Patents by Inventor Alan Achor

Alan Achor has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5621312
    Abstract: A method and apparatus for checking the integrity of a device tester used in the manufacture of semiconductor devices. A device tester is used to exercise different aspects of a semiconductor device. The tester is programmed with appropriate control software that fully tests the electrical and functional characteristics of the semiconductor device.
    Type: Grant
    Filed: July 5, 1995
    Date of Patent: April 15, 1997
    Assignee: Altera Corporation
    Inventors: Alan Achor, Eric F. H. Chun, Ernest Allen