Abstract: There are provided a sensor device and an electronic apparatus that are capable of reducing the occurrence of defects. The sensor device includes: a first substrate; a second substrate provided on a side of one surface of the first substrate; an insulating first film that is provided on the side of the one surface and covers the second substrate; and a second film that is formed of a material different from that of the first film and provided at a position facing the first substrate across the first film. The second substrate and the first film are intermixed in a first layer and the first film and the second film are intermixed in a second layer. The second film is present outside the second substrate in plan view from a direction normal to the one surface.

Abstract: By replacing the antigen-binding domain, the present inventors discovered novel polypeptide complexes that retain BiTE's strong anti-tumor activity and excellent safety properties, as well as have long half-life in blood and can damage various different target cells.

Abstract: By replacing the antigen-binding domain, the present inventors discovered novel polypeptide complexes that retain BiTE's strong anti-tumor activity and excellent safety properties, as well as have long half-life in blood and can damage various different target cells.

Abstract: By replacing the antigen-binding domain, the present inventors discovered novel polypeptide complexes that retain BiTE's strong anti-tumor activity and excellent safety properties, as well as have long half-life in blood and can damage various different target cells.

Abstract: A nonaqueous electrolyte battery provided with a rolled electrode assembly, in which a positive electrode including a positive electrode active material layer disposed on a positive electrode collector formed from metal foil and a negative electrode including a negative electrode active material layer disposed on a negative electrode collector formed from metal foil are stacked with a separator therebetween and are rolled, and an electrolyte, wherein at least one of the positive electrode collector and the negative electrode collector has a compressed pattern portion which is disposed as a part of the metal foil and which has a thickness smaller than that of the other portion through compression, and the compressed pattern portion from one end parallel to the rolling direction of the metal foil to the other end opposite to the one end is not disposed continuously in the direction orthogonal to the rolling direction of the metal foil.

Abstract: A compound of Formula (1): ? wherein R1 represents an amidinophenyl group, etc.; R2 represents a hydrogen atom, etc.; R3 represents a carbamoylalkyl group, etc.; R4 represents a hydrogen atom, etc.; R5 represents a benzyl group, etc.; R6 represents a hydrogen atom, etc.; and R7 represents an alkylsulfonyl group, etc. A crystal of a complex between factor VIIa/human soluble tissue factor and a low-molecular weight reversible factor VIIa inhibitor. A medium carrying a part or all of structure coordinate data of a complex between human factor VIIa/human soluble tissue factor and a low-molecular weight reversible factor VIIa inhibitor, obtainable by X-ray crystal structure analysis of the crystal. A method for computationally designing a low-molecular weight reversible factor VIIa inhibitor using the coordinate data.

Abstract: A compound of Formula (1): 1

Abstract: Provided is a method of manufacturing a semiconductor device in which various kinds of processing conditions such as the polishing time in a CMP step can be always provided most appropriate against a wafer of a product lot even if there is an error in the film thickness or the like generated in a CVD step performed prior to the CMP step. The processing conditions in the CMP step are provided based on the film thickness formed in the prior CVD step. Thereby, even if there is an error in the film thickness generated in the CVD step, the processing conditions in the CMP step are provided most appropriate with the consideration of the error. In detail, based on the CVD film thickness and the target value, a processing condition calculator performs calculation of the actual amount of polishing of the present lot. Then, the processing condition calculator performs calculation based on the data, and the searched polishing rate or the searched updated value. Thereby, the polishing time is calculated.