Patents by Inventor Alan Slopey

Alan Slopey has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Probe repair methods
    Patent number: 7437813
    Abstract: A method and apparatus for repairing a probe on a probe card is provided. A plurality of beams is formed on a beam panel. The plurality of beams includes a replacement beam. After identifying a damaged beam on the probe card, the damaged beam is removed from the probe card. The beam panel is aligned with the probe card. After the beam panel is aligned, the aligned beam panel is temporarily affixed to the probe card. After the beam panel is temporarily affixed to the probe card, the replacement beam is affixed at a location previously occupied by the damaged beam. After the replacement beam is affixed at the location, the beam panel is removed from the probe card.
    Type: Grant
    Filed: February 7, 2007
    Date of Patent: October 21, 2008
    Assignee: SV Probe Pte Ltd.
    Inventors: Bahadir Tunaboylu, John McGlory, Horst Clauberg, Bruce Griffing, Robert E. Werner, Edward T. Laurent, Edward L. Malantonio, Alan Slopey, Paul Bereznycky
  • Stacked tip cantilever electrical connector
    Patent number: 7279917
    Abstract: A probe for a probe card assembly is provided. The probe includes a beam element having a tip end portion. The probe also includes a tip structure on the tip end portion of the beam element. The tip structure includes a plurality of conductive bumps arranged in a stacked configuration.
    Type: Grant
    Filed: August 25, 2005
    Date of Patent: October 9, 2007
    Assignee: SV Probe Pte Ltd.
    Inventors: Scott R. Williams, John M. Shuhart, Alan Slopey, Guy B. Frick
  • Probe repair methods
    Publication number: 20070200577
    Abstract: A method and apparatus for repairing a probe on a probe card is provided. A plurality of beams is formed on a beam panel. The plurality of beams includes a replacement beam. After identifying a damaged beam on the probe card, the damaged beam is removed from the probe card. The beam panel is aligned with the probe card. After the beam panel is aligned, the aligned beam panel is temporarily affixed to the probe card. After the beam panel is temporarily affixed to the probe card, the replacement beam is affixed at a location previously occupied by the damaged beam. After the replacement beam is affixed at the location, the beam panel is removed from the probe card.
    Type: Application
    Filed: February 7, 2007
    Publication date: August 30, 2007
    Inventors: Bahadir Tunaboylu, John McGlory, Horst Clauberg, Bruce Griffing, Robert Werner, Edward Laurent, Edward Malantonio, Alan Slopey, Paul Berenycky
  • Stacked tip cantilever electrical connector
    Publication number: 20060043995
    Abstract: A probe for a probe card assembly is provided. The probe includes a beam element having a tip end portion. The probe also includes a tip structure on the tip end portion of the beam element. The tip structure includes a plurality of conductive bumps arranged in a stacked configuration.
    Type: Application
    Filed: August 25, 2005
    Publication date: March 2, 2006
    Inventors: Scott Williams, John Shuhart, Alan Slopey, Guy Frick