Abstract: A cache system includes a processor chip to receive a processing unit address. The cache system also includes a comparator to compare the processing unit address to an address information stored in an allocated tag subset of a tag memory of the processor chip to determine whether the processing unit address matches the address information. The cache system further includes a mapping device to map the portion of the address information to an external memory data, temporarily stored in an allocated data memory subset and a corresponding data memory set of a data memory in the processor. Furthermore, the cache system includes a stacking loop to prioritize the allocated tag subset and a corresponding tag set when the processing unit address matches the address information.

Abstract: A cache system includes a processor chip to receive a processing unit address. The cache system also includes a comparator to compare the processing unit address to an address information stored in in an allocated tag subset of a tag memory of the processor chip to determine whether the processing unit address matches the address information. The cache system further includes a mapping device to map the portion of the address information to an external memory data, temporarily stored in an allocated data memory subset and a corresponding data memory set of a data memory in the processor. Furthermore, the cache system includes a stacking loop to prioritize the allocated tag subset and a corresponding tag set when the processing unit address matches the address information.

Abstract: Methods and system of reducing power consumption of system on chip based on analog-to-digital control circuitry are disclosed. In one embodiment, a method includes converting an analog signal of external device coupled to the system on chip to a digital signal using an analog-to-digital converter (ADC) of the system on chip with a processor of the system on chip in a sleep mode or power down mode. The method further includes waking up the processor of the system on ship to perform an exception event based on a comparison of the digital signal with a threshold value associated with the external device.

Abstract: Systems, devices and methods for clearing memory using a built-in self-test circuit are disclosed. In one embodiment, a device for clearing memory using a built-in self-test circuit comprises a clear memory module added to a memory built-in self-test (MBIST) controller generating a signal for clearing one or more memory modules and one or more wrapper circuits with each wrapper circuit comprising an address generator module forwarding a range of addresses associated with the clearing the memory modules, a write data generator module forwarding a pattern of logical zeroes to the range of addresses and a finite state machine controlling writing the pattern to the range of addresses based on the signal for the clearing the memory modules.