Patents by Inventor Akira Tsuyuki

Akira Tsuyuki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8248595
    Abstract: A surface inspecting method including irradiating a laser light to a test object to generate an ultrasonic wave, irradiating a second laser light at a position apart by a known distance from a position where the laser light is irradiated and receiving a reflection light thereof, and correcting a generation surface wave of a received ultrasonic wave by using an ultrasonic wave other than the generation surface wave to thereby detect a flaw of the test object. A characterization of the generation surface wave is divided or integrated by the same characterization of the ultrasonic wave other than the generation surface wave included in an output signal to obtain a performance index value and obtain a depth of the flaw by applying the performance index value to a calibration curve in which a corresponding relation between the performance index value and the depth of the flaw is obtained preliminarily.
    Type: Grant
    Filed: September 19, 2011
    Date of Patent: August 21, 2012
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Makoto Ochiai, Takahiro Miura, Hidehiko Kuroda, Fukashi Osakata, Satoshi Yamamoto, Kentaro Tsuchihashi, Masahiro Yoshida, Akira Tsuyuki
  • Publication number: 20120048021
    Abstract: A surface inspecting method for inspecting a flaw of a test object using a surface wave and estimating a depth of the flaw of the test object from an attenuation ratio of a frequency of a generation wave, the surface inspecting method including calculating a power spectrum of generation wave generating the flaw of the test object; integrating the power spectrum of the generation wave passing the flaw of the test object and calculating an integration value thereof; converting the integration value into a flaw depth based on a calibration created beforehand and calculating the flaw depth of the test object; and displaying the calculated flaw depth of the test object.
    Type: Application
    Filed: September 19, 2011
    Publication date: March 1, 2012
    Applicant: KABUSHIKI KAISHA TOSHIBA
    Inventors: Makoto Ochiai, Takahiro Miura, Hidehiko Kuroda, Fukashi Osakata, Satoshi Yamamoto, Kentaro Tsuchihashi, Masahiro Yoshida, Akira Tsuyuki
  • Patent number: 8115936
    Abstract: A laser maintenance apparatus including a laser system which includes an optical system for emitting, in a first irradiation condition, a generation laser beam for generating an ultrasonic wave in a portion of an object on which maintenance is to be performed, and including a laser source configured to generate and detect a detection laser beam which interacts with the ultrasonic wave generated by the laser light beam in the first condition. The laser maintenance apparatus also includes a light transmitting device for transmitting laser light emitted from the laser system, a laser irradiation device for irradiating laser light transmitted by the light transmitting device to the object portion, and a transporting/scanning mechanism for transporting the light transmitting device and the laser irradiation device to a portion near the object portion, and scanning over an arbitrary range at the object portion.
    Type: Grant
    Filed: April 23, 2010
    Date of Patent: February 14, 2012
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Makoto Ochiai, Takahiro Miura, Hidehiko Kuroda, Fukashi Osakata, Kentaro Tsuchihashi, Masahiro Yoshida, Tetsuro Aikawa, Satoshi Okada, Toru Onodera, Akira Tsuyuki
  • Patent number: 8094297
    Abstract: A surface inspecting method for inspecting a flaw of a test object using a surface wave and estimating a depth of the flaw of the test object from an attenuation ratio of a frequency of a generation wave, the surface inspecting method including calculating a power spectrum of generation wave generating the flaw of the test object; integrating the power spectrum of the generation wave passing the flaw of the test object and calculating an integration value thereof; converting the integration value into a flaw depth based on a calibration created beforehand and calculating the flaw depth of the test object; and displaying the calculated flaw depth of the test object.
    Type: Grant
    Filed: April 23, 2010
    Date of Patent: January 10, 2012
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Makoto Ochiai, Takahiro Miura, Hidehiko Kuroda, Fukashi Osakata, Satoshi Yamamoto, Kentaro Tsuchihashi, Masahiro Yoshida, Akira Tsuyuki
  • Publication number: 20100199769
    Abstract: A laser maintenance apparatus including a laser system which includes an optical system for emitting, in a first irradiation condition, a generation laser beam for generating an ultrasonic wave in a portion of an object on which maintenance is to be performed, and including a laser source configured to generate and detect a detection laser beam which interacts with the ultrasonic wave generated by the laser light beam in the first condition. The laser maintenance apparatus also includes a light transmitting device for transmitting laser light emitted from the laser system, a laser irradiation device for irradiating laser light transmitted by the light transmitting device to the object portion, and a transporting/scanning mechanism for transporting the light transmitting device and the laser irradiation device to a portion near the object portion, and scanning over an arbitrary range at the object portion.
    Type: Application
    Filed: April 23, 2010
    Publication date: August 12, 2010
    Applicant: KABUSHIKI KAISHA TOSHIBA
    Inventors: Makoto OCHIAI, Takahiro Miura, Hidehiko Kuroda, Fukashi Osakata, Kentaro Tsuchihashi, Masahiro Yoshida, Tetsuro Aikawa, Satoshi Okada, Toru Onodera, Akira Tsuyuki
  • Publication number: 20100199768
    Abstract: A laser maintenance apparatus including a laser system which includes an optical system for emitting, in a first irradiation condition, a generation laser beam for generating an ultrasonic wave in a portion of an object on which maintenance is to be performed, and including a laser source configured to generate and detect a detection laser beam which interacts with the ultrasonic wave generated by the laser light beam in the first condition. The laser maintenance apparatus also includes a light transmitting device for transmitting laser light emitted from the laser system, a laser irradiation device for irradiating laser light transmitted by the light transmitting device to the object portion, and a transporting/scanning mechanism for transporting the light transmitting device and the laser irradiation device to a portion near the object portion, and scanning over an arbitrary range at the object portion.
    Type: Application
    Filed: April 23, 2010
    Publication date: August 12, 2010
    Applicant: KABUSHIKI KAISHA TOSHIBA
    Inventors: Makoto Ochiai, Takahiro Miura, Hidehiko Kuroda, Fukashi Osakata, Satoshi Yamamoto, Kentaro Tsuchihashi, Masahiro Yoshida, Akira Tsuyuki
  • Publication number: 20070157730
    Abstract: A laser maintenance apparatus is provided with a laser system including a laser light source and an optical system and emitting a laser light, a light transmitting device for generating the laser light emitted from the laser system, and a laser irradiation device for irradiating the laser light generated by the light transmitting device to an object portion. The laser system includes an element for changing an irradiation condition of the laser light.
    Type: Application
    Filed: July 6, 2006
    Publication date: July 12, 2007
    Applicant: KABUSHIKI KAISHA TOSHIBA
    Inventors: Makoto Ochiai, Yoshiaki Ono, Takahiro Miura, Mitsuaki Shimamura, Masaki Yoda, Hidehiko Kuroda, Itaru Chida, Fukashi Osakata, Satoshi Yamamoto, Kentaro Tsuchihashi, Ryoichi Saeki, Masahiro Yoshida, Tetsuro Aikawa, Satoshi Okada, Toru Onodera, Akira Tsuyuki
  • Patent number: 6407392
    Abstract: A radiation detector for detecting radiation comprises a scintillator, a first light guide, a plurality of second light guides and a photo detector. The scintillator generates a scintillated light in response to received radiation. The first light guide, which is connected to the scintillator, has a fluorescence characteristic. The second light guide has a common surface arranged at the opposite side of the surface of the scintillator where radiation is received, and the second light guide has a fluorescence characteristic. The photo detector is connected to the first light guide and the second light guide, and detects a fluorescent light therein.
    Type: Grant
    Filed: April 13, 2000
    Date of Patent: June 18, 2002
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Akira Tsuyuki, Tatsuyuki Maekawa, Akio Sumita, Shunichiro Makino
  • Patent number: 4584066
    Abstract: A continuous electrolytic treatment can be applied to a metal strip by the method which comprises the steps of (1) passing a metal strip through a narrow treating space formed between horizontal upper and lower electrode devices, each having at least one insoluble electrode, whereby the treating space is divided into two gaps by the metal strip; (2) feeding an electrolytic treating liquid to the gaps through slits each formed in the middle portion of the electrode device in such a manner that the slit horizontally extends across the electrode device at right angles to the direction of passage of the metal strip and directed vertically toward the metal strip, whereby each stream of the treating liquid can be divided into two opposite flows in the gap; and (3) applying an electric current between each electrode and the metal strip.
    Type: Grant
    Filed: November 8, 1984
    Date of Patent: April 22, 1986
    Assignee: Nippon Steel Corporation
    Inventors: Narumi Ando, Kito Oda, Takashi Saiki, Yoshiaki Hashimoto, Akira Tsuyuki, Yoshio Kitazawa