Patents by Inventor Akimitsu Ikeda

Akimitsu Ikeda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7773712
    Abstract: A clock switching circuit in which one clock signal is selected from 2N-phase input clock signals with the same frequency but with each shifted in phase (where N is an integer equal to or greater than 3), based on N-bit selection signals, and is output as an output clock signal, comprises a selector group having 2N?1 selectors each of which select and output one clock signal from two input clock signals, and an operation control circuit which generates 2N?1 operation control signals to execute control to set the 2N?1 selectors into an active state or into a sleep state. The selectors select the clock signals based on the selection signals. The operation control circuit executes control to set a portion of the selectors among the 2N?1 selectors to the active state and to set the remaining selectors to the sleep state, based on the selection signals.
    Type: Grant
    Filed: July 5, 2007
    Date of Patent: August 10, 2010
    Assignee: Fujitsu Semiconductor Limited
    Inventor: Akimitsu Ikeda
  • Publication number: 20080008282
    Abstract: A clock switching circuit in which one clock signal is selected from 2N-phase input clock signals with the same frequency but with each shifted in phase (where N is an integer equal to or greater than 3), based on N-bit selection signals, and is output as an output clock signal, comprises a selector group having 2N?1 selectors each of which select and output one clock signal from two input clock signals, and an operation control circuit which generates 2N?1 operation control signals to execute control to set the 2N?1 selectors into an active state or into a sleep state. The selectors select the clock signals based on the selection signals. The operation control circuit executes control to set a portion of the selectors among the 2N?1 selectors to the active state and to set the remaining selectors to the sleep state, based on the selection signals.
    Type: Application
    Filed: July 5, 2007
    Publication date: January 10, 2008
    Inventor: Akimitsu Ikeda
  • Patent number: 7183831
    Abstract: A clock switching circuit suitably adapted to stable switching operation of high-frequency multiphase clock signals. The clock switching circuit receives two clock signals and selectively outputs one of the two clock signals in accordance with a selection signal. The clock switching circuit includes a switching controller that transfers the selection signal at the beginning of a period in which both of the two clock signals are active, and an internal selector that selectively outputs one of the two clock signals in response to the selection signal transferred from the switching controller.
    Type: Grant
    Filed: October 27, 2004
    Date of Patent: February 27, 2007
    Assignee: Fujitsu Limited
    Inventor: Akimitsu Ikeda
  • Publication number: 20050285636
    Abstract: A clock switching circuit suitably adapted to stable switching operation of high-frequency multiphase clock signals. The clock switching circuit receives two clock signals and selectively outputs one of the two clock signals in accordance with a selection signal. The clock switching circuit includes a switching controller that transfers the selection signal at the beginning of a period in which both of the two clock signals are active, and an internal selector that selectively outputs one of the two clock signals in response to the selection signal transferred from the switching controller.
    Type: Application
    Filed: October 27, 2004
    Publication date: December 29, 2005
    Inventor: Akimitsu Ikeda
  • Publication number: 20050044461
    Abstract: A semiconductor device test circuit that prevents unnecessary data from being inputted to a functional macro circuit at the time of testing the functional macro circuit. In a plurality of flip-flops connected in series, serial test pattern data latched by a flip-flop at a stage is latched by a flip-flop at the next stage in synchronization with a first clock signal. The test pattern data latched by flip-flops at all the stages is outputted to the functional macro circuit at once in synchronization with a second clock signal inputted to the flip-flops.
    Type: Application
    Filed: March 26, 2004
    Publication date: February 24, 2005
    Inventors: Akimitsu Ikeda, Naoaki Naka