Abstract: The invention relates according to a first aspect to an interferometric inversion method for measuring a characteristic variable of a radiation source and/or of a medium through which the radiation passes between the source and an interferometer, the interferometer being capable of generating an interferogram of the radiation by creating a finite number of optical step differences between two rays that have followed the same path between the source and the interferometer, characterized by the implementation of the steps whereby a quantity characterizing an improvement in the inversion is determined, step differences that contribute mainly to optimizing the quantity characterizing an improvement in the inversion are selected without sampling regularity constraints, and a free interferogram is generated using only the selected step differences. According to a second aspect, the invention provides an interferometer for implementing the method according to the first aspect of the invention.

Abstract: According to a first aspect the invention relates to a reconstruction process of a narrow-band signal acquired by an instrument producing irregular sampling, in which two series of samples are acquired at the same sampling period, the two series being offset relative to one another such that the sampling errors are identical or quasi identical over both series. According to a second aspect, the invention relates to an instrument configured to carry out the process according to the first aspect of the invention.

Abstract: A method is provided to calibrate a detection array used for acquiring an image of an interferogram at an instrument. A first interferogram and at least two shifted interferograms are elaborated at the instrument by creating a number of optical path differences, so at least three samples are on a sine wave portion for each optical path difference. A function coinciding with the sine wave portion is determined by interpolation. A calibration coefficient is determined from the function for each optical path difference.

Abstract: According to a first aspect the invention relates to a reconstruction process of a narrow-band signal acquired by an instrument producing irregular sampling, in which two series of samples are acquired at the same sampling period, the two series being offset relative to one another such that the sampling errors are identical or quasi identical over both series. According to a second aspect, the invention relates to an instrument configured to carry out the process according to the first aspect of the invention.

Abstract: The invention relates according to a first aspect to an interferometric inversion method for measuring a characteristic variable of a radiation source and/or of a medium through which the radiation passes between the source and an interferometer, the interferometer being capable of generating an interferogram of the radiation by creating a finite number of optical step differences between two rays that have followed the same path between the source and the interferometer, characterized by the implementation of the steps whereby a quantity characterizing an improvement in the inversion is determined, step differences that contribute mainly to optimizing the quantity characterizing an improvement in the inversion are selected without sampling regularity constraints, and a free interferogram is generated using only the selected step differences. According to a second aspect, the invention provides an interferometer for implementing the method according to the first aspect of the invention.

Abstract: A method is provided to calibrate a detection array used for acquiring an image of an interferogram at an instrument. A first interferogram and at least two shifted interferograms are elaborated at the instrument by creating a number of optical path differences, so at least three samples are on a sine wave portion for each optical path difference. A function coinciding with the sine wave portion is determined by interpolation. A calibration coefficient is determined from the function for each optical path difference.