Abstract: Systems, methods and apparatus are provided through which a solid-state X-Ray detector is electronically scrubbed and a flat-field X-Ray exposure of the solid-state X-Ray detector is simulated in reference to an adjusted bias of the solid-state X-Ray detector. The simulation yields a gain image of the solid-state X-Ray detector which is in turn suitable for calibrating the solid-state X-Ray detector without projecting an X-Ray beam onto the solid-state X-Ray detector.

Abstract: Certain embodiments provide a method and system for improved x-ray image data acquisition using a digital x-ray detector. The method and system include defining groups of scan lines in a detector, associating data lines in the detector with the groups of scan lines, and reading image data from the groups of scan lines using the associated data lines. The scan lines are connected with a plurality of pixels. A region of interest may be defined in the detector. The pixels obtain image data regarding the region of interest. The image data may be read from at least one scan line in each of the groups of scan lines using the associated data lines. Alternatively, the image data may be read from alternating groups of the scan lines using the associated data lines. Image data may also be binned from adjacent pixels read using a plurality of data lines.

Abstract: A method of maintaining an initial bias of an x-ray detector (12) includes setting the initial bias of the x-ray detector. Operating state of a readout circuit (30) is altered. A photodiode common contact voltage potential is adjusted by a data line drift amount to approximately maintain the initial bias. An x-ray imaging system (10) includes a detector (12) that has multiple pixels, multiple data lines (50), and a common contact (62) that is at a common contact voltage potential. The readout circuit (30) is electrically coupled to the data lines (50) and has a multiple power states. A controller (36) is electrically coupled to the readout circuit (30), detects a change in operating state of the readout circuit (30), and adjusts voltage potential of the common contact (62) in response to the change in operating state.