Patents by Inventor Akira Uematsu
Akira Uematsu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10241033Abstract: A spectroscopic sensor that applies lights in a wavelength band containing plural wavelengths to an object and spectroscopically separates reflected lights or transmitted lights from the object using plural light band-pass filters that transmit the respective specific wavelengths and plural photosensor parts to which corresponding transmitted lights are input based on output results of independent photosensors. The spectroscopic sensor may be integrated in a semiconductor device or module by integration using a semiconductor process and downsizing may be realized.Type: GrantFiled: June 23, 2016Date of Patent: March 26, 2019Assignee: SEIKO EPSON CORPORATIONInventors: Akira Uematsu, Yoichi Sato, Akira Komatsu, Kunihiko Yano
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Publication number: 20180070829Abstract: An optical sensor module includes a light emitter that radiates light to a target object, a light receiver that receives light from the target object, a deformable substrate on which the light emitter and the light receiver are provided, and a reinforcing plate that reinforces the strength of the substrate.Type: ApplicationFiled: September 5, 2017Publication date: March 15, 2018Applicant: SEIKO EPSON CORPORATIONInventors: Takanori IWAWAKI, Akira UEMATSU, Atsushi MATSUO
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Patent number: 9885604Abstract: To provide an optical sensor, an electronic apparatus, etc. that suppress reduction of spectroscopic characteristics. The optical sensor includes a light receiving element, an optical filter 140 that transmits a light having a specific wavelength of incident lights with respect to a light receiving region of the light receiving element, and an angle limiting filter 120 that limits an incident angle of the incident light transmitted through the optical filter 140.Type: GrantFiled: March 6, 2013Date of Patent: February 6, 2018Assignee: Seiko Epson CorporationInventors: Akira Uematsu, Yoshiyuki Terashima, Yoichi Sato, Atsushi Matsuo
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Patent number: 9691803Abstract: A semiconductor wafer includes a semiconductor substrate, a dielectric multilayer film formed on the semiconductor substrate and serving as an optical filter on a light receiving sensor, and a light detection region formed in the semiconductor substrate, with the Poisson ratio VS, Young's modulus ES, the radius r, and the thickness b of the semiconductor substrate, stress ? in the dielectric multilayer film, and the thickness d of the dielectric multilayer film satisfy a relationship 1.0×10?3?{3×r2×d×(1?VS)×?}/(ES×b2).Type: GrantFiled: March 6, 2015Date of Patent: June 27, 2017Assignee: Seiko Epson CorporationInventors: Akira Uematsu, Atsushi Matsuo
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Patent number: 9683894Abstract: A spectroscopic sensor has plural angle limiting filters that limit incident angles of incident lights, plural light band-pass filters that transmit specific wavelengths, and plural photodiodes to which corresponding transmitted lights are input. The spectroscopic sensor is a semiconductor device in which the angle limiting filters, the light band-pass filters, and the photodiodes are integrated, and, assuming that the surface on which impurity regions for the photodiodes are formed is a front surface of a semiconductor substrate, holes for receiving lights are formed in the impurity regions from the rear surface side.Type: GrantFiled: May 5, 2016Date of Patent: June 20, 2017Assignee: SEIKO EPSON CORPORATIONInventors: Akira Uematsu, Noriyuki Nakamura, Akira Komatsu, Kunihiko Yano
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Publication number: 20160305868Abstract: A spectroscopic sensor that applies lights in a wavelength band containing plural wavelengths to an object and spectroscopically separates reflected lights or transmitted lights from the object using plural light band-pass filters that transmit the respective specific wavelengths and plural photosensor parts to which corresponding transmitted lights are input based on output results of independent photosensors. The spectroscopic sensor may be integrated in a semiconductor device or module by integration using a semiconductor process and downsizing may be realized.Type: ApplicationFiled: June 23, 2016Publication date: October 20, 2016Applicant: SEIKO EPSON CORPORATIONInventors: Akira UEMATSU, Yoichi SATO, Akira KOMATSU, Kunihiko YANO
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Publication number: 20160296129Abstract: A biological information detection apparatus includes a sensor having a light emitter that radiates light to a subject and a light receiver that receives light from the subject, and a contact part to be in contact with the subject. Supposing that light power from the light emitter passing through a living body and entering the light receiver is PS and a distance from the light receiver to an end portion of the contact part is rN, and light power of disturbance light from outside of the end portion passing through the living body and entering the light receiver is PN(rN) as a function of rN, an attenuation rate ? of the disturbance light is set to satisfy rN?10 mm and ??PS/{PN(rN)×1000}.Type: ApplicationFiled: April 8, 2016Publication date: October 13, 2016Inventor: Akira Uematsu
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Publication number: 20160245700Abstract: A spectroscopic sensor has plural angle limiting filters that limit incident angles of incident lights, plural light band-pass filters that transmit specific wavelengths, and plural photodiodes to which corresponding transmitted lights are input. The spectroscopic sensor is a semiconductor device in which the angle limiting filters, the light band-pass filters, and the photodiodes are integrated, and, assuming that the surface on which impurity regions for the photodiodes are formed is a front surface of a semiconductor substrate, holes for receiving lights are formed in the impurity regions from the rear surface side.Type: ApplicationFiled: May 5, 2016Publication date: August 25, 2016Applicant: SEIKO EPSON CORPORATIONInventors: Akira UEMATSU, Noriyuki NAKAMURA, Akira KOMATSU, Kunihiko YANO
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Patent number: 9400213Abstract: A spectroscopic sensor that applies lights in a wavelength band containing plural wavelengths to an object and spectroscopically separates reflected lights or transmitted lights from the object using plural light band pass filters that transmit the respective specific wavelengths and plural photosensor parts to which corresponding transmitted lights are input based on output results of independent photosensors. The spectroscopic sensor may be integrated in a semiconductor device or module by integration using a semiconductor process and downsizing may be realized.Type: GrantFiled: July 25, 2014Date of Patent: July 26, 2016Assignee: SEIKO EPSON CORPORATIONInventors: Akira Uematsu, Yoichi Sato, Akira Komatsu, Kunihiko Yano
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Publication number: 20160198966Abstract: A biological information measuring module includes a light emitting unit that emits light, a light receiving unit that receives the light via an object, and a multilayered film optical filter that is provided on the light receiving unit on a side where the light is incident. The multilayered film optical filter is constituted by a laminated body of five or more layers and 120 or less layers.Type: ApplicationFiled: December 30, 2015Publication date: July 14, 2016Inventors: Akira Uematsu, Akira Inagaki, Atsushi Matsuo, Hironori Hasei
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Patent number: 9357956Abstract: A spectroscopic sensor has plural angle limiting filters that limit incident angles of incident lights, plural light band-pass filters that transmit specific wavelengths, and plural photodiodes to which corresponding transmitted lights are input. The spectroscopic sensor is a semiconductor device in which the angle limiting filters, the light band-pass filters, and the photodiodes are integrated, and, assuming that the surface on which impurity regions for the photodiodes are formed is a front surface of a semiconductor substrate, holes for receiving lights are formed in the impurity regions from the rear surface side.Type: GrantFiled: March 2, 2011Date of Patent: June 7, 2016Assignee: SEIKO EPSON CORPORATIONInventors: Akira Uematsu, Noriyuki Nakamura, Akira Komatsu, Kunihiko Yano
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Publication number: 20150279887Abstract: A semiconductor wafer includes a semiconductor substrate, a dielectric multilayer film formed on the semiconductor substrate and serving as an optical filter on a light receiving sensor, and a light detection region formed in the semiconductor substrate, with the Poisson ratio VS, Young's modulus ES, the radius r, and the thickness b of the semiconductor substrate, stress ? in the dielectric multilayer film, and the thickness d of the dielectric multilayer film satisfy a relationship 1.0×10?3?{3×r2×d×(1?VS)×?}/(ES×b2).Type: ApplicationFiled: March 6, 2015Publication date: October 1, 2015Inventors: Akira UEMATSU, Atsushi MATSUO
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Patent number: 8976357Abstract: An optical sensor includes a light receiving element (for example a photodiode) and an angle limiting filter that limits the incidence angle of incidence light with respect to the light receiving area of the light receiving element. When a wavelength of the incidence light is denoted by ?, a height of the angle limiting filter is denoted by R, and a width of an opening of the angle limiting filter is denoted by d, “d2/?R?2” is satisfied.Type: GrantFiled: March 15, 2012Date of Patent: March 10, 2015Assignee: Seiko Epson CorporationInventors: Akira Uematsu, Yoshiyuki Terashima, Yoichi Sato, Atsushi Matsuo
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Publication number: 20150036133Abstract: To provide an optical sensor, an electronic apparatus, etc. that suppress reduction of spectroscopic characteristics. The optical sensor includes a light receiving element, an optical filter 140 that transmits a light having a specific wavelength of incident lights with respect to a light receiving region of the light receiving element, and an angle limiting filter 120 that limits an incident angle of the incident light transmitted through the optical filter 140.Type: ApplicationFiled: March 6, 2013Publication date: February 5, 2015Inventors: Akira Uematsu, Yoshiyuki Terashima, Yoichi Sato, Atsushi Matsuo
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Publication number: 20140333932Abstract: A spectroscopic sensor that applies lights in a wavelength band containing plural wavelengths to an object and spectroscopically separates reflected lights or transmitted lights from the object using plural light band-pass filters that transmit the respective specific wavelengths and plural photosensor parts to which corresponding transmitted lights are input based on output results of independent photosensors. The spectroscopic sensor may be integrated in a semiconductor device or module by integration using a semiconductor process and downsizing may be realized.Type: ApplicationFiled: July 25, 2014Publication date: November 13, 2014Inventors: Akira UEMATSU, Yoichi SATO, Akira KOMATSU, Kunihiko YANO
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Patent number: 8848187Abstract: A spectroscopic sensor that applies lights in a wavelength band containing plural wavelengths to an object and spectroscopically separates reflected lights or transmitted lights from the object using plural light band-pass filters that transmit the respective specific wavelengths and plural photosensor parts to which corresponding transmitted lights are input based on output results of independent photosensors. The spectroscopic sensor may be integrated in a semiconductor device or module by integration using a semiconductor process and downsizing may be realized.Type: GrantFiled: March 2, 2011Date of Patent: September 30, 2014Assignee: Seiko Epson CorporationInventors: Akira Uematsu, Yoichi Sato, Akira Komatsu, Kunihiko Yano
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Patent number: 8710606Abstract: An optical sensor includes an impurity region for a photodiode and an angle limiting filter limiting the incidence angle of incidence light incident to a light receiving area of the photodiode, which are formed on a semiconductor substrate. The angle limiting filter is formed by at least a first plug corresponding to a first insulating layer and a second plug corresponding to a second insulating layer located in an upper layer of the first insulating layer. Between the first plug and the second plug, there is a gap area having a gap space that is equal to or less than ?/2.Type: GrantFiled: March 15, 2012Date of Patent: April 29, 2014Assignee: Seiko Epson CorporationInventors: Akira Uematsu, Yoshiyuki Terashima, Yoichi Sato, Atsushi Matsuo
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Publication number: 20120235269Abstract: An optical sensor includes an impurity region for a photodiode and an angle limiting filter limiting the incidence angle of incidence light incident to a light receiving area of the photodiode, which are formed on a semiconductor substrate. The angle limiting filter is formed by at least a first plug corresponding to a first insulating layer and a second plug corresponding to a second insulating layer located in an upper layer of the first insulating layer. Between the first plug and the second plug, there is a gap area having a gap space that is equal to or less than ?/2.Type: ApplicationFiled: March 15, 2012Publication date: September 20, 2012Applicant: SEIKO EPSON CORPORATIONInventors: Akira UEMATSU, Yoshiyuki TERASHIMA, Yoichi SATO, Atsushi MATSUO
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Publication number: 20120236297Abstract: An optical sensor includes a light receiving element (for example a photodiode) and an angle limiting filter that limits the incidence angle of incidence light with respect to the light receiving area of the light receiving element. When a wavelength of the incidence light is denoted by ?, a height of the angle limiting filter is denoted by R, and a width of an opening of the angle limiting filter is denoted by d, “d2/?R?2” is satisfied.Type: ApplicationFiled: March 15, 2012Publication date: September 20, 2012Applicant: SEIKO EPSON CORPORATIONInventors: Akira UEMATSU, Yoshiyuki TERASHIMA, Yoichi SATO, Atsushi MATSUO
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Publication number: 20110216315Abstract: A spectroscopic sensor that applies lights in a wavelength band containing plural wavelengths to an object and spectroscopically separates reflected lights or transmitted lights from the object using plural light band-pass filters that transmit the respective specific wavelengths and plural photosensor parts to which corresponding transmitted lights are input based on output results of independent photosensors. The spectroscopic sensor may be integrated in a semiconductor device or module by integration using a semiconductor process and downsizing may be realized.Type: ApplicationFiled: March 2, 2011Publication date: September 8, 2011Applicant: SEIKO EPSON CORPORATIONInventors: Akira UEMATSU, Yoichi SATO, Akira KOMATSU, Kunihiko YANO