Patents by Inventor Akira Uematsu

Akira Uematsu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10241033
    Abstract: A spectroscopic sensor that applies lights in a wavelength band containing plural wavelengths to an object and spectroscopically separates reflected lights or transmitted lights from the object using plural light band-pass filters that transmit the respective specific wavelengths and plural photosensor parts to which corresponding transmitted lights are input based on output results of independent photosensors. The spectroscopic sensor may be integrated in a semiconductor device or module by integration using a semiconductor process and downsizing may be realized.
    Type: Grant
    Filed: June 23, 2016
    Date of Patent: March 26, 2019
    Assignee: SEIKO EPSON CORPORATION
    Inventors: Akira Uematsu, Yoichi Sato, Akira Komatsu, Kunihiko Yano
  • Publication number: 20180070829
    Abstract: An optical sensor module includes a light emitter that radiates light to a target object, a light receiver that receives light from the target object, a deformable substrate on which the light emitter and the light receiver are provided, and a reinforcing plate that reinforces the strength of the substrate.
    Type: Application
    Filed: September 5, 2017
    Publication date: March 15, 2018
    Applicant: SEIKO EPSON CORPORATION
    Inventors: Takanori IWAWAKI, Akira UEMATSU, Atsushi MATSUO
  • Patent number: 9885604
    Abstract: To provide an optical sensor, an electronic apparatus, etc. that suppress reduction of spectroscopic characteristics. The optical sensor includes a light receiving element, an optical filter 140 that transmits a light having a specific wavelength of incident lights with respect to a light receiving region of the light receiving element, and an angle limiting filter 120 that limits an incident angle of the incident light transmitted through the optical filter 140.
    Type: Grant
    Filed: March 6, 2013
    Date of Patent: February 6, 2018
    Assignee: Seiko Epson Corporation
    Inventors: Akira Uematsu, Yoshiyuki Terashima, Yoichi Sato, Atsushi Matsuo
  • Patent number: 9691803
    Abstract: A semiconductor wafer includes a semiconductor substrate, a dielectric multilayer film formed on the semiconductor substrate and serving as an optical filter on a light receiving sensor, and a light detection region formed in the semiconductor substrate, with the Poisson ratio VS, Young's modulus ES, the radius r, and the thickness b of the semiconductor substrate, stress ? in the dielectric multilayer film, and the thickness d of the dielectric multilayer film satisfy a relationship 1.0×10?3?{3×r2×d×(1?VS)×?}/(ES×b2).
    Type: Grant
    Filed: March 6, 2015
    Date of Patent: June 27, 2017
    Assignee: Seiko Epson Corporation
    Inventors: Akira Uematsu, Atsushi Matsuo
  • Patent number: 9683894
    Abstract: A spectroscopic sensor has plural angle limiting filters that limit incident angles of incident lights, plural light band-pass filters that transmit specific wavelengths, and plural photodiodes to which corresponding transmitted lights are input. The spectroscopic sensor is a semiconductor device in which the angle limiting filters, the light band-pass filters, and the photodiodes are integrated, and, assuming that the surface on which impurity regions for the photodiodes are formed is a front surface of a semiconductor substrate, holes for receiving lights are formed in the impurity regions from the rear surface side.
    Type: Grant
    Filed: May 5, 2016
    Date of Patent: June 20, 2017
    Assignee: SEIKO EPSON CORPORATION
    Inventors: Akira Uematsu, Noriyuki Nakamura, Akira Komatsu, Kunihiko Yano
  • Publication number: 20160305868
    Abstract: A spectroscopic sensor that applies lights in a wavelength band containing plural wavelengths to an object and spectroscopically separates reflected lights or transmitted lights from the object using plural light band-pass filters that transmit the respective specific wavelengths and plural photosensor parts to which corresponding transmitted lights are input based on output results of independent photosensors. The spectroscopic sensor may be integrated in a semiconductor device or module by integration using a semiconductor process and downsizing may be realized.
    Type: Application
    Filed: June 23, 2016
    Publication date: October 20, 2016
    Applicant: SEIKO EPSON CORPORATION
    Inventors: Akira UEMATSU, Yoichi SATO, Akira KOMATSU, Kunihiko YANO
  • Publication number: 20160296129
    Abstract: A biological information detection apparatus includes a sensor having a light emitter that radiates light to a subject and a light receiver that receives light from the subject, and a contact part to be in contact with the subject. Supposing that light power from the light emitter passing through a living body and entering the light receiver is PS and a distance from the light receiver to an end portion of the contact part is rN, and light power of disturbance light from outside of the end portion passing through the living body and entering the light receiver is PN(rN) as a function of rN, an attenuation rate ? of the disturbance light is set to satisfy rN?10 mm and ??PS/{PN(rN)×1000}.
    Type: Application
    Filed: April 8, 2016
    Publication date: October 13, 2016
    Inventor: Akira Uematsu
  • Publication number: 20160245700
    Abstract: A spectroscopic sensor has plural angle limiting filters that limit incident angles of incident lights, plural light band-pass filters that transmit specific wavelengths, and plural photodiodes to which corresponding transmitted lights are input. The spectroscopic sensor is a semiconductor device in which the angle limiting filters, the light band-pass filters, and the photodiodes are integrated, and, assuming that the surface on which impurity regions for the photodiodes are formed is a front surface of a semiconductor substrate, holes for receiving lights are formed in the impurity regions from the rear surface side.
    Type: Application
    Filed: May 5, 2016
    Publication date: August 25, 2016
    Applicant: SEIKO EPSON CORPORATION
    Inventors: Akira UEMATSU, Noriyuki NAKAMURA, Akira KOMATSU, Kunihiko YANO
  • Patent number: 9400213
    Abstract: A spectroscopic sensor that applies lights in a wavelength band containing plural wavelengths to an object and spectroscopically separates reflected lights or transmitted lights from the object using plural light band pass filters that transmit the respective specific wavelengths and plural photosensor parts to which corresponding transmitted lights are input based on output results of independent photosensors. The spectroscopic sensor may be integrated in a semiconductor device or module by integration using a semiconductor process and downsizing may be realized.
    Type: Grant
    Filed: July 25, 2014
    Date of Patent: July 26, 2016
    Assignee: SEIKO EPSON CORPORATION
    Inventors: Akira Uematsu, Yoichi Sato, Akira Komatsu, Kunihiko Yano
  • Publication number: 20160198966
    Abstract: A biological information measuring module includes a light emitting unit that emits light, a light receiving unit that receives the light via an object, and a multilayered film optical filter that is provided on the light receiving unit on a side where the light is incident. The multilayered film optical filter is constituted by a laminated body of five or more layers and 120 or less layers.
    Type: Application
    Filed: December 30, 2015
    Publication date: July 14, 2016
    Inventors: Akira Uematsu, Akira Inagaki, Atsushi Matsuo, Hironori Hasei
  • Patent number: 9357956
    Abstract: A spectroscopic sensor has plural angle limiting filters that limit incident angles of incident lights, plural light band-pass filters that transmit specific wavelengths, and plural photodiodes to which corresponding transmitted lights are input. The spectroscopic sensor is a semiconductor device in which the angle limiting filters, the light band-pass filters, and the photodiodes are integrated, and, assuming that the surface on which impurity regions for the photodiodes are formed is a front surface of a semiconductor substrate, holes for receiving lights are formed in the impurity regions from the rear surface side.
    Type: Grant
    Filed: March 2, 2011
    Date of Patent: June 7, 2016
    Assignee: SEIKO EPSON CORPORATION
    Inventors: Akira Uematsu, Noriyuki Nakamura, Akira Komatsu, Kunihiko Yano
  • Publication number: 20150279887
    Abstract: A semiconductor wafer includes a semiconductor substrate, a dielectric multilayer film formed on the semiconductor substrate and serving as an optical filter on a light receiving sensor, and a light detection region formed in the semiconductor substrate, with the Poisson ratio VS, Young's modulus ES, the radius r, and the thickness b of the semiconductor substrate, stress ? in the dielectric multilayer film, and the thickness d of the dielectric multilayer film satisfy a relationship 1.0×10?3?{3×r2×d×(1?VS)×?}/(ES×b2).
    Type: Application
    Filed: March 6, 2015
    Publication date: October 1, 2015
    Inventors: Akira UEMATSU, Atsushi MATSUO
  • Patent number: 8976357
    Abstract: An optical sensor includes a light receiving element (for example a photodiode) and an angle limiting filter that limits the incidence angle of incidence light with respect to the light receiving area of the light receiving element. When a wavelength of the incidence light is denoted by ?, a height of the angle limiting filter is denoted by R, and a width of an opening of the angle limiting filter is denoted by d, “d2/?R?2” is satisfied.
    Type: Grant
    Filed: March 15, 2012
    Date of Patent: March 10, 2015
    Assignee: Seiko Epson Corporation
    Inventors: Akira Uematsu, Yoshiyuki Terashima, Yoichi Sato, Atsushi Matsuo
  • Publication number: 20150036133
    Abstract: To provide an optical sensor, an electronic apparatus, etc. that suppress reduction of spectroscopic characteristics. The optical sensor includes a light receiving element, an optical filter 140 that transmits a light having a specific wavelength of incident lights with respect to a light receiving region of the light receiving element, and an angle limiting filter 120 that limits an incident angle of the incident light transmitted through the optical filter 140.
    Type: Application
    Filed: March 6, 2013
    Publication date: February 5, 2015
    Inventors: Akira Uematsu, Yoshiyuki Terashima, Yoichi Sato, Atsushi Matsuo
  • Publication number: 20140333932
    Abstract: A spectroscopic sensor that applies lights in a wavelength band containing plural wavelengths to an object and spectroscopically separates reflected lights or transmitted lights from the object using plural light band-pass filters that transmit the respective specific wavelengths and plural photosensor parts to which corresponding transmitted lights are input based on output results of independent photosensors. The spectroscopic sensor may be integrated in a semiconductor device or module by integration using a semiconductor process and downsizing may be realized.
    Type: Application
    Filed: July 25, 2014
    Publication date: November 13, 2014
    Inventors: Akira UEMATSU, Yoichi SATO, Akira KOMATSU, Kunihiko YANO
  • Patent number: 8848187
    Abstract: A spectroscopic sensor that applies lights in a wavelength band containing plural wavelengths to an object and spectroscopically separates reflected lights or transmitted lights from the object using plural light band-pass filters that transmit the respective specific wavelengths and plural photosensor parts to which corresponding transmitted lights are input based on output results of independent photosensors. The spectroscopic sensor may be integrated in a semiconductor device or module by integration using a semiconductor process and downsizing may be realized.
    Type: Grant
    Filed: March 2, 2011
    Date of Patent: September 30, 2014
    Assignee: Seiko Epson Corporation
    Inventors: Akira Uematsu, Yoichi Sato, Akira Komatsu, Kunihiko Yano
  • Patent number: 8710606
    Abstract: An optical sensor includes an impurity region for a photodiode and an angle limiting filter limiting the incidence angle of incidence light incident to a light receiving area of the photodiode, which are formed on a semiconductor substrate. The angle limiting filter is formed by at least a first plug corresponding to a first insulating layer and a second plug corresponding to a second insulating layer located in an upper layer of the first insulating layer. Between the first plug and the second plug, there is a gap area having a gap space that is equal to or less than ?/2.
    Type: Grant
    Filed: March 15, 2012
    Date of Patent: April 29, 2014
    Assignee: Seiko Epson Corporation
    Inventors: Akira Uematsu, Yoshiyuki Terashima, Yoichi Sato, Atsushi Matsuo
  • Publication number: 20120235269
    Abstract: An optical sensor includes an impurity region for a photodiode and an angle limiting filter limiting the incidence angle of incidence light incident to a light receiving area of the photodiode, which are formed on a semiconductor substrate. The angle limiting filter is formed by at least a first plug corresponding to a first insulating layer and a second plug corresponding to a second insulating layer located in an upper layer of the first insulating layer. Between the first plug and the second plug, there is a gap area having a gap space that is equal to or less than ?/2.
    Type: Application
    Filed: March 15, 2012
    Publication date: September 20, 2012
    Applicant: SEIKO EPSON CORPORATION
    Inventors: Akira UEMATSU, Yoshiyuki TERASHIMA, Yoichi SATO, Atsushi MATSUO
  • Publication number: 20120236297
    Abstract: An optical sensor includes a light receiving element (for example a photodiode) and an angle limiting filter that limits the incidence angle of incidence light with respect to the light receiving area of the light receiving element. When a wavelength of the incidence light is denoted by ?, a height of the angle limiting filter is denoted by R, and a width of an opening of the angle limiting filter is denoted by d, “d2/?R?2” is satisfied.
    Type: Application
    Filed: March 15, 2012
    Publication date: September 20, 2012
    Applicant: SEIKO EPSON CORPORATION
    Inventors: Akira UEMATSU, Yoshiyuki TERASHIMA, Yoichi SATO, Atsushi MATSUO
  • Publication number: 20110216315
    Abstract: A spectroscopic sensor that applies lights in a wavelength band containing plural wavelengths to an object and spectroscopically separates reflected lights or transmitted lights from the object using plural light band-pass filters that transmit the respective specific wavelengths and plural photosensor parts to which corresponding transmitted lights are input based on output results of independent photosensors. The spectroscopic sensor may be integrated in a semiconductor device or module by integration using a semiconductor process and downsizing may be realized.
    Type: Application
    Filed: March 2, 2011
    Publication date: September 8, 2011
    Applicant: SEIKO EPSON CORPORATION
    Inventors: Akira UEMATSU, Yoichi SATO, Akira KOMATSU, Kunihiko YANO