Abstract: A diaphragm test probe for establishing a detachable electrical connection to the pads on an integrated circuit chip. Leads are electrically connected to a plurality of conductive contacts which are affixed to a flexible diaphragm. The conductive contacts are arranged to match the pattern of the pads on the integrated circuit chip and are aligned with these pads using visual sighting. After alignment, fluidic pressure is applied to the flexible diaphragm, causing it to flex and, in turn, the conductive contacts to make electrical contact with the pads on the integrated circuit. A plurality of sets of conductive contacts may be affixed to a single flexible diaphragm so as to allow multiple chip testing without realignment of the test probe.

Abstract: A microelectronic package for the protection, housing, cooling and interconnection of a microelectronic chip. The package is made of a plurality of ceramic layers, each of which carries a particular electrically conductive pattern and which have interior openings therein so as to provide recesses in which the chip and discrete capacitors can be located and connected.