Abstract: According to one embodiment, a model generation system includes a NCLM processor, a filter part, a model generator, a variable narrow-down part, a determiner, and a soundness calculator. The NCLM processor and the filter part narrows down a first input variable group to a third input variable group selected using NCLM. The model generator generates a model of a relationship between the third input variable group and an output variable. The variable narrow-down part narrows down the first input variable group to one or more of the input variables not used in the generation of the model. When the number of the models has not reached the specified number, the determiner outputting to the NCLM processor the first input variable group narrowed down by the variable narrow-down part. The soundness calculator calculates an overall soundness of the models and calculating a soundness of each of the models.

Abstract: According to one embodiment, a manufacturing control system includes a reference data creating unit, first, second and third data storing units, first, second and third data extracting units. The reference data creating unit creates reference data including a reference time related to a product. The first data storing unit stores data related to parts acceptance inspection and related to assembly of the product. The second data storing unit stores data related to inspection in manufacturing. The third data storing unit stores data related to quality assurance inspection and of acceptance inspection at a customer site. The first data extracting unit extracts data related to latest parts acceptance inspection and related to latest assembly of the product. The second data extracting unit extracts data related to inspection in latest manufacturing. The third data extracting unit extracts data related to latest quality assurance inspection and of latest acceptance inspection.

Abstract: According to one embodiment, a model generation system includes a NCLM processor, a filter part, a model generator, a variable narrow-down part, a determiner, and a soundness calculator. The NCLM processor and the filter part narrows down a first input variable group to a third input variable group selected using NCLM. The model generator generates a model of a relationship between the third input variable group and an output variable. The variable narrow-down part narrows down the first input variable group to one or more of the input variables not used in the generation of the model. When the number of the models has not reached the specified number, the determiner outputting to the NCLM processor the first input variable group narrowed down by the variable narrow-down part. The soundness calculator calculates an overall soundness of the models and calculating a soundness of each of the models.

Abstract: There is provided a manufacturing supporting system for an electronic device including an inspection-data acquiring unit, a fluctuation-by-classification calculating unit, a data-by-factor acquiring unit, and a fluctuation-by-factor calculating unit is provided. The inspection-data acquiring unit acquires an inspection data of a target electronic device. The fluctuation-by-classification calculating unit is configured to calculate, on the basis of the inspection data, by classification including at least any one of positions among lots, among substrates, and in a substrate plane of the electronic device, fluctuation in dimensions of the target electronic device. The data-by-factor acquiring unit acquires an improvement history data of the target electronic device.

Abstract: According to one embodiment, a production support system includes: a production information storage unit; a manufacturing apparatus information storage unit; an inspection/measurement apparatus information storage unit; a planned lot number calculation unit; a first control mode calculation unit. The first control mode calculation unit is configured to calculate an appropriate control mode from the number of products to be subjected to the control of the final quality, a relationship between fluctuation of the final quality and a number of products when performing a predetermined feedback type/feedforward type combined APC, fluctuation of the final quality when performing a feedforward type APC, and fluctuation of the final quality when not performing the feedback type/feedforward type combined APC.

Abstract: There is provided a manufacturing supporting system for an electronic device including an inspection-data acquiring unit, a fluctuation-by-classification calculating unit, a data-by-factor acquiring unit, and a fluctuation-by-factor calculating unit is provided. The inspection-data acquiring unit acquires an inspection data of a target electronic device. The fluctuation-by-classification calculating unit is configured to calculate, on the basis of the inspection data, by classification including at least any one of positions among lots, among substrates, and in a substrate plane of the electronic device, fluctuation in dimensions of the target electronic device. The data-by-factor acquiring unit acquires an improvement history data of the target electronic device.

Abstract: According to one embodiment, a production support system includes: a production information storage unit; a manufacturing apparatus information storage unit; an inspection/measurement apparatus information storage unit; a planned lot number calculation unit; a first control mode calculation unit. The first control mode calculation unit is configured to calculate an appropriate control mode from the number of products to be subjected to the control of the final quality, a relationship between fluctuation of the final quality and a number of products when performing a predetermined feedback type/feedforward type combined APC, fluctuation of the final quality when performing a feedforward type APC, and fluctuation of the final quality when not performing the feedback type/feedforward type combined APC.

Abstract: According to one embodiment, a manufacturing control system includes a reference data creating unit, first, second and third data storing units, first, second and third data extracting units. The reference data creating unit creates reference data including a reference time related to a product. The first data storing unit stores data related to parts acceptance inspection and related to assembly of the product. The second data storing unit stores data related to inspection in manufacturing. The third data storing unit stores data related to quality assurance inspection and of acceptance inspection at a customer site. The first data extracting unit extracts data related to latest parts acceptance inspection and related to latest assembly of the product. The second data extracting unit extracts data related to inspection in latest manufacturing. The third data extracting unit extracts data related to latest quality assurance inspection and of latest acceptance inspection.

Abstract: A product repair support system is configured to support repair of a product rejected in an inspection based on a prescribed inspection standard. The product repair support system includes: repair information storage part; reference information storage part; and repair condition optimization part. The repair information storage part is configured to store a result of the inspection of the repaired product as repair information. The reference information storage part is configured to store reference information related to the product. The repair condition optimization part is configured to determine appropriateness of a repair condition or selection of the repair condition on basis of the repair information and, in response to a determination of being inappropriate, to optimize data of the repair condition or the selection on basis of at least one of the repair information and the reference information.

Abstract: A product repair support system is configured to support repair of a product rejected in an inspection based on a prescribed inspection standard. The product repair support system includes: repair information storage part; reference information storage part; and repair condition optimization part. The repair information storage part is configured to store a result of the inspection of the repaired product as repair information. The reference information storage part is configured to store reference information related to the product. The repair condition optimization part is configured to determine appropriateness of a repair condition or selection of the repair condition on basis of the repair information and, in response to a determination of being inappropriate, to optimize data of the repair condition or the selection on basis of at least one of the repair information and the reference information.

Abstract: A temperature measuring apparatus, comprises a light splitting section for splitting the light radiated from a substrate into plural light components having wavelengths over a predetermined wavelength region, a detection section for detecting the intensities of the light components obtained by the light splitting section, an integrated value calculating section for calculating an integrated value of radiation intensity by cumulatively adding the intensities of the light components detected by the detecting section, and a surface temperature calculating section for calculating the surface temperature of the substrate from the integrated value, on the basis of reference data representing the relation between the temperature and the integrated value.

Abstract: A temperature measuring apparatus, comprises a light splitting section for splitting the light radiated from a substrate into plural light components having wavelengths over a predetermined wavelength region, a detection section for detecting the intensities of the light components obtained by the light splitting section, an integrated value calculating section for calculating an integrated value of radiation intensity by cumulatively adding the intensities of the light components detected by the detecting section, and a surface temperature calculating section for calculating the surface temperature of the substrate from the integrated value, on the basis of reference data representing the relation between the temperature and the integrated value.

Abstract: A temperature measuring apparatus, comprises a light splitting section for splitting the light radiated from a substrate into plural light components having wavelengths over a predetermined wavelength region, a detection section for detecting the intensities of the light components obtained by the light splitting section, an integrated value calculating section for calculating an integrated value of radiation intensity by cumulatively adding the intensities of the light components detected by the detecting section, and a surface temperature calculating section for calculating the surface temperature of the substrate from the integrated value, on the basis of reference data representing the relation between the temperature and the integrated value.

Abstract: A temperature measuring apparatus, comprises a light splitting section for splitting the light radiated from a substrate into plural light components having wavelengths over a predetermined wavelength region, a detection section for detecting the intensities of the light components obtained by the light splitting section, an integrated value calculating section for calculating an integrated value of radiation intensity by cumulatively adding the intensities of the light components detected by the detecting section, and a surface temperature calculating section for calculating the surface temperature of the substrate from the integrated value, on the basis of reference data representing the relation between the temperature and the integrated value.