Abstract: In one aspect, a method for performing clocked operations in a device includes performing, in a device, first and second operations responsive to a clock having a primary frequency f. The device is capable of performing the operations within X and Y cycles of the clock, respectively. X cycles of the clock correspond to a time interval T1 with the clock operating at the frequency f, and, accordingly, the device is capable of performing X/Y instances of the second operation within time interval T1 with the clock operating at the frequency f. During the time interval T1 at least one extra cycle of the clock is generated to reduce performance time for the first operation. An affect of the at least one extra cycle is masked with respect to the second operation, so that instances of the second operation during the interval T1 remain no greater in number than X/Y.

Abstract: In one aspect of the invention, a method for testing includes interposing a tester between first and second logic. The first logic and second logic have respective first and second output drivers. The tester operates in test cycles to detect dynamic contention responsive to a signal asserted by the first driver during one of the test cycles and a signal asserted by the second driver during an immediately succeeding one of the test cycles. Static contention is detected responsive to a signal asserted by the first driver during one of the test cycles and a signal asserted by the second driver during the same one of the test cycles.

Abstract: In one aspect, a method for performing clocked operations in a device includes performing, in a device, first and second operations responsive to a clock having a primary frequency f. The device is capable of performing the operations within X and Y cycles of the clock, respectively. X cycles of the clock correspond to a time interval T1 with the clock operating at the frequency f, and, accordingly, the device is capable of performing X/Y instances of the second operation within time interval T1 with the clock operating at the frequency f. During the time interval T1 at least one extra cycle of the clock is generated to reduce performance time for the first operation. An affect of the at least one extra cycle is masked with respect to the second operation, so that instances of the second operation during the interval T1 remain no greater in number than X/Y.

Abstract: In one aspect of the invention, a method for testing includes interposing a tester between first and second logic. The first logic and second logic have respective first and second output drivers. The tester operates in test cycles to detect dynamic contention responsive to a signal asserted by the first driver during one of the test cycles and a signal asserted by the second driver during an immediately succeeding one of the test cycles. Static contention is detected responsive to a signal asserted by the first driver during one of the test cycles and a signal asserted by the second driver during the same one of the test cycles.