Abstract: There is provided an electrodeless discharge lamp lighting device with small size and low cost by simplifying a noise suppression part and a lighting apparatus having the electrodeless discharge lamp lighting device. A counter circuit of a frequency signal generating circuit repeatedly generates a frequency signal of which the amplitude is varied in a multi-step shape on the basis of an oscillation period of an oscillation circuit. An oscillation circuit outputs an oscillation signal of a frequency corresponding to the amplitude of the frequency signal. A drive circuit drives a switching element of an inverter circuit at the frequency of the oscillation signal and the inverter circuit applies a high-frequency voltage generated by the switching operation of the switching element to an induction coil to start up and light the electrodeless discharge lamp.

Abstract: There is provided an electrodeless discharge lamp lighting device with small size and low cost by simplifying a noise suppression part and a lighting apparatus having the electrodeless discharge lamp lighting device. A counter circuit of a frequency signal generating circuit repeatedly generates a frequency signal of which the amplitude is varied in a multi-step shape on the basis of an oscillation period of an oscillation circuit. An oscillation circuit outputs an oscillation signal of a frequency corresponding to the amplitude of the frequency signal. A drive circuit drives a switching element of an inverter circuit at the frequency of the oscillation signal and the inverter circuit applies a high-frequency voltage generated by the switching operation of the switching element to an induction coil to start up and light the electrodeless discharge lamp.

Abstract: A ballast for an electrodeless discharge lamp includes a high frequency power supply that supplies a high frequency electric power to an induction coil for operating the lamp. A dimmer controller generates a control signal in response to a dimmer command designating a varying dimming ratio. The control signal defines a first period Ton in which the power supply is controlled to apply a coil voltage of a first level V1 to the induction coil for operating the lamp. The first period is followed by a second period Toff in which the power supply is controlled to apply the coil voltage of a second level V2 that is lower than the first level and fails to sustain the lamp. The control signal defines, between the second period and the first period, a starting period Tst in which the coil voltage increases continuously for smooth transition from an off-condition to an on-condition of the lamp.

Abstract: A method for manufacturing an integrated circuit, a measurement apparatus of an integrated circuit, and a wafer that reduces damages inflicted on bonding pads while enabling a probe test to be accurately performed. A sensor cell is arranged on a wafer between chip formation regions. The sensor cell has a diaphragm. Sensor pads, connected to a doping region, are arranged on the surface of the diaphragm. Probe needles contact the sensor pads. This strains the doping region and produces a corresponding voltage measured by the probe needles connected to the sensor pads. Relative inclination angle and relative distance of a probe card, which includes the probe needles, and the wafer are determined based on the measured voltage. A conduction test is performed by having the probe needles contact the bonding pad of the wafer while maintaining the determined the relative position.

Abstract: A method for manufacturing an integrated circuit, a measurement apparatus of an integrated circuit, and a wafer that reduces damages inflicted on bonding pads while enabling a probe test to be accurately performed. A sensor cell is arranged on a wafer between chip formation regions. The sensor cell has a diaphragm. Sensor pads, connected to a doping region, are arranged on the surface of the diaphragm. Probe needles contact the sensor pads. This strains the doping region and produces a corresponding voltage measured by the probe needles connected to the sensor pads. Relative inclination angle and relative distance of a probe card, which includes the probe needles, and the wafer are determined based on the measured voltage. A conduction test is performed by having the probe needles contact the bonding pad of the wafer while maintaining the determined the relative position.

Abstract: A ballast for an electrodeless discharge lamp includes a high frequency power supply that supplies a high frequency electric power to an induction coil for operating the lamp. A dimmer controller generates a control signal in response to a dimmer command designating a varying dimming ratio. The control signal defines a first period Ton in which the power supply is controlled to apply a coil voltage of a first level V1 to the induction coil for operating the lamp. The first period is followed by a second period Toff in which the power supply is controlled to apply the coil voltage of a second level V2 that is lower than the first level and fails to sustain the lamp. The control signal defines, between the second period and the first period, a starting period Tst in which the coil voltage increases continuously for smooth transition from an off-condition to an on-condition of the lamp.

Abstract: Dihydropyridine derivatives represented by the following formula: analogs thereof and pharmaceutically acceptable salts thereof have an activity of selectively inhibiting the action of N-type calcium channel, and they are used as therapeutic agents for various diseases relating to N-type calcium channel.

Abstract: Dihydropyridine derivatives represented by the following formula: 1