Patents by Inventor Akira OIDE

Akira OIDE has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240120142
    Abstract: The electronic component includes an element body, an internal conductor, a cover layer, and a conductor layer. The internal conductor is disposed in the element body. The cover layer is disposed on an outer surface of the element body and has an electrical insulation property. The conductor layer is disposed on the cover layer and is electrically connected to the internal conductor. The conductor layer includes a portion. The portion protrudes toward the element body through the cover layer and is physically and electrically connected to the internal conductor. The conductor layer is electrically connected to the internal conductor.
    Type: Application
    Filed: October 4, 2023
    Publication date: April 11, 2024
    Applicant: TDK CORPORATION
    Inventors: Yoji TOZAWA, Masashi SHIMOYASU, Akihiko OIDE, Daiki KATO, Makoto YOSHINO, Takashi ENDO, Takuya KODAMA, Akira AKASAKA, Ken ITOH
  • Patent number: 10802145
    Abstract: A technique for efficiently performing operations for identifying a current position in a method of measuring electromagnetic waves is provided. A measuring device includes a measurement planned position data receiving unit 302, a current position data receiving unit 303, and a GUI controlling unit 306. The measurement planned position data receiving unit 302 receives data of measurement planned positions at each of which electromagnetic waves are measured. The current position data receiving unit 303 receives data of a current position of an electromagnetic wave measuring device. The GUI controlling unit 306 controls displaying of a relationship between the current position of the electromagnetic wave measuring device and the measurement planned position on a display based on data of the measurement planned positions and data of the current position.
    Type: Grant
    Filed: June 26, 2019
    Date of Patent: October 13, 2020
    Assignee: TOPCON CORPORATION
    Inventors: Hiroki Nagashima, Atsushi Shoji, Akira Oide
  • Publication number: 20190317215
    Abstract: A technique for efficiently performing operations for identifying a current position in a method of measuring electromagnetic waves is provided. A measuring device includes a measurement planned position data receiving unit 302, a current position data receiving unit 303, and a GUI controlling unit 306. The measurement planned position data receiving unit 302 receives data of measurement planned positions at each of which electromagnetic waves are measured. The current position data receiving unit 303 receives data of a current position of an electromagnetic wave measuring device. The GUI controlling unit 306 controls displaying of a relationship between the current position of the electromagnetic wave measuring device and the measurement planned position on a display based on data of the measurement planned positions and data of the current position.
    Type: Application
    Filed: June 26, 2019
    Publication date: October 17, 2019
    Applicant: TOPCON CORPORATION
    Inventors: Hiroki NAGASHIMA, Atsushi SHOJI, Akira OIDE
  • Patent number: 10240976
    Abstract: A technique for identifying a measurement planned position for electromagnetic waves in a three-dimensional space in a simple and easy manner is provided. A position of a measuring unit 200 that is carried by an operator 100 is measured by a position measuring device that is configured to measure a position by laser light. A positional relationship between the measured position and the position of a measurement planned position 601 is displayed on a terminal 300 that is carried by the operator 100. This display guides the operator 100, and the operator 100 identifies the measurement planned position 601 and measure illuminance thereat.
    Type: Grant
    Filed: October 3, 2016
    Date of Patent: March 26, 2019
    Assignee: TOPCON CORPORATION
    Inventors: Hiroki Nagashima, Atsushi Shoji, Akira Oide
  • Patent number: 10145735
    Abstract: A technique for effectively detecting abnormal values in electromagnetic wave measurement is provided. An electromagnetic wave measuring device includes a measurement data receiving unit 308, an abnormal value detecting unit 309, and a GUI controlling unit 306. The measurement data receiving unit 308 receives measurement data of electromagnetic waves that are measured at multiple positions. The abnormal value detecting unit 309 detects an abnormal value in the measurement data. The GUI controlling unit 306 displays a position at which the abnormal value is measured, on a display.
    Type: Grant
    Filed: October 3, 2016
    Date of Patent: December 4, 2018
    Assignee: TOPCON CORPORATION
    Inventors: Hiroki Nagashima, Atsushi Shoji, Akira Oide
  • Publication number: 20170097420
    Abstract: A technique for efficiently performing operations for identifying a current position in a method of measuring electromagnetic waves is provided. A measuring device includes a measurement planned position data receiving unit 302, a current position data receiving unit 303, and a GUI controlling unit 306. The measurement planned position data receiving unit 302 receives data of measurement planned positions at each of which electromagnetic waves are measured. The current position data receiving unit 303 receives data of a current position of an electromagnetic wave measuring device. The GUI controlling unit 306 controls displaying of a relationship between the current position of the electromagnetic wave measuring device and the measurement planned position on a display based on data of the measurement planned positions and data of the current position.
    Type: Application
    Filed: September 30, 2016
    Publication date: April 6, 2017
    Applicant: TOPCON CORPORATION
    Inventors: Hiroki NAGASHIMA, Atsushi Shoji, Akira Oide
  • Publication number: 20170097260
    Abstract: A technique for identifying a measurement planned position for electromagnetic waves in a three-dimensional space in a simple and easy manner is provided. A position of a measuring unit 200 that is carried by an operator 100 is measured by a position measuring device that is configured to measure a position by laser light. A positional relationship between the measured position and the position of a measurement planned position 601 is displayed on a terminal 300 that is carried by the operator 100. This display guides the operator 100, and the operator 100 identifies the measurement planned position 601 and measure illuminance thereat.
    Type: Application
    Filed: October 3, 2016
    Publication date: April 6, 2017
    Applicant: TOPCON CORPORATION
    Inventors: Hiroki NAGASHIMA, Atsushi SHOJI, Akira OIDE
  • Publication number: 20170097262
    Abstract: A technique for effectively detecting abnormal values in electromagnetic wave measurement is provided. An electromagnetic wave measuring device includes a measurement data receiving unit 308, an abnormal value detecting unit 309, and a GUI controlling unit 306. The measurement data receiving unit 308 receives measurement data of electromagnetic waves that are measured at multiple positions. The abnormal value detecting unit 309 detects an abnormal value in the measurement data. The GUI controlling unit 306 displays a position at which the abnormal value is measured, on a display.
    Type: Application
    Filed: October 3, 2016
    Publication date: April 6, 2017
    Applicant: TOPCON CORPORATION
    Inventors: Hiroki NAGASHIMA, Atsushi SHOJI, Akira OIDE