Patents by Inventor Akira Kameyama

Akira Kameyama has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Temperature measuring apparatus
    Patent number: 4095469
    Abstract: An apparatus for measuring the temperature of a metallic body in a non-contact maner includes an electronic circuitry for measuring a change in the impedance of a detecting coil arranged oppposite to the metallic body. The electronic circuitry comprises an operational amplifier, a negative feedback circuit with adjustable feedback factor, a positive feedback circuit, an oscillator, a phase shifter circuit and a synchronous detection circuit. The change in the impedance of the detecting coil is caused by the effect of eddy current produced by the application of alternating field to the metallic body, and this impedance change is dependent on change in the temperature of the metallic body. By adjusting the negative feedback factor .beta..sub.N of the negative feedback circuit and the phase angle .theta.
    Type: Grant
    Filed: March 11, 1977
    Date of Patent: June 20, 1978
    Assignee: Nippon Kokan Kabushiki Kaisha
    Inventors: Takeo Yamada, Katsujiro Watanabe, Seigo Ando, Akira Kameyama