Abstract: The present invention relates to methods for analysis of carbon dioxide (CO2) absorption into a liquid enhanced by the presence of a compound that accelerates the absorption reaction resulting in a more rapid pH change in the liquid than in the absence of the compound. The present invention also relates to catalyst solutions comprising a carbonic anhydrase and a buffer effective in enhancing CO2 absorption. The present invention further relates to improved compositions and methods for carbon dioxide (CO2) absorption using a zinc additive.

Abstract: An integrated circuit device includes a first plurality of non-volatile memory locations such as fuses that supply programmed values corresponding to initially selected device features such as voltage, frequency, clock speed, and cache parameters. The device is programmed with a lock value in a second plurality of non-volatile memory locations. That lock value may be a randomly generated number that is unique for each device. After initial programming of the device, access to the device is prevented by appropriately programming access control. In order to unlock the device and modify device features, an unlock key value is supplied to the device. If the unlock key value correctly corresponds to the lock value, the device features can be modified. In that way device features can be modified, but security is maintained to prevent unauthorized modification to device features.

Abstract: The sensor includes an optical waveguide defined in a light-transmitting medium. The waveguide includes a sensing portion and an non-sensing portion. The light-transmitting medium included in the sensing portion has defects that provide the light-transmitting medium with a deep band gap level between a valence band of the light-transmitting medium and a conduction band of the light-transmitting medium. The deep band gap level is configured such that the waveguide guiding light signals through the light-transmitting medium in the sensing portion causes free carriers to be generated in the light-transmitting medium. A detector is configured to detect the free carriers in the sensing region of the waveguide.

Abstract: The sensor includes an optical waveguide defined in a light-transmitting medium. The waveguide includes a sensing portion and an non-sensing portion. The light-transmitting medium included in the sensing portion has defects that provide the light-transmitting medium with a deep band gap level between a valence band of the light-transmitting medium and a conduction band of the light-transmitting medium. The deep band gap level is configured such that the waveguide guiding light signals through the light-transmitting medium in the sensing portion causes free carriers to be generated in the light-transmitting medium. A detector is configured to detect the free carriers in the sensing region of the waveguide.

Abstract: The sensor includes an optical waveguide defined in a light-transmitting medium. The waveguide includes a sensing portion and an non-sensing portion. The light-transmitting medium included in the sensing portion has defects that provide the light-transmitting medium with a deep band gap level between a valence band of the light-transmitting medium and a conduction band of the light-transmitting medium. The deep band gap level is configured such that the waveguide guiding light signals through the light-transmitting medium in the sensing portion causes free carriers to be generated in the light-transmitting medium. A detector is configured to detect the free carriers in the sensing region of the waveguide.

Abstract: The sensor includes an optical waveguide defined in a light-transmitting medium. The waveguide includes a sensing portion and an non-sensing portion. The light-transmitting medium included in the sensing portion has defects that provide the light-transmitting medium with a deep band gap level between a valence band of the light-transmitting medium and a conduction band of the light-transmitting medium. The deep band gap level is configured such that the waveguide guiding light signals through the light-transmitting medium in the sensing portion causes free carriers to be generated in the light-transmitting medium. A detector is configured to detect the free carriers in the sensing region of the waveguide.

Abstract: An integrated circuit device includes a first plurality of non-volatile memory locations such as fuses that supply programmed values corresponding to initially selected device features such as voltage, frequency, clock speed, and cache parameters. The device is programmed with a lock value in a second plurality of non-volatile memory locations. That lock value may be a randomly generated number that is unique for each device. After initial programming of the device, access to the device is prevented by appropriately programming access control. In order to unlock the device and modify device features, an unlock key value is supplied to the device. If the unlock key value correctly corresponds to the lock value, the device features can be modified. In that way device features can be modified, but security is maintained to prevent unauthorized modification to device features.

Abstract: An integrated optical waveguide (1) having an in-line light sensor (2) integrally formed therewith for tapping off a small proportion of the signal transmitted along the waveguide (1). A first part (1A) of the waveguide leads to a photodiode portion (2) and a second part (1B) of the waveguide leads away from the photodiode portion (2), the photodiode portion (2) comprising one or more regions (14) of light absorbing material within the waveguide (1) arranged to absorb a minor proportion of light transmitted along the waveguide (1) and thereby to generate free charge carriers within the waveguide (1). Deep band gap levels (21) are introduced into photodiode portion by ion implantation to enable it to absorb selected wavelengths. The free charge carriers are detected by a p-i-n diode formed across the waveguide (1). Wavelength selective reflectors (11, 12) may be provided either side of the photodiode portion (2) so light passes repeatedly through the photodiode portion (2).

Abstract: A semiconductor device includes at least one component which is vulnerable to damage during scan testing for a particular input data configuration, and supports a safe mode in which this particular input data configuration is disabled. The semiconductor device also includes a port for receiving an input scan vector for scan testing, and an authorization unit connected to said port. The authorization unit maintains the device in safe mode if an input scan vector does not satisfy at least one predetermined criterion. In one particular implementation, the authorization unit generates a digital signature for the input scan vector, which is then compared to a signature portion included within the input scan vector itself. Scan testing is enabled providing that this comparison finds a match.

Abstract: An integrated optical device comprising at least one optical waveguide (1) formed on a substrate, the waveguide (1) being of elongate form with an optical axis extending along its length, at least one interceptor trench (3, 4, 5 or 6) being provided in the substrate adjacent at least one side of the waveguide (1), the trench (3, 4, 5,6) presenting a surface to intercept stray light travelling in the substrate in a direction substantially parallel to the optical axis of the waveguide (1), said surface being angled with respect to the direction of travel of said stray light so as to alter the direction of travel of the stray light intercepted thereby.

Abstract: A semiconductor device includes at least one component which is vulnerable to damage during scan testing for a particular input data configuration, and supports a safe mode in which this particular input data configuration is disabled. The semiconductor device also includes a port for receiving an input scan vector for scan testing, and an authorisation unit connected to said port. The authorisation unit maintains the device in safe mode if an input scan vector does not satisfy at least one predetermined criterion. In one particular implementation, the authorisation unit generates a digital signature for the input scan vector, which is then compared to a signature portion included within the input scan vector itself. Scan testing is enabled providing that this comparison finds a match.

Abstract: A semiconductor device can be subjected to scan testing by using an input scan test vector. This input scan test vector is processed by the device to produce an output scan test vector, which can be used for diagnostic purposes with respect to the device. There are certain locations in this output scan test vector that may be indeterminate in value, even for a correctly functioning device. In other words, it is not possible to predict beforehand what values the output scan test vector will have at these locations. Therefore, an output mask vector is provided that identifies those locations in the output scan test vector that are indeterminate. This mask vector is then combined with the output scan test vector using a logical operation to produce a determinate masked output scan test vector. For example, if all the indeterminate locations are flagged by a 1 in the mask vector, then using OR for the logical operation will ensure that the output for these locations is always a 1.

Abstract: An isolation device that can be used for providing optical and electrical isolation between areas of an integrated chip. The isolation device includes three doped elongate regions which form diodes which can be connected in series. The isolation device can be used in optical devices or optical attenuators.

Abstract: A device 102 incorporating a sensor 106 for sensing a temperature of the device and/or a local heater 106 for the provision of heat to a minority area within the device, wherein the sensor and/or the local heater comprises at least one semiconductor element 302,804 which is fabricated as part of the device.

Abstract: An isolation device that can be used for providing optical and electrical isolation between areas of an integrated chip. The isolation device includes three doped elongate regions which form diodes which can be connected in series. The isolation device can be used in optical devices or optical attenuators.

Abstract: An optical phase modulator comprises a semiconductor rib wave guide having P and N doped regions forming a PN junction along the path of the rib with terminals for applying a reverse bias to the junction to extend a carrier depletion zone to alter the refractive index, the PN junction is offset from the central axis of the rib but on application of the reverse bias the depletion zone extends over a central axis of the waveguide.