Patents by Inventor Akiko Fujisawa
Akiko Fujisawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20150185455Abstract: A sample observation method of the present invention comprises a step of defining, with respect to an electron microscope image, an outline of an observation object with respect to a sample (3), or a plurality of points located along the outline, and a step of arranging a plurality of fields of view for an electron microscope along the outline, wherein electron microscope images of the plurality of fields of view that have been defined and arranged along the shape of the observation object through each of the above-mentioned steps are acquired. It is thus made possible to provide a sample observation method that is capable of selectively acquiring, with respect to observation objects of various shapes, an electron microscope image based on a field of view definition that is in accordance with the shape of the observation object, as well as an electron microscope apparatus that realizes such a sample observation method.Type: ApplicationFiled: March 13, 2015Publication date: July 2, 2015Inventors: Akiko FUJISAWA, Hiroyuki KOBAYASHI, Eiko NAKAZAWA
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Patent number: 9013572Abstract: A sample observation method of the present invention comprises a step of defining, with respect to an electron microscope image, an outline of an observation object with respect to a sample (3), or a plurality of points located along the outline, and a step of arranging a plurality of fields of view for an electron microscope along the outline, wherein electron microscope images of the plurality of fields of view that have been defined and arranged along the shape of the observation object through each of the above-mentioned steps are acquired. It is thus made possible to provide a sample observation method that is capable of selectively acquiring, with respect to observation objects of various shapes, an electron microscope image based on a field of view definition that is in accordance with the shape of the observation object, as well as an electron microscope apparatus that realizes such a sample observation method.Type: GrantFiled: October 19, 2009Date of Patent: April 21, 2015Assignee: Hitachi High-Technologies CorporationInventors: Akiko Fujisawa, Hiroyuki Kobayashi, Eiko Nakazawa
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Patent number: 8304132Abstract: According to one embodiment, a fuel cell includes a membrane electrode assembly including a plurality of unit cells which are composed of an electrolyte membrane, an anode including anode catalyst layers arranged at intervals on one of surfaces of the electrolyte membrane, and anode gas diffusion layers stacked on the anode catalyst layers, and a cathode including cathode catalyst layers arranged at intervals on the other surface of the electrolyte membrane and opposed to the anode catalyst layers, respectively, and cathode gas diffusion layers stacked on the cathode catalyst layers, wherein a thickness of at least one of the anode catalyst layer and the cathode catalyst layer of one of the unit cells, which neighbor each other, gradually decreases toward the other of the unit cells.Type: GrantFiled: June 21, 2011Date of Patent: November 6, 2012Assignee: Kabushiki Kaisha ToshibaInventors: Hisashi Chigusa, Katsumi Ichikawa, Hitoshi Koda, Akiko Fujisawa, Shinichi Onodera, Hiroaki Wakamatsu, Shinichi Kanbayashi, Naoyuki Takazawa
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Patent number: 8288725Abstract: There is provided a charged particle beam device which can prevent a specimen from not being able to be observed due to entering of a part of a grid of a mesh in a field of view, in which each pixel of a scanning transmission electron microscope image is displayed on the basis of a gray value of a predetermined gradation scale. In the case where the number of pixels of the predetermined gray value is not less than a predetermined percentage, it is judged that the mesh image is included in the scanning transmission electron microscope image. When the mesh image is not anymore included in the scanning transmission electron microscope image, the predetermined gradation scale is converted to another gradation scale and a scanning transmission electron microscope image is obtained.Type: GrantFiled: October 18, 2010Date of Patent: October 16, 2012Assignee: Hitachi High-Technologies CorporationInventors: Akiko Fujisawa, Eiko Nakazawa, Isao Nagaoki
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Patent number: 8212224Abstract: The present invention provides a charged particle beam device which can effectively restrain misalignment of an optical axis even if a position of an anode is changed.Type: GrantFiled: February 20, 2009Date of Patent: July 3, 2012Assignee: Hitachi High-Technologies CorporationInventors: Akiko Fujisawa, Hiroyuki Kobayashi, Eiko Nakazawa
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Publication number: 20110275001Abstract: According to one embodiment, a fuel cell includes a membrane electrode assembly including a plurality of unit cells which are composed of an electrolyte membrane, an anode including anode catalyst layers arranged at intervals on one of surfaces of the electrolyte membrane, and anode gas diffusion layers stacked on the anode catalyst layers, and a cathode including cathode catalyst layers arranged at intervals on the other surface of the electrolyte membrane and opposed to the anode catalyst layers, respectively, and cathode gas diffusion layers stacked on the cathode catalyst layers, wherein a thickness of at least one of the anode catalyst layer and the cathode catalyst layer of one of the unit cells, which neighbor each other, gradually decreases toward the other of the unit cells.Type: ApplicationFiled: June 21, 2011Publication date: November 10, 2011Inventors: Hisashi Chigusa, Katsumi Ichikawa, Hitoshi Koda, Akiko Fujisawa, Shinichi Onodera, Hiroaki Wakamatsu, Shinichi Kanbayashi, Naoyuki Takazawa
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Publication number: 20110205353Abstract: A sample observation method of the present invention comprises a step of defining, with respect to an electron microscope image, an outline of an observation object with respect to a sample (3), or a plurality of points located along the outline, and a step of arranging a plurality of fields of view for an electron microscope along the outline, wherein electron microscope images of the plurality of fields of view that have been defined and arranged along the shape of the observation object through each of the above-mentioned steps are acquired. It is thus made possible to provide a sample observation method that is capable of selectively acquiring, with respect to observation objects of various shapes, an electron microscope image based on a field of view definition that is in accordance with the shape of the observation object, as well as an electron microscope apparatus that realizes such a sample observation method.Type: ApplicationFiled: October 19, 2009Publication date: August 25, 2011Inventors: Akiko Fujisawa, Hiroyuki Kobayashi, Eiko Nakazawa
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Publication number: 20110062327Abstract: There is provided a charged particle beam device which can prevent a specimen from not being able to be observed due to entering of a part of a grid of a mesh in a field of view, in which each pixel of a scanning transmission electron microscope image is displayed on the basis of a gray value of a predetermined gradation scale. In the case where the number of pixels of the predetermined gray value is not less than a predetermined percentage, it is judged that the mesh image is included in the scanning transmission electron microscope image. When the mesh image is not anymore included in the scanning transmission electron microscope image, the predetermined gradation scale is converted to another gradation scale and a scanning transmission electron microscope image is obtained.Type: ApplicationFiled: October 18, 2010Publication date: March 17, 2011Applicant: Hitachi High-Technologies CorporationInventors: Akiko FUJISAWA, Eiko Nakazawa, Isao Nagaoki
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Patent number: 7838829Abstract: There is provided a charged particle beam device which can prevent a specimen from not being able to be observed due to entering of a part of a grid of a mesh in a field of view, each pixel of a scanning transmission electron microscope image is displayed on the basis of a gray value of a predetermined gradation scale. In the case where the number of pixels of a predetermined gray value is less than a predetermined percentage, it is decided that a mesh image is not included in the scanning transmission electron microscope image. In the case where the number of pixels of the predetermined gray value is not less than a predetermined percentage, it is judged that the mesh image is included in the scanning transmission electron microscope image.Type: GrantFiled: March 11, 2008Date of Patent: November 23, 2010Assignee: Hitachi High-Technologies CorporationInventors: Akiko Fujisawa, Eiko Nakazawa, Isao Nagaoki
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Publication number: 20090218507Abstract: The present invention provides a charged particle beam device which can effectively restrain misalignment of an optical axis even if a position of an anode is changed.Type: ApplicationFiled: February 20, 2009Publication date: September 3, 2009Inventors: Akiko Fujisawa, Hiroyuki Kobayashi, Eiko Nakazawa
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Publication number: 20080224037Abstract: There is provided a charged particle beam device which can prevent a specimen from not being able to be observed due to entering of a part of a grid of a mesh in a field of view, each pixel of a scanning transmission electron microscope image is displayed on the basis of a gray value of a predetermined gradation scale. In the case where the number of pixels of a predetermined gray value is less than a predetermined percentage, it is decided that a mesh image is not included in the scanning transmission electron microscope image. In the case where the number of pixels of the predetermined gray value is not less than a predetermined percentage, it is judged that the mesh image is included in the scanning transmission electron microscope image.Type: ApplicationFiled: March 11, 2008Publication date: September 18, 2008Applicant: Hitachi High-Technologies CorporationInventors: Akiko FUJISAWA, Eiko Nakazawa, Isao Nagaoki
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Patent number: 7053380Abstract: An X-ray detector comprising a scintillator layer (38) provided for each pixel and adapted for converting X radiation into light, a storage capacitor (15) for storing, as electric charge, the light converted in the scintillator layer (38), and a partition layer (39) partitioning the adjoining scintillator layers (38) provided to the respective pixels. The scintillator layer (38) contains a fluorescent material (I), the partition layer contains a second phosphor (P2) having optical characteristics different from those of the fluorescent material (IP1). The wavelength of the fluorescent light emitted from the second phosphor (P2) includes a component which is equal to or longer than the shortest wavelength of the fluorescent light emitted from the fluorescent material (IP1).Type: GrantFiled: February 10, 2003Date of Patent: May 30, 2006Assignee: Kabushiki Kaisha ToshibaInventors: Katsuhisa Homma, Hiroshi Aida, Kenichi Ito, Akiko Fujisawa, Hiroshi Onihashi
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Publication number: 20060033030Abstract: An X-ray detector comprising a scintillation layer separated by a partition for each pixel and a photodiode for converting fluorescent light, which is converted by the sciltillation layer, into a signal charge, wherein when an average particle diameter of phosphor particles forming the scintillation layer is Ds and an average particle diameter forming the partition is Dw, Ds>Dw is satisfied.Type: ApplicationFiled: March 28, 2003Publication date: February 16, 2006Applicant: KABUSHIKI KAISHA TOSHIBAInventors: Keiichi Ito, Hiroshi Aida, Eiji Oyaizu, Yukihiro Fukuta, Akihisa Saito, Akiko Fujisawa, Katsuhisa Homma
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Publication number: 20050017189Abstract: An X-ray detector comprising a scintillator layer (38) provided for each pixel and adapted for converting X radiation into light, a storage capacitor (15) for storing, as electric charge, the light converted in the scintillator layer (38), and a partition layer (39) partitioning the adjoining scintillator layers (38) provided to the respective pixels. The scintillator layer (38) contains a fluorescent material (I), the partition layer contains a second phosphor (P2) having optical characteristics different from those of the fluorescent material (IP1). The wavelength of the fluorescent light emitted from the second phosphor (P2) includes a component which is equal to or longer than the shortest wavelength of the fluorescent light emitted from the fluorescent material (IP1).Type: ApplicationFiled: February 10, 2003Publication date: January 27, 2005Inventors: Katsuhisa Homma, Hiroshi Aida, Kenichi Ito, Akiko Fujisawa, Hiroshi Onihashi
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Patent number: 5809556Abstract: A data storage system has a data storage device comprising an electrically erasable programmable read-only memory which has an array of data storage areas for storing supplied data therein. Supplied data may be written successively in the data storage areas again and again until any one of the data storage areas becomes unusable. Supplied data may also be written repeatedly in each of the data storage areas until each data storage area becomes unusable, and the writing of supplied data may be stopped when all the data storage areas become unusable. Alternatively, supplied data may be written successively in the data storage areas except any one or more of the data storage areas which have become unusable, and the writing of supplied data may be stopped when all the data storage areas become unusable.Type: GrantFiled: May 14, 1993Date of Patent: September 15, 1998Assignee: Toshiba CorporationInventors: Akiko Fujisawa, Shinya Takahashi
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Patent number: 5363429Abstract: Information on the telephone number of a terminal which made an interrupting call during telephonic communication is detected, displayed on a display and stored in memory. After completion of the telephone communication, the information on the telephone number stored in the memory is retrieved. By depressing "SND" key when the retrieved telephone number is being displayed, a call is automatically placed on the basis of the telephone number. Even if an interrupting call is received, the interrupter is recognized without stoppage of the ongoing telephonic communication and the interrupter can be accessed later with a simple operation.Type: GrantFiled: May 22, 1992Date of Patent: November 8, 1994Assignee: Kabushiki Kaisha ToshibaInventor: Akiko Fujisawa