Patents by Inventor Alan A. Renfrow

Alan A. Renfrow has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for evaluating at least one electrical conducting structure of an electronic component
    Patent number: 7388391
    Abstract: An apparatus and method for evaluating the integrity of each contact pin of an electronic component having multiple contact pins. In one embodiment, the apparatus includes a test device and a measuring instrument. The test device comprises a component fixture configured to hold an electronic component under test and opposing contact plates for establishing electrical communication between the contact pins of the electronic component and the measuring instrument. The test device may include separate linear positioners associated with each opposing contact plate configured to move the contact plates relative to the component fixture and electronic component under test. The measuring instrument measures at least one electrical characteristic of a pin contact. In another embodiment, the apparatus further includes a system controller in communication with the measuring instrument and configured to control functioning of the measuring instrument.
    Type: Grant
    Filed: July 29, 2005
    Date of Patent: June 17, 2008
    Assignee: Micron Technology, Inc.
    Inventor: Alan A. Renfrow
  • Device for evaluating at least one electrical conducting structure of an electronic component
    Patent number: 7362111
    Abstract: An apparatus and method for evaluating the integrity of each contact pin of an electronic component having multiple contact pins. In one embodiment, the apparatus includes a test device and a measuring instrument. The test device comprises a component fixture configured to hold an electronic component under test and opposing contact plates for establishing electrical communication between the contact pins of the electronic component and the measuring instrument. The test device may include separate linear positioners associated with each opposing contact plate configured to move the contact plates relative to the component fixture and electronic component under test. The measuring instrument measures at least one electrical characteristic of a pin contact. In another embodiment, the apparatus further includes a system controller in communication with the measuring instrument and configured to control functioning of the measuring instrument.
    Type: Grant
    Filed: August 18, 2004
    Date of Patent: April 22, 2008
    Assignee: Micron Technology, Inc.
    Inventor: Alan A. Renfrow
  • Method for evaluating contact pin integrity of electronic components having multiple contact pins
    Patent number: 6853207
    Abstract: An apparatus and method for evaluating the integrity of each contact pin of an electronic component having multiple contact pins. In one embodiment, the apparatus includes a test device and a measuring instrument. The test device comprises a component fixture configured to hold an electronic component under test and opposing contact plates for establishing electrical communication between the contact pins of the electronic component and the measuring instrument. The test device may include separate linear positioners associated with each opposing contact plate configured to move the contact plates relative to the component fixture and electronic component under test. The measuring instrument measures at least one electrical characteristic of a pin contact. In another embodiment, the apparatus further includes a system controller in communication with the measuring instrument and configured to control functioning of the measuring instrument.
    Type: Grant
    Filed: November 18, 2002
    Date of Patent: February 8, 2005
    Assignee: Micron Technology, Inc.
    Inventor: Alan A. Renfrow
  • Method for evaluating contact pin integrity of electronic components having multiple contact pins
    Publication number: 20030067296
    Abstract: An apparatus and method for evaluating the integrity of each contact pin of an electronic component having multiple contact pins. In one embodiment, the apparatus includes a test device and a measuring instrument. The test device comprises a component fixture configured to hold an electronic component under test and opposing contact plates for establishing electrical communication between the contact pins of the electronic component and the measuring instrument. The test device may include separate linear positioners associated with each opposing contact plate configured to move the contact plates relative to the component fixture and electronic component under test. The measuring instrument measures at least one electrical characteristic of a pin contact. In another embodiment, the apparatus further includes a system controller in communication with the measuring instrument and configured to control functioning of the measuring instrument.
    Type: Application
    Filed: November 18, 2002
    Publication date: April 10, 2003
    Inventor: Alan A. Renfrow
  • Apparatus for evaluating contact pin integrity of electronic components having multiple contact pins
    Patent number: 6504378
    Abstract: An apparatus and method for evaluating the integrity of each contact pin of an electronic component having multiple contact pins. In one embodiment, the apparatus includes a test device and a measuring instrument. The test device comprises a component fixture configured to hold an electronic component under test and opposing contact plates for establishing electrical communication between the contact pins of the electronic component and the measuring instrument. The test device may include separate linear positioners associated with each opposing contact plate configured to move the contacts plates relative to the component fixture and electronic component under test. The measuring instrument measures at least one electrical characteristic of a pin contact. In another embodiment, the apparatus further includes a system controller in communication with the measuring instrument and configured to control functioning of the measuring instrument.
    Type: Grant
    Filed: November 24, 1999
    Date of Patent: January 7, 2003
    Assignee: Micron Technology, Inc.
    Inventor: Alan A. Renfrow