Abstract: An integrated circuit (IC) device and a method for communicating test data utilizes test control circuitry, and a test controller. The test controller is coupled with the test control circuitry and decodes packetized test pattern data to identify configuration data for the test controller and test data for the test control circuitry. The test controller further communicates the test data to the test control circuitry, and packetizes resulting data received from the test control circuitry. The resulting data corresponds to errors identified by a test performed based on the test pattern data.

Abstract: An integrated circuit (IC) device and a method for communicating test data utilizes test control circuitry, and a test controller. The test controller is coupled with the test control circuitry and decodes packetized test pattern data to identify configuration data for the test controller and test data for the test control circuitry. The test controller further communicates the test data to the test control circuitry, and packetizes resulting data received from the test control circuitry. The resulting data corresponds to errors identified by a test performed based on the test pattern data.

Abstract: A method and an apparatus for providing a power grid are provided. The apparatus includes a plurality of memory units comprising at least one SoC memory and at least one cache memory. The apparatus includes a first subsystem coupled to the at least one SoC memory associated with a first power domain. The apparatus further includes a second subsystem coupled to the at least one cache memory associated with a second power domain. The second subsystem may be a CPU subsystem. Because the first power domain sources power from a shared power source, the first power domain may operate at a voltage level that is higher than the operation of memory circuits requires. By moving the at least one cache memory from the first power domain to the second power domain, LDO efficiency loss for components in the first power domain may be reduced.

Abstract: A method and an apparatus for providing a power grid are provided. The apparatus includes a plurality of memory units comprising at least one SoC memory and at least one cache memory. The apparatus includes a first subsystem coupled to the at least one SoC memory associated with a first power domain. The apparatus further includes a second subsystem coupled to the at least one cache memory associated with a second power domain. The second subsystem may be a CPU subsystem. Because the first power domain sources power from a shared power source, the first power domain may operate at a voltage level that is higher than the operation of memory circuits requires. By moving the at least one cache memory from the first power domain to the second power domain, LDO efficiency loss for components in the first power domain may be reduced.