Patents by Inventor Alan F. Rice

Alan F. Rice has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Probe microscope setup method
    Patent number: 8205487
    Abstract: A scanning probe microscope and method of operation for monitoring and assessing proper tracking between the tip and sample, as well as automating at least some aspects of AFM setup previously done manually. Preferably, local slopes corresponding to the acquired data are compared to determine a tracking metric that is self-normalizing.
    Type: Grant
    Filed: April 7, 2009
    Date of Patent: June 26, 2012
    Assignee: Bruker Nano, Inc.
    Inventors: Alan F. Rice, Lin Huang
  • Probe Microscope Setup Method
    Publication number: 20090260113
    Abstract: A scanning probe microscope and method of operation for monitoring and assessing proper tracking between the tip and sample, as well as automating at least some aspects of AFM setup previously done manually. Preferably, local slopes corresponding to the acquired data are compared to determine a tracking metric that is self-normalizing.
    Type: Application
    Filed: April 7, 2009
    Publication date: October 15, 2009
    Inventors: Alan F. Rice, Lin Huang
  • Tracking qualification and self-optimizing probe microscope and method
    Patent number: 7513142
    Abstract: A scanning probe microscope and method of operation for monitoring and assessing proper tracking between the tip and sample, as well as automating at least some aspects of AFM setup previously done manually. Preferably, local slopes corresponding to the acquired data are compared to determine a tracking metric that is self-normalizing.
    Type: Grant
    Filed: August 12, 2005
    Date of Patent: April 7, 2009
    Assignee: Veeco Instruments Inc.
    Inventors: Alan F. Rice, Lin Huang