Patents by Inventor Alan E. Baker

Alan E. Baker has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6148360
    Abstract: A method and apparatus suspend a program operation in a nonvolatile writeable memory. The nonvolatile writeable memory includes a memory array, a command register and memory array control circuitry. The command register decodes a program suspend command and provides a suspend signal as an output. The memory array control circuitry is coupled to receive the suspend signal from the command register. The memory array control circuitry performs a program operation in which data is written to the memory array. The memory array control circuitry suspends the program operation upon receiving the suspend signal.
    Type: Grant
    Filed: September 20, 1996
    Date of Patent: November 14, 2000
    Assignee: Intel Corporation
    Inventors: David A. Leak, Fasil G. Bekele, Thomas C. Price, Alan E. Baker, Charles W. Brown, Peter K. Hazen, Vishram Prakash Dalvi, Rodney R. Rozman, Christopher John Haid, Jerry Kreifels
  • Patent number: 5937424
    Abstract: A method and apparatus suspend a program operation in a nonvolatile writeable memory. The nonvolatile writeable memory includes a memory array, a command register, and memory array control circuitry. The command register decodes a program suspend command and provides a suspend signal as an output. The memory array control circuitry is coupled to receive the suspend signal from the command register. The memory array control circuitry performs a program operation in which data is written to the memory array. The memory array control circuitry suspends the program operation upon receiving the suspend signal.
    Type: Grant
    Filed: February 27, 1997
    Date of Patent: August 10, 1999
    Assignee: Intel Corporation
    Inventors: David A. Leak, Fasil G. Bekele, Thomas C. Price, Alan E. Baker, Charles W. Brown, Peter K. Hazen, Vishram Prakash Dalvi, Rodney R. Rozman, Christopher John Haid, Jerry Kreifels
  • Patent number: 5267213
    Abstract: A low power bias voltage generation circuitry for content addressable memory cells for a nonvolatile memory is described. The bias circuitry is comprised of a source follower pair and two cascaded high impedance voltage dividers. The source follower pair acts as a positive feedback loop coupling between the two high impedance voltage dividers for relatively quickly charging and settling the output node to a predetermined voltage level. The first high impedance voltage divider can relatively quickly provide an input signal to trigger the small-input-load second high impedance voltage divider. The second high impedance voltage divider comprised of two high impedance diode stacks allows most current drawing from the power supply to drive a relatively large output loading during switching. Both first and second high impedance voltage dividers help keep the DC current of the circuit to a relatively low level which helps to reduce the total power consumption of the circuit.
    Type: Grant
    Filed: March 31, 1992
    Date of Patent: November 30, 1993
    Assignee: Intel Corporation
    Inventors: Chih-Ta Sung, Jerry G. Jex, Alan E. Baker
  • Patent number: 5245570
    Abstract: A non-volatile memory device is described. The memory device includes a global bit line, a first block, and a second block. The first block includes a first memory cell having a drain region, a source region, a floating gate and a control gate. A first word line is coupled to the control gate of the first memory cell. A first local bit line is coupled to the drain region of the first memory cell. A first selecting means couples the first local bit line to the global bit line. The second block includes a second memory cell having a drain region, a source region, a floating gate and a control gate. A second word line is coupled to the control gate of the second memory cell. A second local bit line is coupled to the drain region of the second memory cell. A second selecting means couples the second local bit line to the global bit line.
    Type: Grant
    Filed: December 21, 1990
    Date of Patent: September 14, 1993
    Assignee: Intel Corporation
    Inventors: Albert Fazio, Gregory E. Atwood, Neal R. Mielke, Alan E. Baker
  • Patent number: 4975883
    Abstract: A circuit is disclosed for preventing the erasing and programming of a nonvolatile memory device during power up and power down transitions. A power supply generator incorporating an n-channel device and a w-channel device in a wired-or configuration is coupled to a programming voltage Vpp and to a circuit voltage Vcc, and generates a node voltage Vpwr which is the greater of Vpp-Vtn and Vcc-Vtw. Vtn is the gate threshold voltage of the n-channel device, while Vtw is the gate threshold voltage of the w-channel device. The node voltage Vpwr is coupled to a reference voltage generator which provides a reference voltage, a protecting voltage, and a biasing voltage for a Vcc comparator and a Vpp comparator. The Vcc comparator and the Vpp comparator compare Vref with the output of a Vcc divide-by-two circuit and a Vpp divide-by-five cirucit, respectively.
    Type: Grant
    Filed: March 29, 1990
    Date of Patent: December 4, 1990
    Assignee: Intel Corporation
    Inventors: Alan E. Baker, Richard J. Durante, Owen W. Jungroth