Patents by Inventor Akira Sawamori

Akira Sawamori has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • PRINTING APPARATUS
    Publication number: 20090066976
    Abstract: A printing apparatus free from contamination of dust into a coated layer is provided. A printing apparatus of this application includes a first ejecting head and a printing head. The first ejecting head is located on a leading side in a moving direction D of the printing head. Since electric charge is removed from an object to be printed and dust is removed therefrom, by blowing an electric charge-removing gas through the first ejecting head before an ink lands on the object to be printed, dust does not contaminate a coated layer. In addition, since a suction hole is arranged between an ejecting hole and a nozzle zone, a stream of the electric charge-removing gas is not formed in the nozzle zone, and thus a meniscus of nozzles is not disturbed.
    Type: Application
    Filed: October 28, 2008
    Publication date: March 12, 2009
    Applicant: ULVAC, INC.
    Inventors: Hiroto UCHIDA, Susumu Sakio, Hideo Takei, Mitsuru Yahagi, Junpei Yuyama, Akira Sawamori, Shigeru Endoh, Michiharu Sugimoto
  • Panel inspection apparatus
    Patent number: 6972586
    Abstract: A panel inspection apparatus that contacts a PDP electrode, which is arranged on a display panel, with high accuracy. An inspection unit includes a pressurizing lever for pressing an inspection electrode, which is fastened to a fastening block, against the PDP electrode. The pressurizing levers move away from the display panel without altering the position of the fastening block.
    Type: Grant
    Filed: December 14, 2001
    Date of Patent: December 6, 2005
    Assignee: Fujitsu Limited
    Inventor: Akira Sawamori
  • Panel inspection apparatus
    Publication number: 20030027479
    Abstract: A panel inspection apparatus that contacts a PDP electrode, which is arranged on a display panel, with high accuracy. An inspection unit includes a pressurizing lever for pressing an inspection electrode, which is fastened to a fastening block, against the PDP electrode. The pressurizing levers move away from the display panel without altering the position of the fastening block.
    Type: Application
    Filed: December 14, 2001
    Publication date: February 6, 2003
    Applicant: Fujitsu Limited
    Inventor: Akira Sawamori
  • Semiconductor substrate test device and method
    Patent number: 6410354
    Abstract: A semiconductor substrate test device includes a contactor having contact electrodes to be connected with terminals formed on a semiconductor substrate, and a drag supply part supplying a drag to prevent a deformation of the contactor caused by a contact force resulting from contacts of the contact electrodes with the terminals.
    Type: Grant
    Filed: July 18, 2001
    Date of Patent: June 25, 2002
    Assignee: Fujitsu Limited
    Inventors: Shigeyuki Maruyama, Naoyuki Watanabe, Daisuke Koizumi, Akira Sawamori
  • Semiconductor substrate test device and method
    Publication number: 20020031849
    Abstract: A semiconductor substrate test device includes a contactor having contact electrodes to be connected with terminals formed on a semiconductor substrate, and a drag supply part supplying a drag to prevent a deformation of the contactor caused by a contact force resulting from contacts of the contact electrodes with the terminals.
    Type: Application
    Filed: July 18, 2001
    Publication date: March 14, 2002
    Applicant: FUJITSU LIMITED
    Inventors: Shigeyuki Maruyama, Naoyuki Watanabe, Daisuke Koizumi, Akira Sawamori