Abstract: A surface analyzer is provided with a measuring unit, a scatter diagram generation unit, a cluster analysis unit, and a cluster region detection unit. The measuring unit acquires a signal reflecting a quantity of each of a plurality of components or elements that are analysis targets at a plurality of positions on a sample. The scatter diagram generation unit generates a scatter diagram based on a measurement result by the measuring unit. The cluster analysis unit performs the clustering of points in the scatter diagram. The cluster region detection unit acquires, based on clustering information given to each point in the scatter diagram by the cluster analysis unit, for each cluster, cluster region boundary information on a polygon having a predetermined number or less of vertices.

Abstract: An object of the present invention is to improve the accuracy of clustering by avoiding detection of false clusters when automatically clustering points on a scatter diagram.

Abstract: An object of the present invention is to improve the accuracy of clustering by avoiding detection of false clusters when automatically clustering points on a scatter diagram.

Abstract: A surface analyzer is provided with a measuring unit, a scatter diagram generation unit, a cluster analysis unit, and a cluster region detection unit. The measuring unit acquires a signal reflecting a quantity of each of a plurality of components or elements that are analysis targets at a plurality of positions on a sample. The scatter diagram generation unit generates a scatter diagram based on a measurement result by the measuring unit. The cluster analysis unit performs the clustering of points in the scatter diagram. The cluster region detection unit acquires, based on clustering information given to each point in the scatter diagram by the cluster analysis unit, for each cluster, cluster region boundary information on a polygon having a predetermined number or less of vertices.

Abstract: The sample component determination method includes: acquiring a spectrum of a sample which is measured by a wavelength dispersive X-ray analyzer; defining a target element to be analyzed in the sample and an input wavelength range corresponding to the target element; and determining a chemical bonding state of the target element in the sample by inputting a partial spectrum of the sample spectrum that falls within the input wavelength range to a first trained model.

Abstract: Disclosed are the novel microorganisms HF8815 and HF8835 belonging to Genus Fusarium oxysporum which are non-pathogenic to garlic and capable of suppressing mycotic infection in garlic. A suppressant for mycotic infection in garlic comprising said microorganisms or its culture medium as an effective ingredient and a method for suppressing mycotic infection in garlic utilizing said suppressant are also disclosed. The use of the microorganism can effectively suppress the mycotic infection in garlic effectuating a biological means involving cross defense mechanism without giving any adverse effects to the soil nor deteriorating the environment.