Abstract: A system implement simulation system's capable of facilitating integrated circuit designers to perform a complete integrated circuit testing with respect to a target peripheral device and demonstrate various functions and their sequence of operations without having to build the target device physically. The system allows, reliability and quality of an integrated circuit design to be increased, and production and testing costs can be reduced. The simulation system is capable of performing functional checking at any time, and can be utilized in demonstrating product functions to customer.

Abstract: The present method for accessing a data in a common accessing medium into and out of which the data are parallelly written and read respectively includes steps of: a) determining a reference data length according to a data-writing rate at which the data is written into the common accessing medium, a data-reading rate at which the data is read out of the common accessing medium, and a data length of the data; b) writing the data into the common accessing medium at the data-writing rate; c) reading the data out of the common accessing medium at the data-reading rate when a data length of the written data in the step b) is up to the reference data length; and d) keeping on respectively writing into and reading out of the common accessing medium the data until the data is completely written into and completely read out of the common accessing medium. By this method, an optimal accessing efficiency can be obtained.