Abstract: The dual probe assembly is used with a printed circuit board test apparatus. It includes a first, satellite test probe holder for a first, satellite test probe and a motor for rotating the first test probe holder. It further includes a second, main test probe holder for a second, main test probe and a motor for moving the second test probe holder. The first test probe holder can move without affecting the position of the second test probe, while the second test probe holder is connected to the first test probe holder in such a manner that movement of the second test probe holder moves the first test probe holder, wherein both a selected distance between the two test probes and a selected angular orientation therebetween can be achieved.

Abstract: A semiconductor test instrument (12) provides an AC interrogating signal to an element under test, such as a single pin of an IC. Horizontal and vertical signals are developed and applied to a display (33) which produces an analog signature signal representative of the operating condition of the test element. The horizontal and vertical signals are converted to digital signals by an A-D converter (34) and stored in memory (39). An analog signature is also obtained from the same element as the test element but which is known to be good. The horizontal and vertical components of this signature are also converted into digital signals and stored in memory (42). The test and reference digital signals are then compared and those test digital signals which are different identified. The analog signatures corresponding to both the test and reference digital values are then reconstructed for display and superimposed, for viewing by an operator.

Abstract: The apparatus (10) includes a semiconductor tester (12) which in operation produces an analog signature signal relative to a circuit node of an electronic circuit, such as a pin connection of an integrated circuit. The analog signature signal is the result of horizontal and vertical signals which are also directed to an integrator/A-D converter (44) which produces therefrom a set of four digital signals representing said analog signature. These digital signals are then compared in a computer (50) against reference digital values for the same circuit node of the same electronic circuit which is known to be good. If the digital signals are not within a selected range relative to the reference digital values, the analog signature of the circuit node is displayed for inspection and evaluation by an operator.