric connecting apparatus includes a wiring substrate (22) and a probe head (28) secured to the wiring substrate with a plurality of set screws (26) and including a plurality of probes (34) made of a magnetic body. The jig (50) includes a plate (52) and a magnet (54) attached to the plate. The plate can detachably be attached to the probe head, and the magnet is opposed to a lower end portion (34b) of each of the probes.
    Type: Application
    Filed: February 6, 2018
    Publication date: January 23, 2020
    Inventor: Akihiro SHUTO