Patents by Inventor Albert Talin

Albert Talin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20060222968
    Abstract: This invention relates to semiconductor devices, microelectronic devices, micro electro mechanical devices, microfluidic devices, photonic devices, and more particularly to a lithographic template, a method of forming the lithographic template and a method for forming devices with the lithographic template. The lithographic template (10) is formed having a substrate (12), a transparent conductive layer (16) formed on a surface (14) of the substrate (12) by low pressure sputtering to a thickness that allows for preferably 90% transmission of ultraviolet light therethrough, and a patterning layer (20) formed on a surface (18) of the transparent conductive layer (16).
    Type: Application
    Filed: June 12, 2006
    Publication date: October 5, 2006
    Applicant: Freescale Semiconductor, Inc.
    Inventors: Albert Talin, Jeffrey Baker, William Dauksher, Andy Hooper, Douglas Resnick
  • Publication number: 20050090176
    Abstract: A field emission device and method of forming a field emission device are provided in accordance with the present invention. The field emission device is comprised of a substrate (12) having a deformation temperature that is less than about six hundred and fifty degrees Celsius and a nano-supported catalyst (22) formed on the substrate (12) that has active catalytic particles that are less than about five hundred nanometers. The field emission device is also comprised of a nanotube (24) that is catalytically formed in situ on the nano-supported catalyst (22), which has a diameter that is less than about twenty nanometers.
    Type: Application
    Filed: October 25, 2004
    Publication date: April 28, 2005
    Inventors: Kenneth Dean, Bernard Coll, Albert Talin, Paul Von Allmen, Yi Wei, Adam Rawlett, Matthew Stainer