Abstract: This system for guiding a person to a destination situated in a predetermined area comprises a fixed guidance station (10) comprising: means (12) for reading a code associated with a destination; wireless communication means (14) having a standby mode and a low electrical power consumption mode for: sending a request including said code associated with a destination and said indication of the position of said fixed station to a route determination device (20); and receiving a response including that route; and means for conveying said route to the person.

Abstract: A method for sending electronic messages via a messaging system that includes receiving, by a group messaging server, a message sent from a remote user's terminal; and transmitting the message by the group messaging server to the terminals of users in a group of predetermined users according to transmission rules predetermined by the user at whose initiative the group of users is created.

Abstract: A method of correcting topographical effects on a microelectronic substrate, the method comprising the steps consisting in depositing a layer of resin on the structure to be planarized having topography in relief surrounded by isolation zones, and subjecting said resin layer in its zones superposed on underlying zones of high topographical density to photolithography by means of a mask possessing a standard mesh without any one-to-one coincidence with the underlying topography.

Abstract: A process and device for adjusting a photolithographic exposure machine, which is used for manufacturing integrated circuits. A guide wafer being furnished with identical test patterns, these test patterns are successively illuminated with white light beam and the coefficient of reflectivity of each test pattern is thus measured. For each location of the corresponding pattern, the law of correspondence of the coefficient of reflectivity as a function of the defocusing parameter for the illuminating beam is thus established. The optimum sharp focus value is determined by criterion of threshold of the value of the coefficient of reflectivity.