Patents by Inventor Alan Cable

Alan Cable has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Automatic probe configuration station and method therefor
    Patent number: 9103876
    Abstract: A probe system for facilitating the inspection of a device under test. System incorporates a storage rack; a probe bar gantry assembly; a probe assembly configured to electrically mate the device under test; and a robot system for picking the probe assembly from the storage rack and deliver the probe assembly to the probe bar gantry. The robot system is also enabled to pick a probe assembly from the probe bar gantry and deliver the probe assembly to the storage rack. The probe assembly includes a clamping assembly for attaching the probe assembly to the probe bar gantry or the storage rack. The probe assembly may include an array of contact pins configured to mate with conductive pads on the device under test when the probe assembly is installed on the probe bar gantry assembly.
    Type: Grant
    Filed: January 7, 2011
    Date of Patent: August 11, 2015
    Assignee: PHOTON DYNAMICS, INC.
    Inventors: Kent Nguyen, Kaushal Gangakhedkar, David Baldwin, Nile Light, Steve Aochi, Yan Wang, Atila Ersahin, Hai Tran, Thomas H. Bailey, Kiran Jitendra, Alan Cable, Dave Smiley, Thomas E. Wishard
  • AUTOMATIC PROBE CONFIGURATION STATION AND METHOD THEREFOR
    Publication number: 20120319713
    Abstract: A probe system for facilitating the inspection of a device under test. System incorporates a storage rack; a probe bar gantry assembly; a probe assembly configured to electrically mate the device under test; and a robot system for picking the probe assembly from the storage rack and deliver the probe assembly to the probe bar gantry. The robot system is also enabled to pick a probe assembly from the probe bar gantry and deliver the probe assembly to the storage rack. The probe assembly includes a clamping assembly for attaching the probe assembly to the probe bar gantry or the storage rack. The probe assembly may include an array of contact pins configured to mate with conductive pads on the device under test when the probe assembly is installed on the probe bar gantry assembly.
    Type: Application
    Filed: January 7, 2011
    Publication date: December 20, 2012
    Applicant: PHOTON DYNAMICS, INC.
    Inventors: Kent Nguyen, Kaushal Gangakhedkar, David Baldwin, Nile Light, Steve Aochi, Yan Wang, Atila Ersahin, Hai Tran, Thomas H. Bailey, Kiran Jitendra, Alan Cable, Dave Smiley, Thomas E. Wishard
  • Method of performing an operation with rheological compound
    Patent number: 8025542
    Abstract: An apparatus includes integrated review, material removal and material deposition functions. The apparatus performs the review, material removal and material deposition operations along the same optical axis. The apparatus includes, in part, a camera, a pair of lenses, and one or more lasers. A first lens is used to focus the camera along the optical axis on a structure formed on the target substrate undergoing review. The first lens is also used to focus the laser beam on the structure to remove a material present thereon if the reviewed structure is identified as requiring material removal. The second lens is used to focus the laser beam on a ribbon to transfer a rheological compound from a recessed well formed in the ribbon to the structure if the reviewed structure is identified as requiring material deposition.
    Type: Grant
    Filed: May 14, 2007
    Date of Patent: September 27, 2011
    Assignees: Photon Dynamics, Inc., The United States of America as represented by the Secretary of the Navy
    Inventors: Steven Edward Birrell, Alan Cable, Joel Visser, Lydia J. Young, Justin Kwak, Joachim Eldring, Thomas H. Bailey, Alberto Pique, Raymond Auyeung
  • Deposition Repair Apparatus And Methods
    Publication number: 20080139075
    Abstract: An apparatus includes integrated review, material removal and material deposition functions. The apparatus performs the review, material removal and material deposition operations along the same optical axis. The apparatus includes, in part, a camera, a pair of lenses, and one or more lasers. A first lens is used to focus the camera along the optical axis on a structure formed on the target substrate undergoing review. The first lens is also used to focus the laser beam on the structure to remove a material present thereon if the reviewed structure is identified as requiring material removal.
    Type: Application
    Filed: May 14, 2007
    Publication date: June 12, 2008
    Applicants: Photon Dynamics, Inc., The United States of America as represented by the Secretary of Navy
    Inventors: Steven Edward Birrell, Alan Cable, Joel Visser, Lydia J. Young, Justin Kwak, Joachim Eldring, Thomas H. Bailey, Alberto Pique, Raymond Auyeung