Patents by Inventor Alan Daly

Alan Daly has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for phase sensitive detection of eddy current measurements
    Patent number: 8680852
    Abstract: A method of detecting defects using eddy currents is disclosed. The method comprises: exciting eddy currents in a test material using an eddy current probe driven by a drive signal; detecting induced eddy currents in the test material; converting the detected signal into integer values using an analog to digital converter; and adding or subtracting the generated integer values to or from each of two accumulators, or taking no action, so that one accumulator produces a value proportional to one component of the detected signal and the other produces a value proportional to another component of the detected signal and using these values to detect the presence of a defect.
    Type: Grant
    Filed: February 6, 2009
    Date of Patent: March 25, 2014
    Assignee: GE Inspection Technologies Ltd.
    Inventors: Alan Daly, Xiaoyu Qiao, Ian Christopher Mayes, John Hansen
  • METHOD AND APPARATUS FOR PHASE SENSITIVE DETECTION OF EDDY CURRENT MEASUREMENTS
    Publication number: 20100327860
    Abstract: A method of detecting defects using eddy currents is disclosed. The method comprises: exciting eddy currents in a test material using an eddy current probe driven by a drive signal; detecting induced eddy currents in the test material; converting the detected signal into integer values using an analog to digital converter; and adding or subtracting the generated integer values to or from each of two accumulators, or taking no action, so that one accumulator produces a value proportional to one component of the detected signal and the other produces a value proportional to another component of the detected signal and using these values to detect the presence of a defect.
    Type: Application
    Filed: February 6, 2009
    Publication date: December 30, 2010
    Inventors: Alan Daly, Xiaoyu Qiao, Ian Christopher Mayes, John Hansen