Abstract: A system that includes a plurality of IoT devices associated with ground equipment items, a plurality of gateways to receive data from the IoT devices, and an application that receives the data from the IoT devices, is used to manage mobile ground equipment within an airport and track flight data to match available, working equipment with turnarounds and/or flights based on flight data requirements, predicted turn time, gate position, required special needs equipment, and working/failed equipment.

Abstract: A cleaning film designed to remove foreign matter and particulates from working surfaces of cleaning wafers used in semiconductor processes. These processes include wafer sort test for cleaning of probe card pins and FEOL tooling for cleaning during wafer handling equipment and wafer chucks. The debris collected on the cleaning wafer working surfaces is removed by the particle removal film allowing the debris and foreign matter to be discarded. The use of the cleaning film allows the operator to refresh the cleaning wafer without use of an outside vendor and eliminates wet washing and the use of solvents in the cleaning process.

Abstract: A vehicle having left and right lower rear brake lights and a Center High-Mounted Stop Light (CHMSL) flashes the CHMSL when the brakes are initially applied. The lower brake lights do not automatically flash. After a predetermined duration, the CHMSL remains continuously illuminated until the brakes are removed. In an effort to improve on the design referenced by U.S. Pat. No. 5,345,218, a micro-controller circuit is configured to be activated when brakes are applied. Once activated, internal embedded micro code produce a predetermined number cycles of an oscillating output signal that is responsible for causing the CHMSL to flash. After the numbers of cycles have been completed, the embedded micro code forces the output signal to remain in a state that causes the CHMSL to stay illuminated until the brakes have been removed.

Abstract: An erosion resistant surface using a dense array of elastic whiskers to slow the velocity of erosive particles before impacting with the surface. A carbon nanotube forest is grown on the surface to provide the erosion resistance. In the alternative, a carbon nanotube forest is grown on a flexible substrate that is bonded to the surface.

Abstract: An erosion resistant surface using a dense array of elastic whiskers to slow the velocity of erosive particles before impacting with the surface. A carbon nanotube forest is grown on the surface to provide the erosion resistance. In the alternative, a carbon nanotube forest is grown on a flexible substrate that is bonded to the surface.

Abstract: An abrasion resistant coating and method are provided wherein the abrasion resistant coating contains both ductile and brittle components having a bimodal size distribution. The abrasion resistant coating is initially applied to a substrate in contact with an abrasive environment. The abrasive resistant coating having a bimodal size distribution results in the minimized exposure of the ductile components of the wear surface to the abrasive environment such that the life of the abrasive resistant coating is extended.

Abstract: An abrasion resistant coating and method are provided wherein the abrasion resistant coating contains both ductile and brittle components. The abrasion resistant coating is initially applied to a substrate and is further conditioned such that the wear which occurs at the interface of the abrasion resistant coating and the abrasive environment is ductile wear, as opposed to brittle wear, such that the wear which occurs at said interface is minimized and the service life of the abrasion resistant coating extended.

Abstract: A cleaning device cleaning method is provided wherein the surface of the cleaning device is cleaned of accumulated debris and particulates.

Abstract: The cleaning device may clean probe elements. The probe elements may be the probe elements of a probe card testing apparatus for testing semiconductor wafers or semiconductor dies on a semiconductor wafer or the probe elements of a handling/testing apparatus for testing the leads of a packaged integrated circuit. During the cleaning of the probe elements, the probe card or the handler/tester is cleaned during the normal operation of the testing machine without removing the probe card from the prober. The cleaning device may be placed within the prober or tester/handler similar to a wafer containing semiconductor dies to be tested so that the probe elements of the testing machine contact the cleaning medium periodically to remove debris and/or reshape the tips of the probe elements.

Abstract: A substrate protection system and method are described that, in a preferred embodiment, protect the integrated circuit dies on a semiconductor wafer from damage. A layer of material may be formed over the substrate and the devices formed thereon.

Abstract: A method and system for generating a set of scan diagnostic patterns for diagnosing fails in scan chains. The method including: (a) selecting a set of latches; (b) selecting a pattern from a set of test patterns; (c) determining the number of lateral insertions of the selected pattern; (d) determining a number of new lateral insertions that the selected pattern would add to the set of scan diagnostic pattern and adding the selected pattern and a corresponding new insertion count to a count list; (e) repeating steps (b) through (d) until all patterns of the set of test patterns have been selected; (f) selecting a pattern from the count list; (g) adding the pattern selected from the count list to the set of scan diagnostic patterns; and (h) repeating steps (b) through (g) until a there are a predetermined number of patterns in the set of scan diagnostic patterns.

Abstract: Device and method to assist in rolling on and off, over parts of the body, tubular garments or coverings or garments or coverings that include tubular elements, for example socks, gloves, pants and condoms, where the device is an integral part of the tubular garment and not separate from it.

Abstract: The cleaning device may clean probe elements. The probe elements may be the probe elements of a probe card testing apparatus for testing semiconductor wafers or semiconductor dies on a semiconductor wafer or the probe elements of a handling/testing apparatus for testing the leads of a packaged integrated circuit. During the cleaning of the probe elements, the probe card or the handler/tester is cleaned during the normal operation of the testing machine without removing the probe card from the prober. The cleaning device has a working surface with a particular characteristic (a matte finish or a conductive material) so that a prober is capable of automatically determining the location of the working surface of the cleaning device and therefore operate in an automatic cleaning mode.

Abstract: A method and apparatus for synthesizing an approximation to a sine wave comprising generating a number of pulse width modulated signals, each having a predetermine duty cycle and being the same frequency as each other, from a clock signal. The generated pulse width modulated signals are then combined to produce an approximation to a sine wave having the same frequency as the pulse width modulated signals. The clock signal is provided by an oscillator arranged to produce clock signals over a continuous range of frequencies so that approximations to a sine wave can be produced over a continuous range of frequencies.

Abstract: A method and apparatus for determining the speed of sound in a gas. An acoustic transmitter is arranged to apply an acoustic signal to the interior of a resonator and an acoustic receiver is arranged to detect the amplitude of the acoustic signal in the interior of the resonator. A control means determines the speed of sound of gas within the resonator from the frequency of a detected non-radial resonant mode.

Abstract: Determininig a frequency at which a resonator resonates comprising: driving an acoustic transmitter for applying an acoustic signal to the interior of a resonator by scanning through a first range of frequencies in substantially equidistant steps of a first size; detecting a signal from an acoustic receiver arranged to detect the amplitude of an acoustic signal within the resonator produced by driving the acoustic transmitter over the first range of frequencies; determining a frequency at which a maximum occurs in the detected signal for the first range of frequencies; driving the acoustic transmitter by scanning through a second range of frequencies containing the determined frequency from the first range of frequencies, the second range being smaller than the first range, and scanning through the second range of frequencies in substantially equidistant steps of a second size which is smaller than the steps of the first size; detecting a signal from the acoustic receiver produced by driving the acoustic tran