Abstract: An endoscope illumination system for use with an endoscope having both a microscopic mode and a macroscopic mode. The illumination system includes a source of broadband light and includes a source of laser illumination, which may be infrared illumination. A circuit determines the mode of operation of the endoscope. This circuit activates the source of broadband light and deactivates the source of laser illumination when the endoscope is in its macroscopic mode. Conversely, the circuit deactivates the source of broadband light and activates the source of laser illumination when the endoscope is in the microscopic mode.

Abstract: A method of evaluating defects in a surface as compared with a reference surface by providing a surface for defect evaluation, illuminating and projecting a pattern of lines on the surface having a periodic configuration with features having a separation period, providing a camera for recording a reflected image of the pattern of lines projected and reflected from the surface, and evaluating and quantifying the image by calculating a slope of a defect observed by the camera using a specified relationship. The distance between the illuminated pattern and the surface are used to calculate the defect slope and a defect depth value is generated using a specified relationship dependent on length of a defect area visually recognizable from the reflected image and the calculated defect slope.

Abstract: An apparatus and method for providing high resolution non-contact absolute contour measurements of an object with moire interferometry. The invention utilizes a projection moire system in which the entire projection system is translated to perform a field shift. The field shift produces a phase shift that is proportional to the height of the object. A coarse three dimensional map of the surface is first obtained from the phase shift. This is combined with high resolution relative measurements of the phase to obtain an absolute Z map of the surface. The invention does not suffer from the 2.pi. ambiguity problem and is suitable for prismatic discontinuous structures. In addition, the present invention is applicable to industrial environments and requires a relatively inexpensive optical system. Further, the field shifting technique is applicable to fast parallel process computers thereby allowing for fast absolute contour generation of prismatic parts.

Abstract: A non-contact dimensional gage for turned parts which permits in-process gaging for closed loop machine operations. The gage locates three points on the circumference of the cylindrical workpiece which are formed by shadowing the part onto three photo detectors receiving collimated light along three angled optical axes. The photo detectors evaluate the extent of shadowing of the light beams caused by the presence of the workpiece. The output of the photo detectors is a function of the degree of shadowing and accordingly provides a measure of the location of the tangent points of the workpiece. When the workpiece is positioned within the working range of the device such that three of the light beams are partially blocked by the workpiece, the three circumferentially spaced points can be located and consequently the part's diameter can be determined.