Abstract: A method of performing an electro-thermo simulation includes defining a non-linear heat diffusion problem for at least a portion of a semiconductor device to be modeled, performing a finite volume discretization of the non-linear heat diffusion problem, reformulating a non-linear term of the discretized non-linear heat diffusion problem to decrease dimensions thereof, performing a hyper reduction of the reformulated non-linear term, and recovering the non-linear heat diffusion problem for the portion of the semiconductor device, and manufacturing the modeled semiconductor device.

Abstract: A method for the automatic design of an electronic circuit includes operations for evaluation of the thermal effects in the electronic circuit. The method generates a layout of the electronic circuit. Abstract data at the substrate level associated to the layout of the electronic circuit is then generated. A grid of partitioning is generated with respect to a view regarding the aforesaid abstract into meshes and nodes. The grid is applied to the substrate. On the basis of the grid (TG), a list of nodes or netlist representing a thermal network that represents the thermal behavior of the substrate or of its portions or elements is extracted. The netlist is useful in simulation operations, in particular of a SPICE type, for making an evaluation of thermal effects in the electronic circuit.

Abstract: A method for automatic design of a circuit evaluates thermal effects and electrical effects in a coupled way. A description of the circuit is obtained in terms of a list of simulator nodes or netlist. Using the description, the electrical behavior of the circuit and the thermal behavior of the circuit is simulated. The simulation includes configuring the simulation operation for operating with descriptions of models or sub-circuits of the circuit that are defined using a thermal node. An equivalent current generator is connected to the thermal node to force an equivalent current representing dissipated power. A voltage that is produced on the thermal node is associated with an increase in temperature of the model or sub-circuit with respect to the global temperature.

Abstract: A method for the automatic design of an electronic circuit includes operations for evaluation of the thermal effects in the electronic circuit. The method generates a layout of the electronic circuit. Abstract data at the substrate level associated to the layout of the electronic circuit is then generated. A grid of partitioning is generated with respect to a view regarding the aforesaid abstract into meshes and nodes. The grid is applied to the substrate. On the basis of the grid (TG), a list of nodes or netlist representing a thermal network that represents the thermal behavior of the substrate or of its portions or elements is extracted. The netlist is useful in simulation operations, in particular of a SPICE type, for making an evaluation of thermal effects in the electronic circuit.