Abstract: An instrument for carrying out mechanical strain tests on metallic samples with the addition of an electrical system for varying the temperature with strain, the instrument including opposing arms and associated equipment for holding a sample and varying the mechanical strain on the sample through a plurality of cycles of increasing and decreasing strain within predetermined limits, circuitry for producing an output signal representative of the strain during the tests, apparatus including a set point and a coil about the sample for providing a controlled temperature in the sample, and circuitry interconnected between the strain output signal and set point for varying the temperature of the sample linearly with strain during the tests.

Abstract: An analytical instrument and particularly a time-of-flight-mass spectrometer for processing a large number of analog signals irregularly spaced over a spectrum, with programmable masking of portions of the spectrum where signals are unlikely in order to reduce memory requirements and/or with a signal capturing assembly having a plurality of signal capturing devices fewer in number than the analog signals for use in repeated cycles within the data processing time period.