Patents by Inventor Albert Dekker
Albert Dekker has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240038396Abstract: The present disclosure relates to methods and systems for determining the risk of a complication of pregnancy occurring. Certain embodiments of the present disclosure provide a method of determining the risk of a complication of pregnancy occurring in a subject, the pregnancy arising in the subject from a conception from a maternal donor and a paternal donor.Type: ApplicationFiled: April 19, 2023Publication date: February 1, 2024Inventors: Claire Trelford Roberts, Shalem Yiner-Lee Leemaqz, Gustaaf Albert Dekker
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Patent number: 11698389Abstract: This document relates to a probe for use in a scanning probe microscopy device. The probe comprises a cantilever and a probe tip being located at a first end section of the cantilever. The cantilever is configured for bending in a Z-direction perpendicular to a surface of a substrate in use. The cantilever comprises a neck section and a paddle section, and the probe tip is located on the paddle section. The neck section has a width and height in cross section thereof, comprises a base part having a rectangular cross section. The cantilever at least across a length of the neck section comprises a ridge extending in a direction away from the base part. The base part and the ridge together define the width and height of the neck section, and have dimensions such that a vertical bending stiffness of the cantilever for bending in the Z-direction matches a lateral stiffness of the cantilever with respect to forces acting on the probe tip in a direction transverse to the Z-direction.Type: GrantFiled: October 31, 2018Date of Patent: July 11, 2023Assignee: Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNOInventors: Roelof Willem Herfst, Albert Dekker, Anton Adriaan Bijnagte, Jan Jacobus Benjamin Biemond
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Publication number: 20230160924Abstract: This document relates to a probe for use in a scanning probe microscopy device. The probe comprises a cantilever and a probe tip being located at a first end section of the cantilever. The cantilever is configured for bending in a Z-direction perpendicular to a surface of a substrate in use. The cantilever comprises a neck section and a paddle section, and the probe tip is located on the paddle section. The neck section has a width and height in cross section thereof, comprises a base part having a rectangular cross section. The cantilever at least across a length of the neck section comprises a ridge extending in a direction away from the base part. The base part and the ridge together define the width and height of the neck section, and have dimensions such that a vertical bending stiffness of the cantilever for bending in the Z-direction matches a lateral stiffness of the cantilever with respect to forces acting on the probe tip in a direction transverse to the Z-direction.Type: ApplicationFiled: October 31, 2018Publication date: May 25, 2023Inventors: Roelof Willem HERFST, Albert DEKKER, Anton Adriaan BIJNAGTE, Jan Jacobus Benjamin BIEMOND
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Patent number: 11650224Abstract: The invention is directed at a method of positioning a carrier on a flat surface using an positioning member, wherein the carrier comprises an upper part and a base which are connected to each other such as to be arranged remote from each other, wherein the positioning member is arranged between the base and the upper part such that the base is located at an opposite side of the positioning member with respect to the upper part of the carrier, the upper part resting on the positioning member prior to placing of the carrier onto the flat surface, wherein the upper part comprises three engagement elements, and wherein the positioning member comprises a support surface for receiving the three engagement elements of the upper part, said support surface including a plurality of sockets forming a kinematic mount for said three engagement elements, wherein the base comprises three landing elements, each landing element being associated with a respective one of the three engagement elements, and the method comprisingType: GrantFiled: November 14, 2019Date of Patent: May 16, 2023Assignee: Nederlandse Organisatie voor toegepast- natuurwetenschappelijk onderzoek TNOInventors: Hamed Sadeghian Marnani, Jasper Winters, William Edward Crowcombe, Teunis Cornelis van den Dool, Geerten Frans Ijsbrand Kramer, Albert Dekker
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Patent number: 11458581Abstract: A high-precision linear actuator is described that includes a first straight-guide mechanism that guides movements of an actuator element and a working device relative to an actuator housing. A pressing mechanism that, in a pressing-contact condition, presses the actuator frame and the actuator housing with a predetermined force against one another. A second straight-guide mechanism that guides movements of the actuator housing relative to the actuator frame between the pressing-contact condition and released-contact conditions in which the pressing mechanism presses the actuator frame and the actuator housing towards one another. The high-precision linear actuator provides a safety mechanism automatically reinstates negative consequences of unforeseen collisions in the working environment. In addition the high-precision linear actuator allows for a compact and light-weight design of the actuator element and the working device, which improves operational speed and effectivity of the linear actuator.Type: GrantFiled: October 18, 2017Date of Patent: October 4, 2022Assignee: Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNOInventors: Albert Dekker, Anton Adriaan Bijnagte
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Scanning probe microscopy system for and method of mapping nanostructures on the surface of a sample
Patent number: 11320454Abstract: The present document relates to a scanning probe microscopy system and method for mapping nanostructures on the surface of a sample. The system comprises a sample support structure, a scan head including a probe comprising a cantilever and a probe tip, and an actuator for scanning the probe tip relative to the sample surface. The system also includes an optical source, and a sensor unit for obtaining a sensor signal indicative of a position of the probe tip. The sensor unit includes a partially reflecting element for reflecting a reference fraction and for transmitting a sensing fraction of the optical signal. It further includes directional optics for directing the sensing fraction as an optical beam towards the probe tip, and for receiving a reflected fraction thereof to provide a sensed signal. Moreover the sensor includes an interferometer for providing one or more output signals, and signal conveyance optics for conveying the sensed signal and the reference signal to the interferometer.Type: GrantFiled: May 14, 2018Date of Patent: May 3, 2022Assignee: Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNOInventors: Hamed Sadeghian Marnani, Aukje Arianne Annette Kastelijn, Peter Martijn Toet, Geerten Frans Ijsbrand Kramer, Evert Nieuwkoop, Albert Dekker, Martinus Cornelius Johannes Maria van Riel, Rik Kruidhof -
Publication number: 20210278436Abstract: The present document relates to a probe chip for use in a scanning probe microscopy device for holding a probe mounted thereon. The probe chip includes a carrier element having a probe bearing side which is configured for bearing the probe to be extending therefrom as an integral or mounted part thereof. The carrier element further comprises a mounting side configured for mounting the probe chip onto a scan head of the scanning probe microscopy device, wherein the mounting side extends in a longitudinal and lateral direction of the carrier element to be substantially flat.Type: ApplicationFiled: July 5, 2019Publication date: September 9, 2021Inventors: Roelof Willem HERFST, Anton Adriaan BIJNAGTE, Albert DEKKER, Jan Jacobus Benjamin BIEMOND
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Publication number: 20210265061Abstract: The present disclosure relates to methods and systems for determining the risk of a complication of pregnancy occurring. Certain embodiments of the present disclosure provide a method of determining the risk of a complication of pregnancy occurring in a subject, the pregnancy arising in the subject from a conception from a maternal donor and a paternal donor.Type: ApplicationFiled: December 2, 2020Publication date: August 26, 2021Inventors: Claire Trelford Roberts, Shalem Yiner-Lee Leemaqz, Gustaaf Albert Dekker
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Patent number: 11035879Abstract: The present document relates to a Z-position motion stage for use in a scanning probe microscopy system. The stage comprises a support element for mounting the z-position motion stage on a scan head, and at least one first actuator mounted on the support element for enabling motion of a probe of the scanning probe microscopy system. The probe is connected to or attachable to the z-position motion stage. The support element and the at least one first actuator are shaped and mounted such as to form a rotation symmetric element which is rotation symmetric around a notional common longitudinal axis. The document further relates to a scan head, a method of manufacturing a z-position motion stage, and a Z-position motion stage obtained with such a method.Type: GrantFiled: October 2, 2018Date of Patent: June 15, 2021Assignee: Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNOInventors: Albert Dekker, Martinus Cornelius Johannes Maria van Riel, Aukje Arianne Annette Kastelijin
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Publication number: 20200233013Abstract: The present document relates to a Z-position motion stage for use in a scanning probe microscopy system. The stage comprises a support element for mounting the z-position motion stage on a scan head, and at least one first actuator mounted on the support element for enabling motion of a probe of the scanning probe microscopy system. The probe is connected to or attachable to the z-position motion stage. The support element and the at least one first actuator are shaped and mounted such as to form a rotation symmetric element which is rotation symmetric around a notional common longitudinal axis. The document further relates to a scan head, a method of manufacturing a z-position motion stage, and a Z-position motion stage obtained with such a method.Type: ApplicationFiled: October 2, 2018Publication date: July 23, 2020Inventors: Albert Dekker, Martinus Cornelius Johannes Maria van Riel, Aukje Arianne Annette Kastelijn
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Publication number: 20200189057Abstract: A high-precision linear actuator (1) comprises: a first straight-guide mechanism (11A, 11B, 11C), which guides movements of an actuator element (4) and a working device (6) relative to an actuator housing (3); a pressing mechanism (7, 8, 9), which in a pressing-contact condition presses the actuator frame (2) and the actuator housing (3) with a predetermined force against one another; and a second straight-guide mechanism (12A, 12B), which guides movements of the actuator housing relative to the actuator frame between said pressing-contact condition and released-contact conditions in which the pressing mechanism presses the actuator frame and the actuator housing towards one another. The invention provides a safety mechanism which automatically reinstates negative consequences of unforeseen collisions in the working environment.Type: ApplicationFiled: October 18, 2017Publication date: June 18, 2020Inventors: Albert Dekker, Anton Adriaan Bijnagte
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Patent number: 10634698Abstract: A high-precision scanning device (1) comprises a first linear scanner (11) for providing scanning movements along a first linear scanning axis (21). The first linear scanner comprises a first base frame (31), a first scanning frame (41), two mutually parallel first piezoelectric bending plates (51A, 51B), and two first hinge joints (61A, 61B) having two first hinge axes (71A, 71B), respectively. Under influence of synchronic piezoelectric operation of the two first piezoelectric bending plates, the first scanning frame is being synchronically moved relative to the first base frame along said first linear scanning axis. The scanning device is compact, especially nearby the working areas where the precise scanning movements have to be performed, so that the device can be operable in very tiny working areas.Type: GrantFiled: November 17, 2017Date of Patent: April 28, 2020Assignee: Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNOInventors: Albert Dekker, Anton Adriaan Bijnagte
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SCANNING PROBE MICROSCOPY SYSTEM FOR AND METHOD OF MAPPING NANOSTRUCTURES ON THE SURFACE OF A SAMPLE
Publication number: 20200116754Abstract: The present document relates to a scanning probe microscopy system and method for mapping nanostructures on the surface of a sample. The system comprises a sample support structure, a scan head including a probe comprising a cantilever and a probe tip, and an actuator for scanning the probe tip relative to the sample surface. The system also includes an optical source, and a sensor unit for obtaining a sensor signal indicative of a position of the probe tip. The sensor unit includes a partially reflecting element for reflecting a reference fraction and for transmitting a sensing fraction of the optical signal. It further includes directional optics for directing the sensing fraction as an optical beam towards the probe tip, and for receiving a reflected fraction thereof to provide a sensed signal. Moreover the sensor includes an interferometer for providing one or more output signals, and signal conveyance optics for conveying the sensed signal and the reference signal to the interferometer.Type: ApplicationFiled: May 14, 2018Publication date: April 16, 2020Inventors: Hamed Sadeghian Marnani, Aukje Arianne Annette Kastelijn, Peter Martijn Toet, Geerten Frans Ijsbrand Kramer, Evert Nieuwkoop, Albert Dekker, Martinus Cornelius Johannes Maria van Riel, Rik Kruidhof -
Publication number: 20200081034Abstract: The invention is directed at a method of positioning a carrier on a flat surface using an positioning member, wherein the carrier comprises an upper part and a base which are connected to each other such as to be arranged remote from each other, wherein the positioning member is arranged between the base and the upper part such that the base is located at an opposite side of the positioning member with respect to the upper part of the carrier, the upper part resting on the positioning member prior to placing of the carrier onto the flat surface, wherein the upper part comprises three engagement elements, and wherein the positioning member comprises a support surface for receiving the three engagement elements of the upper part, said support surface including a plurality of sockets forming a kinematic mount for said three engagement elements, wherein the base comprises three landing elements, each landing element being associated with a respective one of the three engagement elements, and the method comprisingType: ApplicationFiled: November 14, 2019Publication date: March 12, 2020Applicant: Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNOInventors: Hamed Sadeghian Marnani, Jasper Winters, William Edward Crowcombe, Teunis Cornelis van den Dool, Geerten Frans Ijsbrand Kramer, Albert Dekker
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Patent number: 10495667Abstract: The invention is directed at a method of positioning a carrier on a flat surface using an positioning member, wherein the carrier comprises an upper part and a base which are connected to each other such as to be arranged remote from each other, wherein the positioning member is arranged between the base and the upper part such that the base is located at an opposite side of the positioning member with respect to the upper part of the carrier, the upper part resting on the positioning member prior to placing of the carrier onto the flat surface, wherein the upper part comprises three engagement elements, and wherein the positioning member comprises a support surface for receiving the three engagement elements of the upper part, said support surface including a plurality of sockets forming a kinematic mount for said three engagement elements, wherein the base comprises three landing elements, each landing element being associated with a respective one of the three engagement elements, and the method comprisingType: GrantFiled: July 3, 2015Date of Patent: December 3, 2019Assignee: Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNOInventors: Hamed Sadeghian Marnani, Jasper Winters, William Edward Crowcombe, Teunis Cornelis van den Dool, Geerten Frans Ijsbrand Kramer, Albert Dekker
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Publication number: 20190353679Abstract: A high-precision scanning device (1) comprises a first linear scanner (11) for providing scanning movements along a first linear scanning axis (21). The first linear scanner comprises a first base frame (31), a first scanning frame (41), two mutually parallel first piezoelectric bending plates (51A, 51B), and two first hinge joints (61A, 61B) having two first hinge axes (71A, 71B), respectively. Under influence of synchronic piezoelectric operation of the two first piezoelectric bending plates, the first scanning frame is being synchronically moved relative to the first base frame along said first linear scanning axis. The scanning device is compact, especially nearby the working areas where the precise scanning movements have to be performed, so that the device can be operable in very tiny working areas.Type: ApplicationFiled: November 17, 2017Publication date: November 21, 2019Applicant: Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNOInventors: Albert DEKKER, Anton Adriaan BIJNAGTE
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Publication number: 20190317127Abstract: A scanning probe microscopy system (1) comprises a probe (2), a scanning head (11) having a first probe holder (21), a probe exchange manipulator (12) having a second probe holder (22), a force generating system (31, 32), and a force control system (41, 42) for controlling the force generating system to provide a resultant force (72) acting on the probe. Said resultant force comprises gas pressure force components and/or electrostatic force components. During probe-demounting or probe-mounting the probe is moving (52) from the first probe holder (21) towards the second probe holder (22), or vice versa, respectively, while neither the first probe holder nor the second probe holder is contacting the probe. Said movement of the probe is driven by said resultant force. The invention allows for automatically mounting and demounting of probes with high speed and with high accuracy.Type: ApplicationFiled: November 28, 2017Publication date: October 17, 2019Applicant: Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNOInventors: Hamed SADEGHIAN MARNANI, Anton Adriaan BIJNAGTE, Albert DEKKER
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Publication number: 20180114600Abstract: The present disclosure relates to methods and systems for determining the risk of a complication of pregnancy occurring. Certain embodiments of the present disclosure provide a method of determining the risk of a complication of pregnancy occurring in a subject, the pregnancy arising in the subject from a conception from a maternal donor and a paternal donor.Type: ApplicationFiled: March 23, 2016Publication date: April 26, 2018Inventors: Claire Trelford Roberts, Shalem Yiner-Lee Leemaqz, Gustaaf Albert Dekker
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Publication number: 20170146564Abstract: The invention is directed at a method of positioning a carrier on a flat surface using an positioning member, wherein the carrier comprises an upper part and a base which are connected to each other such as to be arranged remote from each other, wherein the positioning member is arranged between the base and the upper part such that the base is located at an opposite side of the positioning member with respect to the upper part of the carrier, the upper part resting on the positioning member prior to placing of the carrier onto the flat surface, wherein the upper part comprises three engagement elements, and wherein the positioning member comprises a support surface for receiving the three engagement elements of the upper part, said support surface including a plurality of sockets forming a kinematic mount for said three engagement elements, wherein the base comprises three landing elements, each landing element being associated with a respective one of the three engagement elements, and the method comprisingType: ApplicationFiled: July 3, 2015Publication date: May 25, 2017Inventors: Hamed Sadeghian Marnani, Jasper Winters, William Edward Crowcombe, Teunis Cornelis van den Dool, Geerten Frans Ijsbrand Kramer, Albert Dekker
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Patent number: 7135923Abstract: A differential amplifier for amplifying an input differential signal having two components (In+, In?) substantially in anti-phase to each other and generating an output differential signal having two differential components (Out+, Out?). The amplifier comprises a pair of inverters coupled to a pair of adders the inverters receiving the input differential signal. The amplifier is characterized in that it further comprises a pair of controllable buffers for receiving the input differential signal and outputting a signal to the pair of adders. A bias of the said pair of buffers is cross-controlled by the input differential signal for controlling an amplification of said pair of controllable buffers.Type: GrantFiled: March 20, 2003Date of Patent: November 14, 2006Assignee: Koninklijke Philips Electronics N.V.Inventors: Jan Cornelus Albert Dekkers, Dominicus Martinus Wilhelmus Leenaerts