Patents by Inventor Akio Izumi

Akio Izumi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5920382
    Abstract: A distance-measuring apparatus includes light-sensitive devices formed of optical sensor arrays disposed on image-forming surfaces of right and left image-forming lenses, respectively. The apparatus uses image data from the optical sensor arrays of the light-sensitive devices to determine the distance from an object such as a vehicle in front of the apparatus via a distance detection circuit and capable of detecting condensation or a foreign particle obscuring a cover glass or defective pixels in the optical sensor arrays. In a defective condition, a defective visibility sensor emits an alarm signal to alert the operator.
    Type: Grant
    Filed: July 15, 1997
    Date of Patent: July 6, 1999
    Assignee: Fuji Electric Co., Ltd.
    Inventors: Hideo Shimizu, Takehide Hirabayashi, Akio Izumi
  • Patent number: 5915033
    Abstract: A method of the invention corrects a detection error, caused by an assembly error, in a distance or a distance-related index detected from an image captured in the visual field of an image detection module including an optical device and a pair of image sensing devices, each including a plurality of image sensors.
    Type: Grant
    Filed: September 15, 1997
    Date of Patent: June 22, 1999
    Assignee: Fuji Electric Co., Ltd.
    Inventors: Taichi Tanigawa, Hideo Shimizu, Takehide Hirabayashi, Akio Izumi
  • Patent number: 5608513
    Abstract: A range finding device for automatic focussing can be accurately assembled and has a good external appearance. The range finding device includes an optical lens block having coupling members projecting from the lenses, which further include a protrusion and side walls formed on both sides of the protrusion which are taller than the protrusion. The length of the protrusion is shorter than width of the side walls. The protrusion is partly constricted by a recess portion to form a constriction portion. The range finding device further includes an optical waveguide case having a pair of windows formed on an upper surface and a pair of coupling members formed on both sides of the windows, which further includes a fitting surface that fits to a bottom surface of the coupling member, a pair of protrusions standing on both ends of the fitting surface between which the side walls of the coupling member are inserted, and a liquid pool formed as a shallow groove on the fitting surface.
    Type: Grant
    Filed: August 2, 1994
    Date of Patent: March 4, 1997
    Assignee: Fuji Electric Co., Ltd.
    Inventors: Sachiaki Komatsu, Akio Izumi
  • Patent number: 5581099
    Abstract: In a CCD solid state image sensing device in which a photosensitive section is constructed by a photodiode formed by a PN junction between a first P-type well region and an N-type impurity diffusion region formed on an N-type silicon substrate, the N-type impurity diffusion region is formed by the ion implantation of single substance of arsenic (As). According to this CCD solid state image sensing device, a bright flaw on an image sensing screen, which is one of the defects encountered with an image sensing screen, can be reduced. Also, the n-type impurity diffusion region constructing the PN Junction can be reduced in size and the CCD solid state image sensing device itself can be made compact in size. Further, a method of manufacturing a CCD solid state image sensing device also is provided.
    Type: Grant
    Filed: June 5, 1995
    Date of Patent: December 3, 1996
    Assignee: Sony Corporation
    Inventors: Takahisa Kusaka, Hideo Kanbe, Akio Izumi, Hideshi Abe, Masanori Ohashi, Atsushi Asai
  • Patent number: 5476808
    Abstract: In a CCD solid state image sensing device in which a photosensitive section is constructed by a photodiode formed by a PN junction between a first P-type well region and an N-type impurity diffusion region formed on an N-type silicon substrate, the N-type impurity diffusion region is formed by the ion implantation of single substance of arsenic (As). According to this CCD solid state image sensing device, a bright flaw on an image sensing screen, which is one of the defects encountered with an image sensing screen, can be reduced. Also, the n-type impurity diffusion region constructing the PN junction can be reduced in size and the CCD solid state image sensing device itself can be made compact in size. Further, a method of manufacturing a CCD solid state image sensing device also is provided.
    Type: Grant
    Filed: May 11, 1993
    Date of Patent: December 19, 1995
    Assignee: Sony Corporation
    Inventors: Takahisa Kusaka, Hideo Kanbe, Akio Izumi, Hideshi Abe, Masanori Ohashi, Atsushi Asai
  • Patent number: 5288656
    Abstract: In a CCD solid state image sensing device in which a photo-sensitive section is constructed by a photodiode formed by a PN junction between a first P-type well region and an N-type impurity diffusion region formed on an N-type silicon substrate, the N-type impurity diffusion region is formed by the ion implantation of single substance of arsenic (As). According to this CCD solid state image sensing device, a bright flaw on an image sensing screen, which is one of the defects encountered with an image sensing screen, can be reduced. Also, the n-type impurity diffusion region constructing the PN junction can be reduced in size and the CCD solid state image sensing device itself can be made compact in size. Further, a method of manufacturing a CCD solid state image sensing device also is provided.
    Type: Grant
    Filed: September 23, 1992
    Date of Patent: February 22, 1994
    Assignee: Sony Corporation
    Inventors: Takahisa Kusaka, Hideo Kanbe, Akio Izumi, Hideshi Abe, Masanori Ohashi, Atsushi Asai
  • Patent number: 5189499
    Abstract: A charge-coupled device has a multi-layer structure insulating layer is formed beneath a transfer electrode, floating electrodes and an electrode adjacent the floating electrodes so that pin hole phenomenon in a charge transfer section of the charge coupled device can be successfully prevented. On the other hand, a sole-layer structure insulating layer is formed beneath a gate electrode of a peripheral component so that a threshold voltage of the gate electrode of the peripheral component can be successfully controlled at a desired value.
    Type: Grant
    Filed: October 8, 1991
    Date of Patent: February 23, 1993
    Assignee: Sony Corporation
    Inventors: Akio Izumi, Yasuhito Maki, Tadakuni Narabu, Maki Sato, Takaji Otsu, Katsuyuki Saito
  • Patent number: 5039222
    Abstract: Apparatus and a method for producing Fourier spectra for a test object utilizing a plurality of laser interference signals each having a period corresponding to a wavelength of a laser beam and being out of phase by 1/n of the wavelength of the laser beam, n being a positive integer above 1. An infrared interference signal representing the test object after the test object is irradiated with an infrared light beam is sampled at a time interval corresponding to 1/n of the wavelength of the at least one laser interference signal and n sets of sampled data corresponding to the infrared interference signal are produced. Each set of sampled data is Fourier-transformed independently from the other to generate a Fourier spectrum corresponding to each set. All of the independently generated Fourier spectra are later combined to produce a Fourier spectrum corresponding to the infrared interference signal.
    Type: Grant
    Filed: July 17, 1989
    Date of Patent: August 13, 1991
    Assignee: Fuji Electric Co., Ltd.
    Inventor: Akio Izumi
  • Patent number: 4932780
    Abstract: In an interferometer comprising a beam splitter made up of a parallel planar plate and translucent (that is, semi-reflecting) films formed on both sides thereof, and a pair of reverse reflectors disposed at predetermined distances from the two surfaces of the beam splitter, an incident beam is split into two beams by one of the translucent films, and the two beams are reflected by the reverse reflectors, thus interfering with each other at the other translucent film.
    Type: Grant
    Filed: November 3, 1987
    Date of Patent: June 12, 1990
    Assignee: Fuji Electric Co., Ltd.
    Inventor: Akio Izumi
  • Patent number: 4783827
    Abstract: Serial data processing equipment useful for product inspection in a factory automation system stores. Data concerning the number of picture elements above a threshold value which should be detected in each of sequentially divided visual fields or window areas of the product being inspected as viewed by a one-dimensional imaging element, or line scanner, is stored in memory. Data concerning the number of picture elements actually detected in each of the window areas is compared with the stored data and the comparison is stored in memory for use in deciding whether the product inspected is good or bad.
    Type: Grant
    Filed: May 27, 1986
    Date of Patent: November 8, 1988
    Assignee: Fuji Electric Co., Ltd.
    Inventor: Akio Izumi
  • Patent number: 4685808
    Abstract: A color discrimination method and sensor is provided for determining the color of a particular object. The sensor comprises a radiation source, focusing lenses, reflecting surfaces, sharp cut filters and a photodiode for spectral sensitivity. The photodiode detects the light and converts it into electrical signals that are delivered to an amplifier, which produces signals discriminated according to color. The system can detect light within an extended wavelength range of about 440 nm to 900 nm.
    Type: Grant
    Filed: April 7, 1986
    Date of Patent: August 11, 1987
    Assignee: Fuji Electric Corporate Research and Development Co., Ltd.
    Inventors: Toshiyuki Nakazawa, Akio Izumi
  • Patent number: 4633319
    Abstract: Apparatus for adjusting the focus of an optical system comprising an image pickup device providing an image detection plane where the image of an object is focused via the optical system to be adjusted and a circuit for processing the analog video signal provided by the pickup device to control the focus. The circuit comprises a means for forming a time and level shifted version for comparison with the unshifted analog video signal and means for shifting the focus to minimize the length of time during which this comparison exceeds a prescribed threshold level.
    Type: Grant
    Filed: July 19, 1985
    Date of Patent: December 30, 1986
    Assignee: Fuji Electric Co., Ltd.
    Inventors: Akio Izumi, Hideyuki Tanaka
  • Patent number: 4537648
    Abstract: An automatic specimen sealing system which provides totally automated sealing of glass slides. Slides are ejected sequentially at predetermined intervals onto a conveyor at a predetermined orientation. The size of the specimens held on the slides is detected, and liquid adhesive is supplied onto the slides in an amount determined in accordance with the thus-detected specimen sizes. Glass covers are then placed over the specimens, with the size of the glass covers being also selected in accordance with the specimen size. The slides with the covers placed thereon are next fed to a binding device where the covers and slides are bound together. Finally, the slides are assembled in trays.
    Type: Grant
    Filed: February 28, 1984
    Date of Patent: August 27, 1985
    Assignees: Sankyo Company Limited, Fuji Electric Company Ltd.
    Inventors: Kouji Shiino, Nobuo Hashimoto, Shozo Wada, Keijiro Nakamura, Akio Izumi, Toshio Sato, Takashi Matsui
  • Patent number: D362258
    Type: Grant
    Filed: July 23, 1993
    Date of Patent: September 12, 1995
    Assignee: Fuji Electric Co., Ltd.
    Inventors: Akio Izumi, Takashi Nishibe
  • Patent number: D362259
    Type: Grant
    Filed: July 23, 1993
    Date of Patent: September 12, 1995
    Assignee: Fuji Electric Co., Ltd.
    Inventors: Akio Izumi, Takashi Nishibe