Patents by Inventor Alan Christopher WEAVER

Alan Christopher WEAVER has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20260072814
    Abstract: In some implementations, a testing system may receive a request for generation, based on a first dataset, of a second dataset, wherein the first dataset is associated with execution of a set of tests on an application, wherein the first dataset includes one or more data elements that satisfy one or more criteria for classification as private information. The testing system may process, using a machine learning model, the first dataset to identify one or more characteristics of the first dataset. The testing system may generate, using the machine learning model, the second dataset based on the first dataset, wherein the second dataset includes artificially generated data elements. The testing system may transmit an output identifying the second dataset.
    Type: Application
    Filed: September 9, 2024
    Publication date: March 12, 2026
    Inventors: Matthew Louis NOWAK, Cory WILLIAMS, Michael Anthony YOUNG, JR., Lindsay HELBING, Alan Christopher WEAVER, Christopher MCDANIEL, Luis DE LUCA, Mohamed SECK
  • Patent number: 12468674
    Abstract: In some implementations, a data quality system may receive an incoming data set for data quality analysis. The data quality system may obtain data quality validation information from one or more data repositories that form a data quality knowledge base. The data quality system may use one or more machine learning models to evaluate whether the incoming data set has one or more anomalies based on the data quality validation information. The data quality system may generate data quality results for the incoming data set based on an output from the one or more machine learning models. The data quality system may update the data quality knowledge base in accordance with the data quality results for the incoming data set.
    Type: Grant
    Filed: November 16, 2023
    Date of Patent: November 11, 2025
    Assignee: Capital One Services, LLC
    Inventors: Matthew Louis Nowak, Catherine Barnes, Maqbool A. Khatri, Kelvin Wong, James C. McGrory, Justin Cheng, Rees Draminski, Alan Christopher Weaver, David Walter Peters, Narender Pashikant, Sean O'Neill
  • Publication number: 20250165443
    Abstract: In some implementations, a data quality system may receive an incoming data set for data quality analysis. The data quality system may obtain data quality validation information from one or more data repositories that form a data quality knowledge base. The data quality system may use one or more machine learning models to evaluate whether the incoming data set has one or more anomalies based on the data quality validation information. The data quality system may generate data quality results for the incoming data set based on an output from the one or more machine learning models. The data quality system may update the data quality knowledge base in accordance with the data quality results for the incoming data set.
    Type: Application
    Filed: November 16, 2023
    Publication date: May 22, 2025
    Inventors: Matthew Louis NOWAK, Catherine BARNES, Maqbool A. KHATRI, Kelvin WONG, James C. McGRORY, Justin CHENG, Rees DRAMINSKI, Alan Christopher WEAVER, David Walter PETERS, Narender PASHIKANT, Sean O'NEILL