Patents by Inventor Alan C. Abel

Alan C. Abel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • X-ray grid assembly
    Patent number: 5610967
    Abstract: An x-ray imaging system according to the present invention comprising a stepped scanning-beam x-ray source and a multi-detector array. The output of the multi-detector array is input to an image reconstruction engine which combines the outputs of the multiple detectors over selected steps of the x-ray beam to generate an x-ray image of the object. A collimating element, preferably in the form of a perforated grid containing an array of apertures, interposed between the x-ray source and an object to be x-rayed. A maneuverable positioner incorporating an x-ray sensitive marker allowing the determination of the precise position coordinates of the maneuverable positioner.
    Type: Grant
    Filed: April 10, 1995
    Date of Patent: March 11, 1997
    Assignee: Cardiac Mariners, Incorporated
    Inventors: Jack W. Moorman, Brian Skillicorn, John W. Wilent, deceased, Alan C. Abel
  • High speed wafer handling method
    Patent number: 5176493
    Abstract: The present invention describes a loading system for high speed loading of wafers, such as semiconductor wafers, into vacuum chambers for various applications such as inspection or processing using, for example, a SEM. This system provides low contamination from atmospheric conditions both on loading and unloading the wafers.
    Type: Grant
    Filed: December 11, 1991
    Date of Patent: January 5, 1993
    Assignee: North American Philips Corporation
    Inventors: Guillermo L. Toro-Lira, Alan C. Abel, Alan H. Achilles
  • High speed wafer handler
    Patent number: 5098245
    Abstract: The present invention describes a loading system for high speed loading of wafers, such as semiconductor wafers, into vacuum chambers for various applications such as inspection or processing using, for example, a SEM. This system provides low contamination from atmospheric conditions both on loading and unloading the wafers.
    Type: Grant
    Filed: November 5, 1990
    Date of Patent: March 24, 1992
    Assignee: U.S. Philips Corporation
    Inventors: Guillermo L. Toro-Lira, Alan C. Abel, Alan H. Achilles