Abstract: Electronic structures including a dual-stripline with crosstalk cancellation are described. In an example, a printed circuit board (PCB), a package substrate or a semiconductor die includes a dual-stripline structure. The dual-stripline structure includes a first region including a first top line vertically over a first bottom line, and a second top line vertically over a second bottom line. The dual-stripline structure also includes a second region including the first top line vertically over the second bottom line, and the second top line vertically over the first bottom line. The dual-stripline structure also includes a transition region between the first region and the second region. The first bottom line and the second bottom line cross in the transition region.

Abstract: Disclosed herein are integrated circuit (IC) supports with microstrips, and related embodiments. For example, an IC support may include a first microstrip; a first surface dielectric region over the first microstrip, wherein the first surface dielectric region has a first thickness, and the first thickness is nonzero; a second microstrip; and a second surface dielectric region over the second microstrip, wherein the second surface dielectric region has a second thickness, the second thickness is nonzero, and the first thickness is different than the second thickness.

Abstract: In accordance with embodiments disclosed herein, there is provided a high-density dual-embedded-microstrip interconnect. An interconnect includes a reference layer and a dielectric disposed on the reference layer. The interconnect further includes a pair of conductors including a first conductor and a second conductor that are in an edge-facing orientation. The interconnect further includes a third conductor. The pair of conductors may be disposed within the dielectric and the third conductor may be disposed on the dielectric above the pair of conductors. The pair of conductors may be disposed on the dielectric and the third conductor may be disposed within the dielectric below the pair of conductors. First noise received by the third conductor from the first conductor and second noise received by the third conductor from the second conductor at least partially cancel out.

Abstract: Apparatuses, systems and methods associated with dielectric coatings for printed circuit boards are disclosed herein. In embodiments, a printed circuit board (PCB) includes a substrate, microstrip conductors located on a surface of the substrate, a solder mask covering the surface of the substrate and the microstrip conductors, and a dielectric coating located on the solder mask, the dielectric coating on an opposite side of the solder mask from the microstrip conductors, wherein a thickness of the dielectric coating is selected to cause a ratio of capacitive coupling to self capacitance to be approximately equal to a ratio of inductive coupling to self inductance for each microstrip conductor of the microstrip conductors, where the thickness may be determined based on a specific methodology including simulations. Other embodiments may be described and/or claimed.

Abstract: In accordance with embodiments disclosed herein, there is provided a high density triple diamond stripline interconnect. An interconnect includes a first reference layer, a second reference layer disposed below the first reference layer, and a dielectric disposed between the first reference layer and the second reference layer. The interconnect further includes a first pair of conductors including a first conductor and a second conductor that are in a broadside-facing orientation within the dielectric below the first reference layer and above the second reference layer. The interconnect further includes a second pair of conductors including a third conductor and a fourth conductor that are in an edge-facing orientation within the dielectric below the first conductor and above the second conductor.

Abstract: In accordance with embodiments disclosed herein, there is provided a high-density dual-embedded-microstrip interconnect. An interconnect includes a reference layer and a dielectric disposed on the reference layer. The interconnect further includes a pair of conductors including a first conductor and a second conductor that are in an edge-facing orientation. The interconnect further includes a third conductor. The pair of conductors may be disposed within the dielectric and the third conductor may be disposed on the dielectric above the pair of conductors. The pair of conductors may be disposed on the dielectric and the third conductor may be disposed within the dielectric below the pair of conductors. First noise received by the third conductor from the first conductor and second noise received by the third conductor from the second conductor at least partially cancel out.

Abstract: Apparatuses, systems and methods associated with dielectric coatings for printed circuit boards are disclosed herein. In embodiments, a printed circuit board (PCB) includes a substrate, microstrip conductors located on a surface of the substrate, a solder mask covering the surface of the substrate and the microstrip conductors, and a dielectric coating located on the solder mask, the dielectric coating on an opposite side of the solder mask from the microstrip conductors, wherein a thickness of the dielectric coating is selected to cause a ratio of capacitive coupling to self capacitance to be approximately equal to a ratio of inductive coupling to self inductance for each microstrip conductor of the microstrip conductors, where the thickness may be determined based on a specific methodology including simulations. Other embodiments may be described and/or claimed.

Abstract: In accordance with embodiments disclosed herein, there is provided a high density triple diamond stripline interconnect. An interconnect includes a first reference layer, a second reference layer disposed below the first reference layer, and a dielectric disposed between the first reference layer and the second reference layer. The interconnect further includes a first pair of conductors including a first conductor and a second conductor that are in a broadside-facing orientation within the dielectric below the first reference layer and above the second reference layer. The interconnect further includes a second pair of conductors including a third conductor and a fourth conductor that are in an edge-facing orientation within the dielectric below the first conductor and above the second conductor.

Abstract: An adapter as disclosed herein includes at least one transmission path providing an electrical connection between the probing end and the head connection end. The adapter includes a flexible tab-board adapter associated with the probing end of the transmission path, the flexible tab-board adapter for contacting at least one signal testing point. The adapter may further include at least one compensating network positioned substantially near the probing end, the at least one compensating network configured to compensate for parasitics of the adapter.

Abstract: Apparatus and associated systems and methods may include one or more features for high speed transmission line structures that may substantially reduce signal degradation due to effects, such as dielectric loss, parasitic capacitance, cross-talk, and/or reflections. For example, one such feature may include a dielectric layer having a reduced thickness within at least a part of a region that extends between two conductors fabricated on a PCB (printed circuit board). In some embodiments, the dielectric layer may include a solder mask layer that is partially or substantially absent in the region between two coplanar conductors. In another embodiment, a substrate layer made of a dielectric material may include a trench in the region between the two conductors. Another such feature, for example, may include a conductor having vias spaced less than a quarter wavelength apart to substantially reduce resonance effects on propagating high frequency signals.

Abstract: A system for detecting communication signals between two processing devices may include an interposer unit that comprises an active signal conditioning module to condition and convey portions of signals (e.g., 5 GHz or above) to a receiver, such as a measurement instrument. In an illustrative example, the interposer unit may convey high speed signals between a device under test (DUT) and a motherboard designed to operate with the DUT. A measurement instrument, such as a protocol analyzer, for example, may monitor signals on the interposer unit through a flexible transmission line (e.g., flex circuit) extending between the measurement instrument and the interposer unit. In various embodiments, active signal conditioning on the flexible transmission line may substantially mitigate degradation of the portion of the signals conveyed from the interposer unit to the instrument.

Abstract: Apparatus and associated systems and methods may relate to a wide bandwidth cable assembly that may include an active amplification stage to receive high frequency signals (e.g., 1 GHz or above) through a transmission line extending distally to a passive, high density signal probe stage. In an illustrative example, the probe stage may receive multiple analog or digital signals from a device under test (DUT). In some embodiments, the probe stage may include probe pins with integrated series resistance to control signal loading, and an equalizer to shape the signal path's frequency response. The amplification stage may provide a virtual ground reference for a termination impedance that may match the transmission line's impedance and may connect in series with a feedback impedance. In one example, a minimally invasive probe head may facilitate measurement of multiple channels of a high speed data bus with minimal signal distortion and/or attenuation.

Abstract: Apparatus and associated systems and methods may include one or more features for high speed transmission line structures that may substantially reduce signal degradation due to effects, such as dielectric loss, parasitic capacitance, cross-talk, and/or reflections. For example, one such feature may include a dielectric layer having a reduced thickness within at least a part of a region that extends between two conductors fabricated on a PCB (printed circuit board). In some embodiments, the dielectric layer may include a solder mask layer that is partially or substantially absent in the region between two coplanar conductors. In another embodiment, a substrate layer made of a dielectric material may include a trench in the region between the two conductors. Another such feature, for example, may include a conductor having vias spaced less than a quarter wavelength apart to substantially reduce resonance effects on propagating high frequency signals.

Abstract: Apparatus and associated systems and methods may relate to a wide bandwidth cable assembly that may include an active amplification stage to receive high frequency signals (e.g., 1 GHz or above) through a transmission line extending distally to a passive, high density signal probe stage. In an illustrative example, the probe stage may receive multiple analog or digital signals from a device under test (DUT). In some embodiments, the probe stage may include probe pins with integrated series resistance to control signal loading, and an equalizer to shape the signal path's frequency response. The amplification stage may provide a virtual ground reference for a termination impedance that may match the transmission line's impedance and may connect in series with a feedback impedance. In one example, a minimally invasive probe head may facilitate measurement of multiple channels of a high speed data bus with minimal signal distortion and/or attenuation.

Abstract: A system and method for providing a multi-layer, high density wireless communication architecture is disclosed. An example of a transceiver module is provided to better demonstrate this system and method. The transceiver module comprises a transmitting layer having a top portion and a bottom portion. A filter layer having a top portion and a bottom portion is also provided, wherein the top portion of the filter layer is adjacent to the bottom portion of the transmitting layer. A logic layer having a top portion and a bottom portion is provided, wherein the top portion is adjacent to the bottom portion of the filter layer and wherein logic is located on the bottom portion of the logic layer. A series of via structures of connected at specific locations of the transceiver module to allow for electrical connections between the transmitting layer and the filter layer, and the filter layer and the logic layer. Shield layers are also provided to prevent harmful electronic coupling between layers.