Abstract: A bidirectional repeater and data multiplexer for serial data has A-side 12C port devices A1-A4 coupled to comparators 302-308 and pull-downs to ground 316-322. Comparator outputs are coupled responsive to select lines S1-S4 of N:1 Select 310 to terminal A1 of bidirectional control 210 to control pull-down to non-zero low voltage Vp 206 at B-side device B. An inverting comparator 208 coupled to terminal B1 of bidirectional control 210 responds to input threshold voltage Vt less than low voltage Vp, to prevent data lockup due to data flowback to devices A1-A4. Output data from comparator 208 is coupled responsive to select lines S1-S4 of 1:N Select 312 to control pull-downs 316-322. This selectively repeats routing of device A1-A4 data to device B. Data from device B is selectively routed to pull-downs of devices A1-A4.

Abstract: A bidirectional repeater and data multiplexer for serial data has A-side 12C port devices A1-A4 coupled to comparators 302-308 and pull-downs to ground 316-322. Comparator outputs are coupled responsive to select lines S1-S4 of N:1 Select 310 to terminal A1 of bidirectional control 210 to control pull-down to non-zero low voltage Vp 206 at B-side device B. An inverting comparator 208 coupled to terminal B1 of bidirectional control 210 responds to input threshold voltage Vt less than low voltage Vp, to prevent data lockup due to data flowback to devices A1-A4. Output data from comparator 208 is coupled responsive to select lines S1-S4 of 1:N Select 312 to control pull-downs 316-322. This selectively repeats routing of device A1-A4 data to device B. Data from device B is selectively routed to pull-downs of devices A1-A4.

Abstract: A bidirectional repeater and data multiplexer for serial data has A-side I2C port devices A1-A4 coupled to comparators 302-308 and pulldowns to ground 316-322. Comparator outputs are coupled responsive to select lines S1-S4 of N:l Select 310 to terminal A1 of bidirectional control 210 to control pulldown to non-zero low voltage Vp 206 at B-side device B. An inverting comparator 208 coupled to terminal B1 of bidirectional control 210 responds to input threshold voltage Vt less than low voltage Vp, to prevent data lockup due to data flowback to devices A1-A4. Output data from comparator 208 is coupled responsive to select lines S1-S4 of 1:N Select 312 to control pulldowns 316-322. This selectively repeats routing of device A1-A4 data to device B. Data from device B is selectively routed to pulldowns of devices A1-A4.

Abstract: A bidirectional repeater and data multiplexer for serial data comprises a plurality of comparators 302, 304, 306, 308 coupled to the respective input/output (I/O) terminals of a plurality of serial data transceiver devices A1, A2, A3, A4 such as used in I2C communication. Also coupled to these I/O terminals is a plurality of active pulldowns 316, 318, 320, 322. The outputs of the comparators are coupled to N:1 Select 310 logic wherein the desired data input is selected responsive to select lines S1, S2, S3, S4. The output of the N:1 select logic is coupled to a bidirectional control circuit 210, which couples the selected data to the control terminal of an active pulldown 206 having its source coupled to a pulldown voltage Vp low enough to represent a logic “low” level but non-zero, and a drain connected to the I/O terminal of a device B.

Abstract: A differential receiver circuit includes: a current source 20; a differential pair 22 and 24 coupled to the current source 20; a first transistor 26 coupled to a first branch of the differential pair 22 and 24; a second transistor 28 coupled to a second branch of the differential pair 22 and 24, the first and second transistors 26 and 28 are cross coupled; a third transistor 54 coupled in series with the first transistor 26; a fourth transistor 56 coupled in series with the second transistor 28; a fifth transistor 30 coupled in parallel with the first and third transistors 26 and 54; and a sixth transistor 32 coupled in parallel with the second and fourth transistors 28 and 56.

Abstract: A differential receiver circuit includes: a current source 20; a differential pair 22 and 24 coupled to the current source 20; a first transistor 26 coupled to a first branch of the differential pair 22 and 24; a second transistor 28 coupled to a second branch of the differential pair 22 and 24, the first and second transistors 26 and 28 are cross coupled; a third transistor 54 coupled in series with the first transistor 26; a fourth transistor 56 coupled in series with the second transistor 28; a fifth transistor 30 coupled in parallel with the first and third transistors 26 and 54; and a sixth transistor 32 coupled in parallel with the second and fourth transistors 28 and 56.

Abstract: A process variance detection technique for detecting fabrication processing variances in integrated circuit components, such as resistors or MOSFETs, is based on the decreased sensitivity to processing variations exhibited by components that are up-sized relative to similar components with nominal dimensions. Detection circuitry includes detection components with both nominal and up-sized dimensions, and variance detection involves detecting the differences in operational response of the nominal and up-sized detection components. For bipolar logic, resistors are fabricated with up-sized widths, while for MOS logic, MOSFETs are fabricated with up-sized gate lengths.

Abstract: A circuit that translates one voltage level to another voltage level. In one embodiment of the invention, an input buffer translates a 3 volt level to a 5 volt level. Such an input buffer facilitates communications between 3 volt I/Os and 5 volt core logic and memories. And while the input buffer is described as being ideal for communications between 3 volt I/Os and 5 volt core logic and memories of a gate array, the translator circuitry of the invention can be used in a wide variety of electronic devices where a chip operating on 5 volts must interface with a 3 volt system.

Abstract: There is disclosed a temperature compensated reference voltage generation circuit and method adapted to maintain a specific temperature/voltage relationship. The circuit is designed such that it can easily be adapted to switch between different voltage temperature requirements simply by adjusting the parameters of a few circuit elements. The circuit relies upon three different current generators, each performing a different function.

Abstract: There is disclosed a circuit and method for converting on/off logic signals from one medium to on/off signals useful in a different medium. The circuit is particularly adapted to translate from negative voltage levels to positive voltage levels. The circuit includes voltage control levels for precisely controlling voltage as a function of temperature, all while only using positive voltage levels on the conversion circuit.

Abstract: A macrocell array is provided wherein a plurality of cells, each having a plurality of semiconductor devices interconnected for providing logic functions, are selectively interconnected to one another and to input/output pads by a plurality of horizontal and vertical routing channels in one or more metallization layers. An on-chip clock generator is provided within one of the cells and comprises a gate means responsive to an input signal and providing a delayed signal. An output means is coupled to the gate means and is responsive to the input signal and the delayed signal for generating a clock pulse. The gate means includes two or more serially connected sets of differentially connected transistors wherein the time between the input signal and the delayed signal is the summation of the propagation delays of the two or more serially connected sets of differentially connected transistors. External override signals allow for control of the clock pulse regardless of the state of the input signal.

Abstract: A macrocell array is provided wherein a plurality of cells, each having a plurality of semiconductor devices interconnected for providing logic functions, are selectively interconnected to one another and to input/output pads by a plurality of horizontal and vertical routing channels in one or more metallization layers. An on-chip diagnostic circuit is provided for diagnosing a plurality of serially connected latches, or flip-flops, in real time. A first logic gate has inputs adapted to receive a data signal and a data enable signal for inputting data into the latches. A second logic gate has inputs adapted to receive a shift-data-in signal and a shift enable signal for shifting the data through the latches. A third logic gate has inputs adapted to receive a hold signal and an output of a first of the plurality of serially connected latches for capturing the states in each of the latches at a given time.