Patents by Inventor Akimasa Osaka
Akimasa Osaka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11776800Abstract: A substance analyzer that includes, to enhance selectivity of substance analysis, the following: a heater that heats a medium for collecting a chemical substance adhering to a surface of an inspection object; a mass spectrometer that performs tandem mass spectrometry of vapor derived from the chemical substance heated and vaporized by the heater from the medium; and a control device that causes the mass spectrometer to perform, based on a temperature of the medium in the heater, tandem mass spectrometry for the chemical substance that is vaporized at the temperature of the medium using the vapor sent from the heater to the mass spectrometer.Type: GrantFiled: June 20, 2019Date of Patent: October 3, 2023Assignee: Hitachi High-Tech CorporationInventors: Yasuaki Takada, Shun Kumano, Masuyuki Sugiyama, Tsukasa Shishika, Shinji Yoshioka, Akimasa Osaka
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Publication number: 20230304728Abstract: This cooling box for storing a reagent and the like in a cold state, becomes a cantilever structure where, when a slide rail (104) is disposed outside a cooling space, an installation part (102) is held only by a drawer door (103). When a heavy article is placed or the like, the installation part is deformed and broken. This cooing box comprises a sliding member holder (106) provided with sliding members (200) each including a compression coil spring (202) which is an elastic body inside a heat insulating box body (101). When a reagent container (301) is installed in the installation part (102) and drawn out, the installation part and the sliding members slide in contact with each other. When a load exceeding the weight of an installed article is applied to the installation part, the installation part and the sliding member holder come into surface contact with each other. Thus, deformation and breakage of the installation part can be prevented.Type: ApplicationFiled: September 4, 2020Publication date: September 28, 2023Inventors: Kazutoshi ONUKI, Akimasa OSAKA
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Publication number: 20220412848Abstract: Provided is a sample-analyzing apparatus that can reduce a difference in the flow rate of a vaporized sample generated by heating a piece of paper to which the sample has adhered. The sample-analyzing apparatus includes a sample introduction unit that generates and suctions a vaporized sample obtained by vaporizing a sample adhered to a piece of paper by heating the piece of paper, and an analysis unit that analyzes the suctioned vaporized sample. The sample introduction unit has a heating surface that comes into contact with the piece of paper and heats the piece of paper, a plurality of flow paths through which the vaporized sample flows are provided in the heating surface, and a suction opening through which the vaporized sample is suctioned is provided in each of the flow paths.Type: ApplicationFiled: November 5, 2019Publication date: December 29, 2022Inventors: Akimasa Osaka, Tsukasa Shishika, Shinji Yoshioka
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Publication number: 20220359182Abstract: A substance analyzer that includes, to enhance selectivity of substance analysis, the following: a heater that heats a medium for collecting a chemical substance adhering to a surface of an inspection object; a mass spectrometer that performs tandem mass spectrometry of vapor derived from the chemical substance heated and vaporized by the heater from the medium; and a control device that causes the mass spectrometer to perform, based on a temperature of the medium in the heater, tandem mass spectrometry for the chemical substance that is vaporized at the temperature of the medium using the vapor sent from the heater to the mass spectrometer.Type: ApplicationFiled: June 20, 2019Publication date: November 10, 2022Applicant: Hitachi High-Tech CorporationInventors: Yasuaki TAKADA, Shun KUMANO, Masuyuki SUGIYAMA, Tsukasa SHISHIKA, Shinji YOSHIOKA, Akimasa OSAKA
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Patent number: 9971139Abstract: In the microscope observation container according to the present invention, an observed sample is accommodated by an objective lens barrel provided with a housing extending along the radiation direction of excitation light and an objective lens fixed to an inside surface of the housing. The microscope observation container is provided with a structure for collecting a liquid immersion medium added by dispensation, the structure having a portion contacted by the objective lens barrel during observation. During observation the aforementioned portion is contacted by the objective lens barrel, and the liquid immersion medium is thereby sealed by the objective lens barrel and the structure. The aforementioned portion also has an elastic force, and is deformed so as to conform to the housing of the objective lens by the contact.Type: GrantFiled: March 12, 2015Date of Patent: May 15, 2018Assignee: Hitachi High-Technologies CorporationInventors: Michiru Fujioka, Shuhei Yamamoto, Tsuyoshi Sonehara, Hiromi Kusaka, Akimasa Osaka
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Publication number: 20170045726Abstract: In the microscope observation container according to the present invention, an observed sample is accommodated by an objective lens barrel provided with a housing extending along the radiation direction of excitation light and an objective lens fixed to an inside surface of the housing. The microscope observation container is provided with a structure for collecting a liquid immersion medium added by dispensation, the structure having a portion contacted by the objective lens barrel during observation. During observation the aforementioned portion is contacted by the objective lens barrel, and the liquid immersion medium is thereby sealed by the objective lens barrel and the structure. The aforementioned portion also has an elastic force, and is deformed so as to conform to the housing of the objective lens by the contact.Type: ApplicationFiled: March 12, 2015Publication date: February 16, 2017Inventors: Michiru FUJIOKA, Shuhei YAMAMOTO, Tsuyoshi SONEHARA, Hiromi KUSAKA, Akimasa OSAKA
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Patent number: 8709364Abstract: The present invention provides a heat retaining device for solving problematic adhesion of a container to the heat retaining device. The heat retaining device includes a supporting rod, a top plate, a bottom plate, a heat retaining body, and a supporting spring. A pressing force applied to the container contained in the hole of the heat retaining body compresses the supporting spring to move the heat retaining body downward along the supporting rod. Release of the pressing force moves the heat retaining body upward by an elastic force of the supporting spring until the heat retaining body comes into contact with the top plate.Type: GrantFiled: October 20, 2010Date of Patent: April 29, 2014Assignee: Hitachi-High-Technologies CorporationInventors: Akimasa Osaka, Minoru Sano, Hideo Kanno, Akiyuki Nemoto, Yoshiyuki Shoji
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Publication number: 20120207646Abstract: The present invention provides a heat retaining device for solving problematic adhesion of a container to the heat retaining device. The heat retaining device includes a supporting rod, a top plate, a bottom plate, a heat retaining body, and a supporting spring. A pressing force applied to the container contained in the hole of the heat retaining body compresses the supporting spring to move the heat retaining body downward along the supporting rod. Release of the pressing force moves the heat retaining body upward by an elastic force of the supporting spring until the heat retaining body comes into contact with the top plate.Type: ApplicationFiled: October 20, 2010Publication date: August 16, 2012Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATIONInventors: Akimasa Osaka, Minoru Sano, Hideo Kanno, Akiyuki Nemoto, Yoshiyuki Shoji
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Patent number: 7645986Abstract: An object of the present invention is to provide a mass spectrometer that uses a time-of-flight mass spectrometer for performing mass spectrometry on the basis of the difference in flight time based on mass of desired ions, and that is suitable for improving the sensitivity and analysis precision of the mass spectrometer. A gate electrode is located at a stage before an acceleration region that is located before an emitter for emitting ions. This gate electrode is capable of applying the voltage that is set on a mass-number region basis, and is also capable of separating desired ions to be measured on the basis of the mass number by switching the gate electrode at high speed. Therefore, it is possible to improve the resolution.Type: GrantFiled: April 25, 2008Date of Patent: January 12, 2010Assignee: Hitachi High-Technologies CorporationInventors: Hiromichi Kikuma, Hidenori Nanba, Akimasa Osaka
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Publication number: 20080203292Abstract: An object of the present invention is to provide a mass spectrometer that uses a time-of-flight mass spectrometer for performing mass spectrometry on the basis of the difference in flight time based on mass of desired ions, and that is suitable for improving the sensitivity and analysis precision of the mass spectrometer. A gate electrode is located at a stage before an acceleration region that is located before an emitter for emitting ions. This gate electrode is capable of applying the voltage that is set on a mass-number region basis, and is also capable of separating desired ions to be measured on the basis of the mass number by switching the gate electrode at high speed. Therefore, it is possible to improve the resolution.Type: ApplicationFiled: April 25, 2008Publication date: August 28, 2008Inventors: Hiromichi Kikuma, Hidenori Nanba, Akimasa Osaka
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Patent number: 7375318Abstract: An object of the present invention is to provide a mass spectrometer that uses a time-of-flight mass spectrometer for performing mass spectrometry on the basis of the difference in flight time based on mass of desired ions, and that is suitable for improving the sensitivity and analysis precision of the mass spectrometer. A gate electrode is located at a stage before an acceleration region that is located before an emitter for emitting ions. This gate electrode is capable of applying the voltage that is set on a mass-number region basis, and is also capable of separating desired ions to be measured on the basis of the mass number by switching the gate electrode at high speed. Therefore, it is possible to improve the resolution.Type: GrantFiled: January 26, 2007Date of Patent: May 20, 2008Assignee: Hitachi High-Technologies CorporationInventors: Hiromichi Kikuma, Hidenori Nanba, Akimasa Osaka
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Publication number: 20080073513Abstract: An object of the present invention is to provide a mass spectrometer that uses a time-of-flight mass spectrometer for performing mass spectrometry on the basis of the difference in flight time based on mass of desired ions, and that is suitable for improving the sensitivity and analysis precision of the mass spectrometer. A gate electrode is located at a stage before an acceleration region that is located before an emitter for emitting ions. This gate electrode is capable of applying the voltage that is set on a mass-number region basis, and is also capable of separating desired ions to be measured on the basis of the mass number by switching the gate electrode at high speed. Therefore, it is possible to improve the resolution.Type: ApplicationFiled: January 26, 2007Publication date: March 27, 2008Inventors: Hiromichi Kikuma, Hidenori Nanba, Akimasa Osaka
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Patent number: D977143Type: GrantFiled: March 30, 2020Date of Patent: January 31, 2023Assignees: QIAGEN GMBH, HITACHI HIGH-TECH CORPORATIONInventors: Sasa Lazevski, Akimasa Osaka