Abstract: A multimode local probe microscope having a resonator, a first electrode, and a second electrode, an excitation source adapted to generate mechanical resonance in the resonator, a metal tip fastened to the resonator, movement mechanism for imparting relative movement between the local probe and a sample and adapted to bring the end of the tip to within a distance Z lying in the range 0 to 100 nm, and detector for detecting at least one electrical signal representative of friction forces at the terminals of said electrodes. The metal tip is electrically connected to the output second electrode and the microscopy apparatus includes amplifier and filter for amplifying and filtering signals relating to the friction forces and to the tunnelling current in a single electronic circuit, and configured for regulating the distance Z between the end of the tip and the surface of the sample.

Abstract: The present invention relates to a multimode local probe microscope having a resonator (1), a first electrode (9), and a second electrode (8), an excitation source adapted to generate mechanical resonance in the resonator, a metal tip (4) fastened to the resonator, movement means for imparting relative movement between the local probe and a sample and adapted to bring the end of the tip to within a distance Z lying in the range 0 to 100 nm, and detector means for detecting at least one electrical signal representative of friction forces at the terminals of said electrodes (8, 9). According to the invention, said metal tip (4) is electrically connected to said output second electrode (9) and the microscopy apparatus includes amplifier and filter means for amplifying and filtering signals relating to the friction forces and to the tunnelling current in a single electronic circuit, and means for regulating the distance Z between the end of the tip and the surface of the sample.

Abstract: The invention concerns a device for analyzing a particle beam comprising at least one detector including a fiber-optic network, the network of parallel fibers comprising at least one first plane of parallel optical fibers oriented along a first direction X; the detector is designed to produce a light signal when the particle beam passes through the fiber-optic network, an image sensor coupled with the detector so as to output a signal representing characteristics of the light signal. The invention is characterized in that the image sensor comprises a CCD or CMOS sensor, wherein the ends of the fibers of the fiber-optic network are designed to form an image of the light signal in the plane of the CCD or CMOS sensor.

Abstract: The invention concerns a device for analyzing a particle beam comprising at least one detector including a fiber-optic network, the network of parallel fibers comprising at least one first plane of parallel optical fibers oriented along a first direction X; the detector is designed to produce a light signal when the particle beam passes through the fiber-optic network, an image sensor coupled with the detector so as to output a signal representing characteristics of the light signal. The invention is characterized in that the image sensor comprises a CCD or CMOS sensor, wherein the ends of the fibers of the fiber-optic network are designed to form an image of the light signal in the plane of the CCD or CMOS sensor.