Abstract: A probe head having interface contact members and probe elements on a first side of an insulating support. The interface contact members and the probe elements both pass through the support to a second side where conductors couple interface contact members with appropriate probe elements. A test fixture for using the probe head to test printed circuit boards is also disclosed.

Abstract: There is disclosed a printed circuit board test fixture which comprises a housing, a pair of parallel, opposed platens with press means associated with at least one of the platens. One of the platens supports a printed circuit board and the other supports a plurality of spring-biased, probe contact units positioned at predetermined locations to make contact to selected points of the printed circuit board when the platens are pressed into registration. When the contact units are carried in a removeable probe head which is one of a plurality of interchangeable probe heads, the test fixture can support an interface connector in substantially parallel alignment to the platens and the probe head bears interface contact members which are moved into mating connection with opposite interface contact members carried by the interface connector.