Patents by Inventor Akio Sanda

Akio Sanda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Defect detector and defect detection method
    Patent number: 7440606
    Abstract: A control part of a defect detector is provided with a magnification operation part, an inspected image display part and a master image display part. The magnification operation part operates a display magnification ?1 (display magnification data) for a defective area on the basis of defective information. An imaging part images inspected image data so that an imaging magnification ?1 reaches the display magnification ?1, and the inspected image display part displays the inspected image data on a detection monitor. The master image data display part operates a display magnification ?2 for master image data to be substantially identical to the display magnification ?1, and displays the master image data on the detection monitor at the display magnification ?2. Thus, the efficiency in a defect detecting operation of an operator is improved.
    Type: Grant
    Filed: September 15, 2004
    Date of Patent: October 21, 2008
    Assignee: Dainippon Screen Mfg. Co., Ltd.
    Inventor: Akio Sanda
  • Defect detector and defect detection method
    Publication number: 20050056797
    Abstract: A control part of a defect detector is provided with a magnification operation part, an inspected image display part and a master image display part. The magnification operation part operates a display magnification ?1 (display magnification data) for a defective area on the basis of defective information. An imaging part images inspected image data so that an imaging magnification ?1 reaches the display magnification ?1, and the inspected image display part displays the inspected image data on a detection monitor. The master image data display part operates a display magnification ?2 for master image data to be substantially identical to the display magnification ?1, and displays the master image data on the detection monitor at the display magnification ?2. Thus, the efficiency in a defect detecting operation of an operator is improved.
    Type: Application
    Filed: September 15, 2004
    Publication date: March 17, 2005
    Inventor: Akio Sanda